Robust Optically Stable Single Photon Emission from Single‐Crystal Hexagonal Boron Nitride Films
Year: 2025
Type: article
Language: en
Topic: Graphene research and applications
Authors and affiliations:
raw_author_name: Libin Zeng
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
raw_author_name: Zhengchang Xia
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
raw_author_name: Zhouxin Li
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
raw_author_name: Yiming Shi
raw_affiliation_strings: School of Physics and Optoelectronic Engineering Beijing University of Technology  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
School of Physics and Optoelectronic Engineering, Beijing University of Technology, Beijing, China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
raw_author_name: Junhua Meng
raw_affiliation_strings: School of Physics and Optoelectronic Engineering Beijing University of Technology  Beijing China
School of Physics and Optoelectronic Engineering, Beijing University of Technology, Beijing, China
raw_author_name: Ji Jiang
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
raw_author_name: Zhigang Yin
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
raw_author_name: Huaiwen Zheng
raw_affiliation_strings: State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China
raw_author_name: Xingwang Zhang
raw_affiliation_strings: Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences  Beijing China
State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of Semiconductors Chinese Academy of Sciences  Beijing China
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China