STEM SerialED: achieving high-resolution data for ab initio structure determination of beam-sensitive nanocrystalline materials.
Hogan-Lamarre, Pascal; Luo, Yi; Bücker, Robert; Miller, R. J. Dwayne; Zou, Xiaodong; IUCrJ 11 (2024) 62–72; doi:10.1107/S2052252523009661

data_1570607
_publ_section_title
;
 STEM SerialED: achieving high-resolution data for ab initio structure
 determination of beam-sensitive nanocrystalline materials.
;
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_journal_paper_doi               10.1107/S2052252523009661
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'w=1/[\s^2^(Fo^2^)+(0.2000P)^2^] where P=(Fo^2^+2Fc^2^)/3'
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;Adding full bibliography for 1570607--1570609.cif.

 Adding full bibliography for 1570607--1570609.cif.
;
_cod_original_cell_volume        15625(5)
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