An empirical correction for the influence of low-energy contamination
Krause, Lennard; Herbst-Irmer, Regine; Stalke, Dietmar; Journal of Applied Crystallography 48 (2015) 1907–1913; doi:10.1107/S1600576715020440

data_2300571
_publ_section_title
;
 An empirical correction for the influence of low-energy contamination
;
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_journal_name_full               'Journal of Applied Crystallography'
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_journal_page_last               1913
_journal_paper_doi               10.1107/S1600576715020440
_journal_volume                  48
_journal_year                    2015
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'SHELXT (G.M.Sheldrick,Acta Cryst.(2015)A71,3-8)'
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;
 Flack x determined using 978 quotients [(I+)-(I-)]/[(I+)+(I-)]
 (Parsons, Flack and Wagner, Acta Cryst. B69 (2013) 249-259).
;
_refine_ls_abs_structure_Flack   0.035(15)
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_refine_ls_shift/su_mean         0.000
_refine_ls_structure_factor_coef Fsqd
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'w=1/[\s^2^(Fo^2^)+(0.0398P)^2^+0.0978P] where P=(Fo^2^+2Fc^2^)/3'
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