Before revision: Delidding may also be done in an effort to reduce the operating temperatures of an integrated circuit such as a processor, by replacing the thermal interface material (TIM) between the die and the IHS with a higher-quality TIM.
After revision: to test the chip for radiation-tolerance with a heavy-ion beam orDelidding may also be done in an effort to reduce the operating temperatures of an integrated circuit such as a processor, by replacing the thermal interface material (TIM) between the die and the IHS with a higher-quality TIM.