Metal–Organic Chemical Vapor Deposition of 2D Semiconducting Bi <sub>2</sub> O <sub>2</sub> S for High‐Performance Field‐Effect Transistor
Year: 2025
Type: article
Language: en
Topic: 2D Materials and Applications
Authors and affiliations:
raw_author_name: Hyun‐Jun Chai
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Minsoo Kang
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 305–701 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Ayoung Ham
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Han Beom Jeong
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Graduate School of Semiconductor Materials and Devices Engineering Ulsan National Institute of Science and Technology (UNIST)  Ulsan 44919 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Cheolmin Park
raw_affiliation_strings: School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 305–701 Republic of Korea
raw_author_name: Yong‐Sung Kim
raw_affiliation_strings: Korea Research Institute of Standards &amp; Science (KRISS)  Daejeon 34113 Republic of Korea
Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea
raw_author_name: Eunpyo Park
raw_affiliation_strings: Center for Semiconductor Technology Korea Institute of Science and Technology (KIST)  Seoul 02792 Republic of Korea
Center for Semiconductor Technology, Korea Institute of Science and Technology (KIST), Seoul, 02792 Republic of Korea
raw_author_name: Gichang Noh
raw_affiliation_strings: Center for Semiconductor Technology Korea Institute of Science and Technology (KIST)  Seoul 02792 Republic of Korea
Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Center for Semiconductor Technology, Korea Institute of Science and Technology (KIST), Seoul, 02792 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Min‐kyung Jo
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS)  Daejeon 34113 Republic of Korea
Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Woonggi Hong
raw_affiliation_strings: Department of Convergence Semiconductor Engineering Dankook University  152 Jukjeon‐ro, Suji‐gu Yongin‐si, Gyeonggi‐do 16890 Republic of Korea
Department of Convergence Semiconductor Engineering, Dankook University, 152 Jukjeon-ro, Suji-gu, Yongin-si, Gyeonggi-do, 16890 Republic of Korea
raw_author_name: Mingu Kang
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 305–701 Republic of Korea
raw_author_name: Tae Soo Kim
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Suhyun Kim
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Jeongwon Park
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Jaehyun Lee
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Min‐gyu Kim
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Seongdae Kwon
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Hyeonbin Park
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Joon Young Kwak
raw_affiliation_strings: Division of Electronic and Semiconductor Engineering Ewha Womans University  Seoul 03760 Republic of Korea
Division of Electronic and Semiconductor Engineering, Ewha Womans University, Seoul, 03760 Republic of Korea
raw_author_name: Seungwoo Song
raw_affiliation_strings: Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS)  Daejeon 34113 Republic of Korea
Operando Methodology and Measurement Team Korea Research Institute of Standards &amp; Science (KRISS) Daejeon 34113 Republic of Korea
raw_author_name: Sung‐Yool Choi
raw_affiliation_strings: Graduate School of Semiconductor Technology Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
School of Electrical Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 305–701 Republic of Korea
Graduate School of Semiconductor Technology, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Hu Young Jeong
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Graduate School of Semiconductor Materials and Devices Engineering Ulsan National Institute of Science and Technology (UNIST)  Ulsan 44919 Republic of Korea
Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919 Republic of Korea
raw_author_name: Seunghwan Seo
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea
raw_author_name: Kibum Kang
raw_affiliation_strings: Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Graduate School of Semiconductor Technology Korea Advanced Institute of Science and Technology (KAIST)  291 Daehak‐ro, Yuseong‐gu Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea