Brevet FR3070415A1 — publié le 20190301

17-IPM-101129 Ul PCT _ 77.10DOLOr; R PER1N.L., 71 17 'ÈRE]) AND 1..+:.'.ibkt'7.-aii(ir BACK;j: .:iND [0001; Oit and gas -:rations su.:. as mulati:.-.:-. rese,-nir man use various 12.:. as t.L, d ate a ruer\ Dir id fore... ,iction therefrom. 1),.7q-1...,- ..y (a measure fluid conduct vity in porot.... is a critical parameter in su.:.,,.... .3 as i Dis the . :lents of the oit and gas c-. ::ls, naccu--,te and eability o _ y estimat: are based on porosity transforms arc n. irate enough, for carbonates, reliable permeability values. This is due to porosity in c o en being flot in e.g., as in sandstones, and consisting -f V-7 Dre types as a res7.1t the vario7.7.! effects, such as dolomitization, I ,c1 fracturing, and pon such as vug with other pores in For exi. no in a carbc contribute to porosity but very littie to permeability. Conversely, the presence es y increases Ter- by BRIEF DESCR" [0 r- to the followir ion *th the wings, in FIG. 1 illustrates an environ me:: ogging while drillin FIG. 2 illustrates an environment for wirelin, lo FIG. 3 Hi 7nvi7rmr. fc.,rtubi- .yed logging; -1- 2017-IP4-101129 Ul POT [0007] FIG. 4 illustrates a block diagram of an example of a system - licting a performanr,; [0008] G. 5 illustrates an example of composite logs of a well across a horizontal section; and [0009] FIG. 6 illustrates a flow diagram of a method for predicting a performance of a II. DETAILF. -SCRIPTION [ .7 117,1 esistiOy i rely porosity But rosity in carbonates is flot well defined, it has ble to investigate alternative methodologies to eability estimatt.::; ' Introduced herein is a new wor-:w that utilizes ; - logging tools, such as - a nneazur ; drilling ton!. The tools can also use, for iii: e, slickline, ciiled tubing. Th can provide a micro-resistivity image for pernneability esti without using porosity data. 17.] In a micro-resistivity voids encoun ,g in a water-based r-u--7!. (NBM) syste 1--;:ith conductive fluid and , ,tive pixels. -Juced --2rLifies and determines a nu bc hese conduc i ; pixels from a histogram that is generated from a micro-resistivity 'cro-resistivity value ; from a section of a well. Using the combination of the mathet an of the resistivity vity measure ,;;T- derivesvalue as .iltrate. A .- - ;::; calculated - ding the ,Dnductive pixels below the cutc , - with the total number of pixels at each depth. 2017-IPM-101129 Ul PCT The introduced method no n is continuous ratio formation tester measured Tl -ed systems and methods can be best understood in the conte> .rvironments which they op crivironments are illtiefrated in FIGS. 1-3. [0 FIG. 1 shows an illustrative I 2ging white drilling D) environment. A 2 is ec-.1 ..'. 1 with a derrick 4 that supports a hoist 6 for raising and lowering a drill string 8. The hoist 6 suspends a p drive 10 suitable for rotating t ring 8 ar I low ° drill string thrli ad 12. Connect.f...d. to the lo'' the drill 8 is a bit 14. As bit 1 creates a b, 16 that passes through va formations 18. A pump 20 ( _ drilling fluid through a supply pipe 22 to top drive 10, do ri the interier string 8, , back :.face via 9id into a reL flu:d cuttings from into the pit 2 .: .ls in maintaining the integrity of the borehole 16. Vai 1 s can be use .pr Ing fluid, including a salt-water based conductive mud. ty valuer.. 5:1;ry )urces :.nagneti permeability indic: (NMR) data -tune the metho based on tae ived pern values such as values from acoustic Stoneley wa or offset we permeability variations is a criticl and petrophysi,--al u es bec iu e the ctermination of tater -ing the stimulatic mpletion design. suite 2.. collects m... ° .:egrated into the ents variow: ies as well as the tool [0015] In tilt.. Tustrated hole bly mar 14. 