Before revision:  We use two deterministic quantities, the mean first exit time (MFET) and the first escape probability (FEP), to examine the transition events from low to concentration states under the influences of two types of noise. In the first case, the noise is multiplicative and symmetric, and we conclude that the fluctuations of the degradation reaction rate induce different switching processes for different noise param- eters.
After revision:  We use two deterministic quantities, the mean first exit time (MFET) and the first escape probability (FEP), to examine the transition events from low to high concentration state under the influence of L\'evy noise. We find that the fluctuations of the degradation reaction rate induce different switching processes for different noise param- eters.