Hypervalent Silicon via Intramolecular Coordination in a Four-Membered Ring in Complexes of Substituted Pyridyl Ligands
van den Ancker, Tania R.; Raston, Colin L.; Skelton, Brian W.; White, Allan H.; Organometallics 19 (2000) 4437–; doi:10.1021/om0005497

data_4077591
_publ_section_title
;
 Hypervalent Silicon via Intramolecular Coordination in a Four-Membered
 Ring in Complexes of Substituted Pyridyl Ligands
;
_journal_issue                   22
_journal_name_full               Organometallics
_journal_page_first              4437
_journal_paper_doi               10.1021/om0005497
_journal_volume                  19
_journal_year                    2000
_chemical_formula_sum            'C20 H34 N2 Si3'
_chemical_formula_weight         386.8
_space_group_IT_number           15
_symmetry_cell_setting           monoclinic
_symmetry_space_group_name_Hall  '-C 2yc'
_symmetry_space_group_name_H-M   'C 1 2/c 1'
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_cell_angle_beta                 99.97(4)
_cell_angle_gamma                90.00000
_cell_formula_units_Z            4
_cell_length_a                   19.131(7)
_cell_length_b                   9.883(3)
_cell_length_c                   12.444(8)
_cell_measurement_reflns_used    8
_cell_measurement_temperature    293
_cell_measurement_theta_max      18.6
_cell_measurement_theta_min      16.7
_cell_volume                     2317.3(19)
_computing_cell_refinement       'Enraf Nonius software'
_computing_data_collection       'Enraf Nonius software'
_computing_data_reduction        'xtal DIFDAT SORTRF ADDREF ABSORB'
_computing_molecular_graphics    xtal
_computing_publication_material  'xtal BONDLA CIFIO'
_computing_structure_refinement  'xtal CRYLSQ'
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_diffrn_ambient_temperature      293
_diffrn_measurement_device_type  CAD4
_diffrn_measurement_method       '2\q-\w scans'
_diffrn_radiation_detector       'single counter'
_diffrn_radiation_monochromator  graphite
_diffrn_radiation_source         'rotating anode'
_diffrn_radiation_type           'Mo K\a'
_diffrn_radiation_wavelength     .71073
_diffrn_reflns_av_sigmaI/netI    0
_diffrn_reflns_limit_h_max       24
_diffrn_reflns_limit_h_min       0
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_diffrn_reflns_limit_k_min       0
_diffrn_reflns_limit_l_max       15
_diffrn_reflns_limit_l_min       -16
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_diffrn_reflns_reduction_process 'perpendicular monochr Lp'
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_diffrn_reflns_theta_min         2.16
_diffrn_standards_decay_%        0
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_exptl_absorpt_coefficient_mu    .211
_exptl_absorpt_correction_T_max  0.95
_exptl_absorpt_correction_T_min  0.92
_exptl_absorpt_correction_type   gaussian
_exptl_absorpt_process_details
;
 Xtal absorb                  
;
_exptl_crystal_colour            colourless
_exptl_crystal_density_diffrn    1.109
_exptl_crystal_description       prism
_exptl_crystal_F_000             840
_exptl_crystal_size_max          0.55
_exptl_crystal_size_mid          0.32
_exptl_crystal_size_min          0.30
_refine_diff_density_max         .352
_refine_diff_density_min         -.263
_refine_ls_goodness_of_fit_all   1.756
_refine_ls_goodness_of_fit_ref   2.052
_refine_ls_hydrogen_treatment    refall
_refine_ls_matrix_type           full
_refine_ls_number_constraints    0
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_refine_ls_number_reflns         1745
_refine_ls_number_restraints     0
_refine_ls_R_factor_all          .072
_refine_ls_R_factor_gt           .047
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_refine_ls_shift/su_mean         .003
_refine_ls_structure_factor_coef F
_refine_ls_weighting_scheme      sigma
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_refine_ls_wR_factor_ref         .05
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_reflns_d_resolution_low         9.421
_reflns_limit_h_max              24
_reflns_limit_h_min              0
_reflns_limit_k_max              12
_reflns_limit_k_min              0
_reflns_limit_l_max              15
_reflns_limit_l_min              -16
_reflns_number_gt                1750
_reflns_number_total             2644
_reflns_threshold_expression     'Inet > 3.00 sig(Inet)'
_cod_data_source_file            om0005497.cif
_cod_data_source_block           clrsi2
_cod_original_sg_symbol_Hall     -C_-2yc
_cod_original_sg_symbol_H-M      'c 1 2/c 1'
_cod_database_code               4077591