20177IPM-101129 Ul PCT orientation and various other i ent, the tool suite 26 may take thecolla tha, provides weight riidity to aid the The LWD nclude a laterolog tool and i micro-resistivity imaL, msor to measure formation resist vity at different distances, eg, shallow, deep resistivity nneasurement, borehole - telemetry sut may be ^ a surface , eiver 30 and - commans.,s from :elemetry sub 28 does flot corm-.:, ..:: with the surface, but rather stc D mbly is )girig data for later retrieval at the surface when the loggir recovered. [001 I y sub 28 logging tools 26 such as a laterolog tool and micrc- y imaging sensor. The computer 3 is c"nfigured to comry: n frot mie or r e systI.i 33 is configured by software in a non-transi _nt crier read 37 to moi - le instrumr_ the telern-, ...e c-. display o. .ice 36 and a usei - 35 to enable a human operat to interact with the computer system 33. The computer system 33 may be a distributed system having _ thereof located away fr the surface. Fo puter sy reof _ocated at cessin .ng , or an,y... mes during the dt s the drill string 8 may be removed from shown in FIG. 2. Out ring has been renr.,-1 logging ,...onducte wirelinc by a cable 42 having conductors fo :ansporting power to the sond . :1:metry from the sonde to 2017-IPM-101129 Ul PCT the surface. The wireline logg' sonde 34 may ha centra izing sprinps to ixis as the too 'e a sensors laterolog tool a a micro- for measu n resistivity. A logging' from the wireline logging sonde 34, arif; ° A... a sy,.: ...ri 45 co:k7gured s; to the 7)rr, -4 FIG.1 for proc(:ssing and ga :ging sensor 'acility ects measurements [0018] An alternative logging tech - Ioggin, rystem in tubing injector 5(, a w the well 62. In ff .,a supervisor tubing-conveyed logging. FIG. 3 shows an il tubing a spool 52 by a h a packer into and one or more I,. the cou l tubing 54 and configured to communicate to a computer system 66 configured similarly to the computer system 50 of FIG.1 via infor n induits or uphole j1 67 ma 'fided to e) ..u.lications vh ::.c s iss,ry 7.,eive da- to :vdtothesurfi. system 66. (OC FIG. 4 illustrates a bIoc.. of an example of a pe .y , syst T.e syste. a permeability indicator of a well from micro-resistiv iy transm por,,, .y data. It is understood that micro-resistivity is measured by oids in the formation having conductive drilling mud, which has invaded the 1 during drilling, e.g. in a WBM system. The syst( used in a do le operation such - 3uch as tL vn in FIGS. 1-3 and includes a LWD tool 410 and a -1puter 2017-IPM-101129 Ul POT The LWD tool 410 is con - mea! o-resistivity values from a ion of "is using va .T SSOtool 412 and a -ro-resit__ y im ° 414. The LWE tol 410 m be implem ted as a part of a bottorn. ssembly, e.g., the LWD 76 in FIG. 1, and as a part of a wireline logging sonde or tubing, e.g., the wirel-ne 4 in FIG. 2 or the cou l tubi - 54 in FIG. 3. .:s resistivity at differLt -ss., e vall. The - 412 rr asure resistivity from the borehol- approximately three (3) inches for shallow resistivity -.ment and as far as approximately 10 inches fro -he borehole wall for deep resistivity Although flot shown, the set of eles*--)nic sensors, e.g., that are connected to source t , current tl borehole fluid in cformation and to a remo_e reference electrode. The analysis of th T ati( -n the measure :s L_ ,s how deep the 1 (diffused) into the fort ermeabilit:. y of the (0( 2] The micro-resistivity sensor 414 measures and records esistiv 360 degrees within 0.5 inch from )1e wall at diffèrent depths a high- resolution micro-n. As Te body of th L"'D ool 410 r(- when drilling °s of the tool 410 h a full,zoverae -cu fe ence of t The button des are kc potential and an applied voltage cau5 tting current to each button electrode _o be recel-tel at a re electroc' ol 410. The res n. resistivity T di s. the sils... 2017-IPM-101129 Ul PCT employed button electrodes. I. e [7..)(el size o Tl o puter system 450 deriv the highr micro-resis ivity image has indicator from the measurements from the laterolog tool 412 and the micro-resistivity imagi -sor 414 of the LWD tool 410. The co r system 450 ' des an int -ace 452, a memory 454, a processor 456, dispH m 450 m, t surface computer system such as the - 33, 45, 66 i FIGS. 1,2 3. The interface 452, the memory 454, the processor 456, display 458 may be connected toi via conver ans. [0024] TI rface 452 is configured to receive measure ol 4 erolog tool 412, * ^ o-resistivity imaging sensor -ri,. The interfi... 452 is - con- ed to receive other ;-derived measurements such as Stoneley waves, NMR and tester measuremem Similar types of measure_ wells can ak received. The interface 452 can be a convention ;e that receive and trai: 452 can include multiple port.' 'erminals or co.nectors for receiving C. The ports, te -ri- r connectors may be conventional receptacles for communicating data via a _ations network. e memory 454 may be a iventional ory that is data e ory :Jay be nsient con 'UM 456, when provide the functior, instr may instru,_ tic ckrect the operation of a processo °, the processor :am instructit correspond to algorithms that ; schemes disc cd hem' For exal ald tO tas, ithm or - a perfi_::-c.-.Lc_cT 2017-IPM-101129 Ul PCT by deriving a porosi nt permeabiliy i or. The memory 454 or be a conventic: e processor or a special rocessor that is configured to carry out program instructions stored in the memory 454. In the illustrated ennb,- the processo- configured to determine a uî.b of ive pixels in 1 from ri of micrresistivity values m..sured micro-resist vity '14 from a n ot t a certain depth. More specifically, the proces 4:5 can determine the nu. Jonductive pixels in the histogram by calcula 1 a' n value of Ciemicro-resistivi y values at thc e lining an invusi, u ing a n between shallow and measurerrLi n deptf- I terolog tool 412, and deriving a cutoff value at the certain del :..i 'd on the average value and the invasion indicator. The c e pixels are 'le cutoff value. Jured to cab.. a ratio of the conductive pixel the cer ° icpth using the f the e the porosity-indep ,ermeability a corr:: : ......... ..uid I,. value fror. - -1-er shown). A wipe run -.Jt a ;ter is built and run int( e for pressure A wipe run may be performed for different purposes such as for .irernents. The for ' ster, e.g., a ic:.a by r: da.:a acquired on a wipe ru. run, whereir a and mobility meastu cleanin.2 c per'Dr. .ne The processor to a total number of pixels conductive pixel cessor 456 ca 2017-IPM-101129 Ul POT [0028] In the illustrated embodiment, the processor is further confi.-u compa cator log-derivec; The display v permeability resonance (NMR) p. y ke rnber of c. elation an empirical normalization and c further son. The using k further -quirements. Log-derived stic Stoneley permeability values and core/nu î. etic values f 3 am e or an offset well, and th_ .ester Oric- the further 9ta gathering valu the processor 45: malization factors, which obviate the -'so configured to partition the s on o mechanical moduli, a brittlene' neability indicator. -figured to provide various visu ns of the micro-resistivity measurements. For examplc, , the laterolog f id mob.r.y, the porosity-inde:,..: 4H :.ri present the ni 'ive pixel ratio, the fc:r.. y indicator and other data. FIG. 5 Ample of visual presentation that may be provided : ;play 458. illustrates a visual prt )ss n. First Track/column 510 y 51'- On 514 an.? verticri 16. Secc:: ion micro-resist vity image. Third Track 530 shows a micro-resistivity histogra w' h a' cro-resist vity 532 and calculated pixe 534. S: a 536, th:-: interval t 1-' -.f cutoffs 534, repres condw-tive jels are. Track 5':: alternative variable densit: VDL) presen the micro-resistivity histogram with the 2017-IPM-101129 Ul POT avei icro-resistivity values 542 and th ' ' d conductive pixel cutoffs 544. Fifth T ' 550 shr.-3 a shallow ,4, 552 and deep laterolog resistivity values 554. Separation 556 is shac nonconductive mud filtrate invasion. Sixth Track 560 shows conductive pixels ratios 562. Seventh Track 570 shows the calculated micro-resistivity ity values 572, acoustic Stoneley permeability values 574 an.]'xi tester ility data as circles 576. 1 horizontal section is divided into Five zones based on the calculated permeability, as shown in Table I. Table 1 displays average porosity, the perr . ty indicator and Stoneley permeabilit:, bove, while the pern ndicator values and I ty val roportionM r- - no such a relationship f ,y and permes , values. Zone Interval Porosity Image Per; L.-i..rm (ft) vv'... .-XX150 1.7 XX 1 50-XX950 17.2 3.5 3.6 XX950-XX100 18.8 1.1 1.4 D XX I 00-XX800 20.6 3.6 XX: --XX200 0.9 1.4 Table I-Well- [0032] FIG. 6 illustrates a flow diagram of an example of a method 600 for prediction a performan of a well. The DO may be performed by a computer system suc permeability predict [1G. 4. Th- od begins ep 605. 2017-IPM-101129 Ul PCT [0033] In a step logging tool, eg.r (D oI, is lo' the well and d:-- n section cf I at a certa'n frorL _de section of th ell at the certain micro-resistivity values may be measured using a micro-resisi: msor, such as 414 in FIG. 4. )34] In a step -icro-resisnv: dep . essed. Tl --esistivity values resistivity mi lar to the secol ' 20 in FIG. 5. In a step 615, a histogn micro-resistivity values cert pth is generated. T ok similar tc ;tep 620, an -flue of the micro-resistivity values at the certa is c;: f the calculated average values an n as :2 in FIG. 5. at the in the ) 625, an n indicator is d ri on u àeparation betweer) ires vity values, such as lion 556 in FIG. 5. TI. ion indicates no -- luctive mud filtrate invasion 'd a A The laterolog resistivity values are measured by a of the LWD tool, such as 2 in FIG. 4. The invasion indicatui may be c where "D" is d P "S" is shallow laterol, resistivity, "p" is an (ponent, nd "C" is an invasion coefficient. In the illusi embodimc _85 are used p i C. Values of p and C are derived using an iterative process that is initiated with p=0 and C=1. Ise of conductive invasion, S/D is df DIS. 2017-IPM-101129 01 POT [0038] In a step 630, a cutc" is derived using the averk resistivity ,.. m the step 62C un 111,,,,,, . step 625. The cutoff':.... is derived by 'L -ig the invasion i- with the al stivity value. Examples of the cutoff value are shown as c c44 in FIG. 6. 4] 1 els havir-_, -resistivity values that less than e cuto- the c,. in dcl a. defined as cc. 'Active pixels in a step 6 :s deter:....led from the histogram in a step 640. The oi. .luctive pixels would be ted on the left side of the cutoff value on the histogn icated by the sha a 536 in FIG. 5. ' the conductive ' Tati° of the c e s to - ....1 numbPr J....ed in a step 645. -1-- .,f the c.,. di _..pixels. Exai 3 ) a e shown as 54 [0041] In a step 650, a porosity-independt or at the certain depth is derivee r ,, ratio the step 645 an r conductiv ,..:xels is ..c. d to a cor -. the formati-..... tester Exal fthe derived porosity-:.. . .:.nt permeability in and the fluid mobility value a and 6- [te To ben( is cc:: og-deL - ui-- 'ty-indepe y values fro.... other sources in Stonel. y permeability values and core/NMI leability values from the same or offset well, ai I formation tester values can be used in comparison. Examples of the Stoneley permeabi I as 5 the ga`hc. , e source 1_1 u s, are met d, the step 655 may. itted. -12- 2017-IPM-101129 Ul PCT design, such as partitioning the best-flowing intervals in [0043] Although flot managing -yen using tF. porosity. example, :. od 60C 1., include steps of o such as a rock mecha o variatio comple s T _ additi )s of indi( For .ing a s usir. : .physical ness or a porosity and y indicator, and perfc....ing a include steps of managing the "plumbing" of the well's res.. tee , well's reservoir, such performing hncd ail r. maximum sw:. are ds in a 044] t sec 'icting producible fluid ' ydrc4 by analyzing the m rate_ ?.g., flot tc a encroach unwanted water, jection wells for enhanced oh l recovery. The __.ibed with a -'epth, the steps a the certain d ,c11 at a