Reductive Elimination of Hypersilyl Halides from Zinc(II) Complexes. Implications for Electropositive Metal Thin Film Growth.
Sirimanne, Chatu T.; Kerrigan, Marissa M.; Martin, Philip D.; Kanjolia, Ravindra K.; Elliott, Simon D.; Winter, Charles H.; Inorganic chemistry 54 (2015) 7–9; doi:10.1021/ic502184f

data_4341925
_publ_section_title
;
 Reductive Elimination of Hypersilyl Halides from Zinc(II) Complexes.
 Implications for Electropositive Metal Thin Film Growth.
;
_journal_issue                   1
_journal_name_full               'Inorganic chemistry'
_journal_page_first              7
_journal_page_last               9
_journal_paper_doi               10.1021/ic502184f
_journal_volume                  54
_journal_year                    2015
_chemical_formula_sum            'C13 H35 Br O Si4 Zn'
_chemical_formula_weight         465.05
_chemical_name_systematic
;
 ?
;
_space_group_crystal_system      triclinic
_space_group_IT_number           2
_space_group_name_Hall           '-P 1'
_space_group_name_H-M_alt        'P -1'
_symmetry_space_group_name_Hall  '-P 1'
_symmetry_space_group_name_H-M   'P -1'
_atom_sites_solution_hydrogens   geom
_audit_creation_method           SHELXL-2013
_cell_angle_alpha                92.484(3)
_cell_angle_beta                 105.528(3)
_cell_angle_gamma                96.167(3)
_cell_formula_units_Z            2
_cell_length_a                   9.6000(6)
_cell_length_b                   10.4322(6)
_cell_length_c                   12.9113(8)
_cell_measurement_temperature    100(2)
_cell_volume                     1235.14(13)
_computing_structure_refinement  'SHELXL-2013 (Sheldrick, 2013)'
_diffrn_ambient_temperature      100(2)
_diffrn_measured_fraction_theta_full 0.995
_diffrn_measured_fraction_theta_max 0.982
_diffrn_radiation_type           MoK\a
_diffrn_radiation_wavelength     0.71073
_diffrn_reflns_av_R_equivalents  0.0348
_diffrn_reflns_av_unetI/netI     0.0321
_diffrn_reflns_Laue_measured_fraction_full 0.995
_diffrn_reflns_Laue_measured_fraction_max 0.982
_diffrn_reflns_limit_h_max       13
_diffrn_reflns_limit_h_min       -13
_diffrn_reflns_limit_k_max       14
_diffrn_reflns_limit_k_min       -14
_diffrn_reflns_limit_l_max       18
_diffrn_reflns_limit_l_min       -18
_diffrn_reflns_number            35475
_diffrn_reflns_point_group_measured_fraction_full 0.995
_diffrn_reflns_point_group_measured_fraction_max 0.982
_diffrn_reflns_theta_full        25.242
_diffrn_reflns_theta_max         30.646
_diffrn_reflns_theta_min         2.657
_exptl_absorpt_coefficient_mu    2.802
_exptl_crystal_density_diffrn    1.250
_exptl_crystal_F_000             484
_refine_diff_density_max         1.158
_refine_diff_density_min         -0.725
_refine_diff_density_rms         0.080
_refine_ls_extinction_method     none
_refine_ls_goodness_of_fit_ref   1.085
_refine_ls_hydrogen_treatment    constr
_refine_ls_matrix_type           full
_refine_ls_number_parameters     190
_refine_ls_number_reflns         7497
_refine_ls_number_restraints     0
_refine_ls_restrained_S_all      1.085
_refine_ls_R_factor_all          0.0877
_refine_ls_R_factor_gt           0.0530
_refine_ls_shift/su_max          0.001
_refine_ls_shift/su_mean         0.000
_refine_ls_structure_factor_coef Fsqd
_refine_ls_weighting_details
;
 w=1/[\s^2^(Fo^2^)+(0.0106P)^2^+2.5392P]
 where P=(Fo^2^+2Fc^2^)/3
;
_refine_ls_weighting_scheme      calc
_refine_ls_wR_factor_gt          0.0938
_refine_ls_wR_factor_ref         0.1094
_reflns_Friedel_coverage         0.000
_reflns_number_gt                5213
_reflns_number_total             7497
_reflns_threshold_expression     'I > 2\s(I)'
_cod_data_source_file            ic502184f_si_002.cif
_cod_data_source_block           cts8_2_p7a_p1bar_s
_cod_depositor_comments
'Adding full bibliography for 4341924--4341926.cif.'
_cod_original_cell_volume        1235.13(13)
_cod_database_code               4341925
_shelxl_version_number           2013-2
_shelx_res_checksum              11271
_shelx_hkl_checksum              78477