Design of High Temperature Complex Dielectric Properties Measuring System Based on XGBoost Algorithm
Journal: Materials
Year: 2020

This paper aims to propose an online relative complex permittivity measurement system at high temperature based on microwave interferometer. A ridge waveguide with a TE<sub>10</sub> mode was used in which the sample was heated and measured simultaneously at a frequency of 2450 MHz, and the microwave interferometer is used to collect the amplitude and phase difference of the incident signal. The Extreme Gradient Boosting (XGBoost) algorithm trained by the corresponding simulation data is used to