Before revision: The scanning helium microscope (SHeM) is a novel form of microscopy that uses low energy (5-100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process.
After revision: The scanning helium microscope (SHeM) is a novel form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process.