Demonstration of CMOS-compatible memristor-based electrochemical biosensor transducer with threshold-sensing functionality
Year: 2025
Type: article
Language: en
Topic: Advanced Memory and Neural Computing
Authors and affiliations:
raw_author_name: Young-Joon Kim
raw_affiliation_strings: Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr
Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea
raw_author_name: Youna Kwon
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Youngwoo Yoo
raw_affiliation_strings: Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea
raw_author_name: Kandaswamy Theyagarajan
raw_affiliation_strings: Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea
raw_author_name: Sairaman Saikrithika
raw_affiliation_strings: Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea
raw_author_name: Aryeong Lee
raw_affiliation_strings: Department of Materials Science and Enginnering,, Chungnam National University (CNU), Daejeon, Republic of Korea
raw_author_name: Nam Ho Bae
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Won-Chul Lee
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Gapseop Sim
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Younghyun Lee
raw_affiliation_strings: Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea
raw_author_name: See-On Park
raw_affiliation_strings: School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea
raw_author_name: Hyijae Cho
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Min-Ho Kang
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Youngjoo Kim
raw_affiliation_strings: Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr
Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr
Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Yumin Park
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Kyoung G. Lee
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Choul-Young Kim
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
raw_author_name: Hyoungho Ko
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
raw_author_name: Woo-Suk Sul
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Seok Jae Lee
raw_affiliation_strings: Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea
raw_author_name: Jae-Hyuk Ahn
raw_affiliation_strings: Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea
raw_author_name: Shinhyun Choi
raw_affiliation_strings: School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. shinhyun@kaist.ac.kr
School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea
raw_author_name: Kyung Min Kim
raw_affiliation_strings: Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. km.kim@kaist.ac.kr
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea
raw_author_name: Jongwon Lee
raw_affiliation_strings: Department of Semiconductor Convergence, Chungnam National University (CNU), Daejeon, Republic of Korea. jwlee80@cnu.ac.kr
Department of Semiconductor Convergence, Chungnam National University (CNU), Daejeon, Republic of Korea