Hybrid-gate MoS2 2T0C DRAM for low-power multi-bit storage with high linearity
Year: 2025
Type: article
Language: en
Topic: Ferroelectric and Negative Capacitance Devices
Authors and affiliations:
raw_author_name: Zhejia Zhang
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Saifei Gou
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yufei Song
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Xiangqi Dong
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yuxuan Zhu
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Zhengjie Sun
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Mingrui Ao
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Qicheng Sun
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Jinshu Zhang
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yan Hu
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yuchen Tian
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Haojie Chen
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Xinliu He
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Jieya Shang
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Qihao Chen
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yang Liu
raw_affiliation_strings: State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Yin Xia
raw_affiliation_strings: Shaoxin Laboratory , Shaoxing 312000 ,
raw_author_name: Chen Yang
raw_affiliation_strings: Changxin Memory Technologies , Hefei 230601 ,
raw_author_name: Hao Meng
raw_affiliation_strings: Changxin Memory Technologies , Hefei 230601 ,
raw_author_name: Mingyuan Liu
raw_affiliation_strings: Changxin Memory Technologies , Hefei 230601 ,
raw_author_name: Huihui Li
raw_affiliation_strings: Changxin Memory Technologies , Hefei 230601 ,
raw_author_name: Yin Wang
raw_affiliation_strings: Shaoxin Laboratory , Shaoxing 312000 ,
raw_author_name: Peng Zhou
raw_affiliation_strings: Shaoxin Laboratory , Shaoxing 312000 ,
State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,
raw_author_name: Wenzhong Bao
raw_affiliation_strings: Shanghai AtomIC Technology , Shanghai 201318 ,
Shaoxin Laboratory , Shaoxing 312000 ,
State Key Laboratory of Integrated Chip and Systems, School of Microelectronics, Fudan University , Shanghai 200433 ,