and may be repeated for other depths. It is also understood that the rr not use pon lue in an:' While reference to particular ity-irrid :nt. ...erein h. ,.;ribed and shown with ed in a particular order, it will be understo- ese steps combined, subdivided, ed ta form F iiyalent method without departing .rgs of the [...sent disclosY unless specificlly herein, is flot limitation of the present dis. -13- 2017-IPM-101129 Ul PCT [0046] Those skilled in the art to this ition relates will a. other dditions, deletions, substitu... and t.ions may be ma& t ,ribed -I :nts. [0047] Some of the techniques and operations described herein may be implemented by a - r.re computing systems configured to pro', lm i - y described. In v ious , a computing syFt may includ- -ny of ',. .ypes of cs, includi- bot to, p system ;ktop computers, laptops, noteboo rame computer systen mputers, workstations application servers, computer -ners, storage dey' :s or any type of co p .ctr.. v e. .i] TL Nfe-described system, s and may bl .cd r'orn rious processors, such as ocessors or cd or store executable prograr : .ences of ihods. ne softwar - storage me r optical disks, random-access disks, flash memories, and/or read-o )ry (ROM), to _us en s disclosed herein can further computer storage -)de thereol , the syste s Non-transitory medium used herein refers 1 a portion thereof computers, wherein the co pt instruc: SI. form on non-trar memory (RAM), enW St( or -:..)re - ein. )49] S CC p[ ducts with a nor y cc p f--- ing or carry o, -14- 2017-IPM-101129 [il POT I computer-rea .1 except for transitory, signais. Exa p s of non- t..... ...ory comm..- include, but are ....,, xl to: magnetic -ch as hard disks, floppy disk i, , t .pe; optical medi CD-ROM disks; magneto- optical media such _; 1 disks; and hardware devices that are specially configured to store 707' .M devices. Exa ' les of pr ode in -' and files - level code that executed by the compL. r using an interpreter. its disclosed herein i A. A method f ting a perfo nce of a well, co ing d ning a nur of conductive pixels fr., a histogram of.: .esistivity valu - logging tool ft a section of a well at a certain depth, calculating a ratio of the c n pixels to a total number of pixels in the histogram, and de v° a ;- arosity- meability indicator for the section certai base:' y value from data. B. A system for p ng a performance of a well, compr s ng a logging tool configured to nicro-resistivity values from a section of a well at a certain depth, and a process - e a numbc- -f conductive pixels ft-= o esis _ 3ixels to a tot___ he histogra based on derive a poro:,:- -ty indicator for the section at the cert the mobility value formation te f7-ri uctic,s COL a meth,J ing a per C. .' a well, the method comprising determi :)f conductive pixels from a histogram of 2017-IPM-101129 Ul PCT micro-resistivity values measure(' t loggir ing a ratio of t concluc to a tal nui- ity-independent y indicator for the section at the certain c' rid mobility 'fion teste' - embodiments A, B, and C may e one or more ollowing nal eleme., in combination: Element I: wherein the determining f conductive pixels in-1- generating itogram rom a micro-resistivity "c o esistivity values, calculating an average v. f: v ty :;rtain depth, determining an on a separat:Ln laterolog ring resistivity 'sure of the sec...... at at the certain depth and a deep laterolog ring resistivity mea of the section at the certain depth, deriving a cutc 1 on the average value and the invasion ng pix s the _ -e certain depth and measuring the micro-r4. ty values fronn the section of the well at the in depth. Element 3: partit oning based on a pct E'e ent 4: whe ell at a di' ic Stoneley permeability value fc: _ ;al attribute and the permeability r for the to an the perr..