Hyperspectral Ghost Image Residual Correction Method Based on PSF Degradation Model
Year: 2025
Type: article
Language: en
Topic: Remote-Sensing Image Classification
Authors and affiliations:
raw_author_name: Xijie Li
raw_affiliation_strings: School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710021, China
State Key Laboratory of Ultrafast Optical Science and Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
raw_author_name: Jiating Yang
raw_affiliation_strings: Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
raw_author_name: Tieqiao Chen
raw_affiliation_strings: Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
raw_author_name: Siyuan Li
raw_affiliation_strings: Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
raw_author_name: Pengchong Wang
raw_affiliation_strings: Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
raw_author_name: Sai Zhong
raw_affiliation_strings: School of Informatics and Mathematics, Yangtze University, Jingzhou 434000, China
raw_author_name: Ming Gao
raw_affiliation_strings: School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China
School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710021, China
raw_author_name: Bingliang Hu
raw_affiliation_strings: Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
Shaanxi Key Laboratory of Optical Remote Sensing and Intelligent Information Processing, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China