Four orders spectral compression of Brillouin fiber laser for broadband microwave frequency measurement
Year: 2025
Type: article
Language: en
Topic: Advanced Fiber Optic Sensors
Authors and affiliations:
raw_author_name: Lei Yu
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Qing Yan
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Yafei Hou
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Huijie Wang
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Xulei Yang
raw_affiliation_strings: School of Aeronautics and Astronautics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Wenjun He
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Yajun You
raw_affiliation_strings: School of Aeronautics and Astronautics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Yi Liu
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China
raw_author_name: Xiujian Chou
raw_affiliation_strings: School of Instrument and Electronics, North University of China, Taiyuan 030051 Shanxi, China
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051 Shanxi, China
Shanxi Key Laboratory of Ferroelectric Physical Micro-nano Devices and Systems, North University of China, Taiyuan 030051 Shanxi, China
State key Laboratory of Extreme Environment Optoelectronic Dynamic Measurement Technology and Instrument, North University of China, Taiyuan 030051 Shanxi, China