- indicator to o.e and/or nuc f the sec n at the certain f IT.. Element 7: ileu sso ,-,-togram a esistivity image cro esisti alues, an average value of the micro-resistivity values, deternnine an invasion 2017-IPM-101129 Ul POT sep tween a shallow laterolog ring resistivity mee iement of' sectio e ce a deep laterolog ring recietiv;hr tion at a cutoff value based on the a invasion indicator, and define pixels having micro-resistivity values less than the cutoff vale as the conductive pixels. Elennent 8: wherein the ratio is nor ty valu.. E' 'ment 9: a foi ster configured to t.uire the formation a wip.. : ..,ent 10: lic -resistivity values are measured using y f button elec les in the ' 1: wherein e logging tool include Dlog sensor config :o acquire the shallow late me. ' 'le deei . Eiement 12: where' `1- - nvasic - ' .or - 1Iement 13: when .. A ing : bility indi......... Î..:... .:3rmalizing the ratio to t'-- REVENDICATIONS1. A method for predicting a p,. of a well, comprising: determining a number of conductive pixels from a histogram of micro-resistivity values measured by a logging toc ection of at a certain depth: calculating a ratio ; `.o a total number of pixels in the histogram; and deriving a porosity-indepenc rmeabilit) r _ _ e section at the certain based on the ratio and a fluid mobili value from forim- 2. TIF ethod of Claim 1, wherein the determining includes: .Tating the histogram from a micro-resistivity image of the micro-resistivity values; an average value c . ro-resistivity values of the section at the d.;..;:mining an invasio.. tion between a shallow :erolog ring resistivity measurement of the section at the certain depth and a deep rin csistivity measurement of the section at the certain depth; , a cutoff value based on the average value and the invasion indicator; . ling pixels having micro-resistivity values ", .` 'ess th n c 'off value as the conductive pixels. mcliod of C. ...H 1 c tool in the sectior. at the the micro-n sistivity values from the section of well at the certain c.:. 4. The i.:. y one of Claims 1 to 3, rther comprising partitioning the section based on a p(.: 1 . 1 -ttribute and the permeability indicator 5. Tl - :any one of Claims 1 to 4, y .......ein the method is repeated to derive a permet the section of the well at a different depth. 6. 17:- thod of any one of Claims 1 to 5, further comprising comparing the permeability indicator to an acoustic Stoneley permeability value for the section at the certain depth. 7. Th d of ne of Claims I to 6, further comprising comparing the permeabil.., to cor_ ....._. Auclear magnetic resonance (NMR) permeability value of the section at tri( n depth. 8. The method of any one of C... the fluid mt..;:i"ty ..:.ein the --resistivity the lo -Dol. o 7, wherein the d - v normL° measured usi .' )n electrodes in 9. A system for pred...: tool confu, certain depth; and a processor determine af conductive pixels from a histogram o values; ratio of the conductive pixels to a tota hi! n; and indicay-7 de; a:id a -Y e from form, ester di - 10. T 3,3tem of Clp;rn 8, -- ,r41,41 -Irocessor 13 . configured t^: generate tl- from a micro-resistiv° age of -o-resistivity values; vnlue of the micro-resistivity values; :cator using a w laterolog ring resh .ction at th .: ::: . . j: p laterolog ring resistivity t the cerf:: Ince of a well, ng: )n of a well at a a-.esistivity pixels in the e 717,ii derive a cutoff value based on Li., average value and the invasic .1r; and define pixels having micro-resistivity values less than the le as the conductive pixels. 11. The system of Claim 9 or 10, wherein the ratio is normalized to the fluid mobility value. 12. The system of any one of C *ris 9 to 11, further comprising a 'on tester configured to acquire the formation tesi a wipe run. 13. -f7 7-7 one of Claims 9 to 12, he micro-resistivity values are measured usin - ton electrodes in tl 14. The sy-` TU any of Clairr, 9 *o 13, wherf.'n - laterolog sensor coi ;ured to acqiire the 'aterolog measurc e deep laterolog measurement. 15. The c:Claims 9 to 14, 'rivasion indicator indicates a t.-(- nductive n.