Influence of Lattice Interactions on the Jahn-Teller Distortion of the [Cu(H2O)6]2+ Ion: Dependence of the Crystal Structure of K2xRb2-2x[Cu(H2O)6](SeO4)2 upon the K/Rb Ratio
Charles J. Simmons; Horst Stratemeier; Michael A. Hitchman; Mark J. Riley; Inorganic Chemistry 52 (2013) 10481–10499; doi:10.1021/ic401385f

data_4336000
_publ_section_title
;
 Influence of Lattice Interactions on the Jahn-Teller Distortion of the
 [Cu(H2O)6]2+ Ion: Dependence of the Crystal Structure of
 K2xRb2-2x[Cu(H2O)6](SeO4)2 upon the K/Rb Ratio
;
_journal_name_full               'Inorganic Chemistry'
_journal_page_first              10481
_journal_page_last               10499
_journal_paper_doi               10.1021/ic401385f
_journal_volume                  52
_journal_year                    2013
_chemical_formula_moiety         'Cu H12 K0.772 O14 Rb1.228 Se2 '
_chemical_formula_sum            'Cu H12 K0.772 O14 Rb1.228 Se2'
_chemical_formula_weight         592.71
_space_group_IT_number           14
_symmetry_cell_setting           monoclinic
_symmetry_Int_Tables_number      14
_symmetry_space_group_name_Hall  '-P 2yab'
_symmetry_space_group_name_H-M   'P 1 21/a 1'
_cell_angle_alpha                90
_cell_angle_beta                 104.357(2)
_cell_angle_gamma                90
_cell_formula_units_Z            2
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_cell_length_b                   12.4065(5)
_cell_length_c                   6.31590(10)
_cell_measurement_reflns_used    7209
_cell_measurement_temperature    190
_cell_measurement_theta_max      37.7
_cell_measurement_theta_min      1.6
_cell_volume                     706.61(4)
_computing_cell_refinement       'HKL Scalepack'
_computing_data_collection       'KappaCCD Server Control'
_computing_data_reduction        'HKL Denzo and Scalepack'
_computing_publication_material  'teXsan for Windows v. 1.06 MSC'
_computing_structure_refinement  'teXsan for Windows v. 1.06 MSC'
_computing_structure_solution
;
SIR92 (Altomare, et. al. 1994)
;
_diffrn_ambient_temperature      190
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_diffrn_measured_fraction_theta_max 0.996
_diffrn_measurement_device       'Nonius CCD camera'
_diffrn_measurement_method       '\f scans \w scans \k offsets'
_diffrn_radiation_detector       'Nonius Kappa CCD'
_diffrn_radiation_monochromator  graphite
_diffrn_radiation_source         'fine-focus sealed x-ray tube'
_diffrn_radiation_type           'Mo K\a'
_diffrn_radiation_wavelength     0.7107
_diffrn_reflns_av_R_equivalents  0.02567
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_diffrn_reflns_limit_h_max       16
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_diffrn_reflns_theta_max         37.73
_diffrn_reflns_theta_min         1.64
_diffrn_standards_decay_%        0.00
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_exptl_absorpt_coefficient_mu    11.18
_exptl_absorpt_correction_T_max  0.898
_exptl_absorpt_correction_T_min  0.710
_exptl_absorpt_correction_type   multi-scan
_exptl_absorpt_process_details   '(Denzo-SMN; Otwinowski & Minor, 1997)'
_exptl_crystal_colour            blue
_exptl_crystal_density_diffrn    2.786
_exptl_crystal_description       sphere
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_exptl_crystal_size_rad          0.30
_refine_diff_density_max         0.58
_refine_diff_density_min         -0.64
_refine_ls_extinction_coef       0.00000105(3)
_refine_ls_extinction_expression 'equ(3) Acta Cryst.(1968) A24, p213.'
_refine_ls_extinction_method     'Zachariasen (1967)'
_refine_ls_goodness_of_fit_all   1.382
_refine_ls_goodness_of_fit_ref   1.380
_refine_ls_hydrogen_treatment    refall
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_refine_ls_number_reflns         2288
_refine_ls_number_restraints     0
_refine_ls_R_factor_all          0.0216
_refine_ls_R_factor_gt           0.0220
_refine_ls_shift/su_max          0.0900
_refine_ls_shift/su_mean         0.0029
_refine_ls_structure_factor_coef F
_refine_ls_weighting_details     'w = 1/[\s^2^(Fo)]'
_refine_ls_weighting_scheme      sigma
_refine_ls_wR_factor_all         0.0220
_refine_ls_wR_factor_ref         0.0220
_reflns_number_gt                2288
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_reflns_threshold_expression     I>5.00\s(I)
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_cod_data_source_block           '_Template_texray.inf41'
_cod_original_cell_volume        706.61(3)
_cod_original_sg_symbol_H-M      'P 21/a '
_cod_original_formula_sum        'Cu H12 K0.772 O14 Rb1.228 Se2 '
_cod_database_code               4336000