human: Given a node-centered hypergraph: <hypergraph>, where nodes represent papers and hyperedges represent sets of papers co-cited by a source paper.

Details of the hypergraph:
Center node: "functional failure rate due to single event transients in clock distribution networks"
  Abstract: With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the functional failure rate of the circuit. This paper proposes a methodology to analyse how the functional behaviour is affected by Single-Event Transients in the clock distribution network. The approach is based on logic-level simulation and thus, only uses the register-transfer level description of a design. Therefore, a fault model is proposed which implements the main effects due to radiation-induced transients in the clock network. This fault model enables the computation of the functional failure rate caused by Single-Event Transients for each individual clock buffer, as well as the complete network. Further, it allows the identification of the most vulnerable flip-flops related to SingleEvent Transients in the clock network.The proposed methodology is applied in a practical example and a fault injection campaign is performed. In order to evaluate the impact of Single-Event Transients in clock distribution networks, the obtained functional failure rate is compared to the error rate caused by Single-Event Upsets in the sequential logic.

Connected through hyperedge HE-1 (induced by source paper "rescue interdependent challenges of reliability security and quality in nanoelectronic systems"):
  with members:
    - "pascal timing sca resistant design and verification flow"
    - "high level combined deterministic and pseudo exhuastive test generation for risc processors"
    - "challenges of reliability assessment and enhancement in autonomous systems"
    - "accelerating transient fault injection campaigns by using dynamic hdl slicing"
    - "on the estimation of complex circuits functional failure rate by machine learning techniques"
    - "towards multidimensional verification where functional meets non functional"

Question: Please tell me which class the center node belongs to. The 40 classes are: cs.NA(Numerical Analysis), cs.MM(Multimedia), cs.LO(Logic in Computer Science), cs.CY(Computers and Society), cs.CR(Cryptography and Security), cs.DC(Distributed, Parallel, and Cluster Computing), cs.HC(Human-Computer Interaction), cs.CE(Computational Engineering, Finance, and Science), cs.NI(Networking and Internet Architecture), cs.CC(Computational Complexity), cs.AI(Artificial Intelligence), cs.MA(Multiagent Systems), cs.GL(General Literature), cs.NE(Neural and Evolutionary Computing), cs.SC(Symbolic Computation), cs.AR(Hardware Architecture), cs.CV(Computer Vision and Pattern Recognition), cs.GR(Graphics), cs.ET(Emerging Technologies), cs.SY(Systems and Control), cs.CG(Computational Geometry), cs.OH(Other Computer Science), cs.PL(Programming Languages), cs.SE(Software Engineering), cs.LG(Machine Learning), cs.SD(Sound), cs.SI(Social and Information Networks), cs.RO(Robotics), cs.IT(Information Theory), cs.PF(Performance), cs.CL(Computation and Language), cs.IR(Information Retrieval), cs.MS(Mathematical Software), cs.FL(Formal Languages and Automata Theory), cs.DS(Data Structures and Algorithms), cs.OS(Operating Systems), cs.GT(Computer Science and Game Theory), cs.DB(Databases), cs.DL(Digital Libraries), cs.DM(Discrete Mathematics). Directly output the class name.

gpt: cs.AR(Hardware Architecture)