Electronic Structure of Ni2E2 Complexes (E = S, Se, Te) and a Global Analysis of M2E2 Compounds: A Case for Quantized E2(n-) Oxidation Levels with n = 2, 3, or 4.
Yao, Shu A.; Martin-Diaconescu, Vlad; Infante, Ivan; Lancaster, Kyle M.; Götz, Andreas W; DeBeer, Serena; Berry, John F.; Journal of the American Chemical Society 137 (2015) 4993–5011; doi:10.1021/ja511607j

data_4123562
_publ_section_title
;
 Electronic Structure of Ni2E2 Complexes (E = S, Se, Te) and a Global
 Analysis of M2E2 Compounds: A Case for Quantized E2(n-) Oxidation Levels
 with n = 2, 3, or 4.
;
_journal_issue                   15
_journal_name_full               'Journal of the American Chemical Society'
_journal_page_first              4993
_journal_page_last               5011
_journal_paper_doi               10.1021/ja511607j
_journal_volume                  137
_journal_year                    2015
_chemical_formula_moiety         'C34 H58 Ni2 Te2'
_chemical_formula_sum            'C34 H58 Ni2 Te2'
_chemical_formula_weight         839.42
_chemical_name_systematic
; 

 ? 

;
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_diffrn_measured_fraction_theta_max 0.994
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_diffrn_measurement_method       '0.60\% \w and 0.6\% \f scans'
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_diffrn_source                   'microfocus sealed X-ray tube'
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;

SADABS  (Bruker-AXS, 2007)

;
_exptl_crystal_colour            green
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_refine_ls_structure_factor_coef Fsqd
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'calc w=1/[\s^2^(Fo^2^)+(0.0236P)^2^+0.0000P] where P=(Fo^2^+2Fc^2^)/3'
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_cod_depositor_comments
'Adding full bibliography for 4123556--4123563.cif.'
_cod_original_sg_symbol_Hall     '-P 1        '
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_cod_database_code               4123562