Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems /
Vezzetti, Carol F.
Varner, Ruth N.
Potzick, James E.
National Institute of Standards and Technology (U.S.)
Washington, DC : USGPO,
1992.
At head of title : Standard reference materials.
Includes bibliographical references.
Microscope and microscopy