Physics-informed meta neural representation for high-fidelity, aberration-corrected, sparse-view Fourier ptychographic tomography
Year: 2025
Type: article
Topic: Advanced X-ray Imaging Techniques
Authors and affiliations:
raw_author_name: Minglu Sun
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
These authors contributed equally to this work
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Fenghe Zhong
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
These authors contributed equally to this work
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Shiqi Mao
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
These authors contributed equally to this work
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Ying Liu
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Zihao Zhang
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Dongyu Li
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Binbing Liu
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)
raw_author_name: Peng Fei
raw_affiliation_strings: Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China
These authors contributed equally to this work
Huazhong University of Science and Technology, School of Optical and Electronic Information, Wuhan National Laboratory for Optoelectronics, Wuhan, China (China)