Test Compression with Single-Input Data Spreader and Multiple Test Sessions
A new test set compression scheme for circular scan
Mitigating Observability Loss of Toggle-Based X-Masking via Scan Chain Partitioning
A run-pause-resume silicon debug technique with cycle granularity for multiple clock domain systems
Test Stimulus Compression Based on Broadcast Scan With One Single Input
Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns