Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications
Year: 2025
Type: article
Language: en
Topic: Radiation Effects in Electronics
Authors and affiliations:
raw_author_name: Lomash Chandra Acharya
raw_affiliation_strings: Microelectronics and VLSI Group, Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India
Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Roorkee, UK, 247667, INDIA
raw_author_name: Khoirom Johnson Singh
raw_affiliation_strings: Department of Electronics, Dhanamanjuri University, Imphal, Manipur 795001, India
Electronics, Dhanamanjuri University, Manipur, Imphal, Manipur, 795001, INDIA
raw_author_name: Neha Gupta
raw_affiliation_strings: Microelectronics and VLSI Group, Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India
Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Roorkee, UK, 247667, INDIA
raw_author_name: Mahipal Dargupally
raw_affiliation_strings: Microelectronics and VLSI Group, Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India
Electronics and Communication Engineeering, Indian Institute of Technology Roorkee, Roorkee, Roorkee, UK, 247667, INDIA
raw_author_name: Neeraj Mishra
raw_affiliation_strings: Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India
Birla Institute of Technology and Science - Pilani Campus, Pilani, Pilani, RJ, 333031, INDIA
raw_author_name: Arvind Kumar Sharma
raw_affiliation_strings: Semiconductor Technology and Systems Department, IMEC, Leuven 3001, Belgium
IMEC, Belgium, Leuven, Flanders, 3001, BELGIUM
raw_author_name: Abhishek Acharya
raw_affiliation_strings: Department of Electronics Engineering, Sardar Vallabhbhai National Institute of Technology, Surat, Gujarat 395007, India
Electronics Engineering, Sardar Vallabhbhai National Institute of Technology, Ichchhanath, Dumas Road, Surat, 395007, INDIA
raw_author_name: Venkatraman Ramakrishnan
raw_affiliation_strings: Analog and Mixed Signal Products Division, On Semiconductor Technology, Bengaluru, Karnataka 560066, India
Onsemi, Bangalore, Bangalore, 560066, INDIA
raw_author_name: Ajoy Mandal
raw_affiliation_strings: EDA Group, Texas Instruments, Bengaluru, Karnataka 560093, India
Texas instruments, Bengaluru, Bengaluru, 560093, INDIA
raw_author_name: Sudeb Dasgupta
raw_affiliation_strings: Microelectronics and VLSI Group, Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India
Department of Electronics and Communication Engineering, IIT Roorkee, Roorkee, Roorkee, 247667, INDIA
raw_author_name: Anand Bulusu
raw_affiliation_strings: Microelectronics and VLSI Group, Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India
Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Roorkee, 247667, INDIA