Robust Photo-Cross-Linked Polymer Semiconductors for Fully Stretchable and Photopatternable Electronics
Year: 2025
Type: article
Language: en
Topic: Advanced Sensor and Energy Harvesting Materials
Authors and affiliations:
raw_author_name: Yifei Tan
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering
raw_author_name: Ziyi Zhang
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering
raw_author_name: Ning Xu
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei 230009, China
raw_author_name: Xiaohong Wang
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei 230009, China
raw_author_name: Fan Ni
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering, Hefei University of Technology, Hefei 230009, China
raw_author_name: Longzhen Qiu
raw_affiliation_strings: Hefei University of Technology
National Engineering Lab of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Anhui Industrial Innovation Research Institute of Advanced Optoelectronic Materials and Systems, School of Instrument Science and Optoelectronic Engineering