OPTICAL DIAGNOSTICS OF CARBIDIZED SILICON NANOWIRES
Journal: International Forum “Microelectronics – 2020”. Joung Scientists Scholarship “Microelectronics – 2020”. XIII International conference «Silicon – 2020». XII young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis
Year: 2020

In this work the optical properties of carbidized silicon nanowires (SiNW) are investigated.