Sb-contacted MoS2 flash memory for analogue in-memory searches
Year: 2025
Type: article
Language: en
Topic: Advanced Memory and Neural Computing
Authors and affiliations:
raw_author_name: Guoyun Gao
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Bo Wen
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Ni Yang
raw_affiliation_strings: Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Zhiyuan Du
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Mingrui Jiang
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Ruibin Mao
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Rui Qiu
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Yingnan Cao
raw_affiliation_strings: Department of Chemistry, The University of Hong Kong, Hong Kong, China
raw_author_name: Hongxia Xue
raw_affiliation_strings: Department of Physics, The University of Hong Kong, Hong Kong, China
raw_author_name: Deng Zou
raw_affiliation_strings: Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Pak San Yip
raw_affiliation_strings: Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Qihan Liu
raw_affiliation_strings: State Key Laboratory of Integrated Chips and Systems, Frontier Institute of Chip and System, Fudan University, Shanghai, China
raw_author_name: Yi Wan
raw_affiliation_strings: Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore
raw_author_name: Dong-Keun Ki
raw_affiliation_strings: Department of Physics, The University of Hong Kong, Hong Kong, China
raw_author_name: Jinyao Tang
raw_affiliation_strings: Department of Chemistry, The University of Hong Kong, Hong Kong, China
raw_author_name: Paddy K. L. Chan
raw_affiliation_strings: Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Hao Jiang
raw_affiliation_strings: State Key Laboratory of Integrated Chips and Systems, Frontier Institute of Chip and System, Fudan University, Shanghai, China
raw_author_name: Han Wang
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Lain-Jong Li
raw_affiliation_strings: Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore. lance.li@nus.edu.sg
Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China. lance.li@nus.edu.sg
Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore
Department of Mechanical Engineering, The University of Hong Kong, Hong Kong, China
raw_author_name: Can Li
raw_affiliation_strings: Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China. canl@hku.hk
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China. canl@hku.hk
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong, China
Centre for Advanced Semiconductors and Integrated Circuits, The University of Hong Kong, Hong Kong, China