XPAD X-ray hybrid pixel detector for charge density quality diffracted intensities on laboratory equipment.
Wenger, Emmanuel; Dahaoui, Slimane; Alle, Paul; Parois, Pascal; Palin, Cyril; Lecomte, Claude; Schaniel, Dominik; Acta crystallographica Section B, Structural science, crystal engineering and materials 70 (2014) 783–791; doi:10.1107/S2052520614017338

data_2311663
_publ_section_title
;
 XPAD X-ray hybrid pixel detector for charge density quality diffracted
 intensities on laboratory equipment.
;
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'Acta crystallographica Section B, Structural science, crystal engineering and materials'
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_journal_paper_doi               10.1107/S2052520614017338
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_journal_year                    2014
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CrysAlisPro, Agilent Technologies,
Version 1.171.37.31 (release 14-01-2014 CrysAlis171 .NET)
(compiled Jan 14 2014,18:38:05)
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CAD4, Bruker-Nonius
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CrysAlisPro, Agilent Technologies,
Version 1.171.37.31 (release 14-01-2014 CrysAlis171 .NET)
(compiled Jan 14 2014,18:38:05)
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ShelXle, C. B. Hubschle, G. M. Sheldrick and B. Dittrich
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_computing_structure_refinement  'SHELXL-2013 (Sheldrick, 2013)'
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CrysAlisPro, Agilent Technologies,
Version 1.171.36.32 (release 02-08-2013 CrysAlis171 .NET)
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Empirical absorption correction using spherical harmonics,
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_exptl_crystal_colour            red
_exptl_crystal_density_diffrn    1.750
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_reflns_threshold_expression     'I > 2\s(I)'
_cod_data_source_file            gw5033sup1.cif
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_shelx_estimated_absorpt_t_min   0.746
_shelx_estimated_absorpt_t_max   0.795
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