Switchable deep-red dual-wavelength Pr:YLF lasers
Year: 2025
Type: article
Language: en
Topic: Solid State Laser Technologies
Authors and affiliations:
raw_author_name: Rongbin Dai
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Jiang Liu
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Wenlu Liao
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Zhuang Li
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Zheng Zhang
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Bo Xiao
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Yuchen Xue
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Yongkang Yao
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Huiying Xu
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China
raw_author_name: Zhiping Cai
raw_affiliation_strings: Department of Electronic Engineering, School of Electronic Science and Engineering (National Model Microelectronics College) Xiamen University, Xiamen, 361005, China
Fujian Key Laboratory of Ultrafast Laser Technology and Applications, Xiamen University, Xiamen, China