A Perovskite/CMOS Integrated Image Sensor with Multispectral Response from Near-Infrared (850 nm) to X-Ray (40 keV) and Record Spatial Resolution
Year: 2025
Type: article
Topic: CCD and CMOS Imaging Sensors
Authors and affiliations:
raw_author_name: Pengju Tan
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Shuo Yang
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Tianyu Liu
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Ying Meng
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Sihui Yang
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Xunyong Yang
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Mingzhu Hu
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Hengwei Liu
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Huaqing Yang
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Lijuan Huang
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Yuangan Chen
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Yiran Hao
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Yong Guan
raw_affiliation_strings: University of Science and Technology of China,National Synchrotron Radiation Laboratory,Hefei,China,230026
raw_author_name: Xuefei Feng
raw_affiliation_strings: University of Science and Technology of China,National Synchrotron Radiation Laboratory,Hefei,China,230026
raw_author_name: Yu Li
raw_affiliation_strings: University of Science and Technology of China,National Synchrotron Radiation Laboratory,Hefei,China,230026
raw_author_name: Xiaolong Zhao
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Xiaohu Hou
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Xin Tang
raw_affiliation_strings: Beijing Institute of Technology,School of Optics and Photonics,Beijing,China,100081
raw_author_name: Xiaosong Liu
raw_affiliation_strings: University of Science and Technology of China,National Synchrotron Radiation Laboratory,Hefei,China,230026
raw_author_name: Shibing Long
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026
raw_author_name: Qin Hu
raw_affiliation_strings: University of Science and Technology of China,School of Microelectronics,Hefei,China,230026