[en] EN: This Master's Thesis is focused on the methods to measure the Non-Intentional Emissions (NIE) in the Low Voltage (LV) grid. These measurement methods have commonly been related to Electromagnetic Interference (EMI) of Electromagnetic Compatibility (EMC) tests. Nevertheless, these procedures are intended to be performed in controlled test environments, i.e. laboratories. Additionally, in the LV grid, Compatibility Levels (CL) for emissions in this medium must be complied with. The waveforms which exceed the CL in the LV grid can affect the correct operation of the rest of the equipment connected to the grid and the communications propagated through this. Furthermore, this medium is a very hostile environment for communications, as it has very changeable properties that are dependent on the consumption, type, number, et cetera of the connected devices. For these reasons, it is essential to correctly characterise the electromagnetic emissions that exist in the LV network. For this purpose, measurement methods that provide the amplitude of the emissions in the spectrum must be used, which have to be designed for the low-voltage network. This Master's Thesis addresses these issues with two main works. First, a comparison has been made with the existing NIE measurement methods, both in the literature and in the EMC and Power Quality (PQ) standards. The second contribution of this work is the proposed three EMI measurement methods for the characterisation of the network waveforms. A digital implementation of CISPR 16-1-1 has been defined, a procedure with which the CL of the grid must be verified. Secondly, a new measurement method, the RMS-A method, has been developed in this work, which allows to calculate the RMS values of the spectrum in the CISPR Band A. Additionally, other new EMI method has been designed, the Approximated Quasi-Peak (AppQP), which provides values similar to CISPR 16-1-1; however, it has lower computational complexity and needs fewer memory requirements.

[eu] EUS: Master Amaierako Lan honek Behe Tentsioko (BT) sareko emisio ez-intentzionalak neurtzeko metodoak ditu ardatz. Neurketa-metodo hauek Bateragarritasun Elektromagnetikoko (EMC) proben Interferentzia Elektromagnetikoko (EMI) prozedurekin lotu ohi dira. Hala ere, proba horiek kontrolatutako inguruneetan egiteko diseinatuta daude, hau da, laborategietan burutzeko sortu ziren. Gainera, BT sareetan existitzen diren emisioetarako Bateragarritasun Mailak (CL, Compatibility Levels ingelesez) definitu dira, zeinak gainditu ezin izango diren, sarera konektaturiko gainontzeko ekipoen funtzionamendu egokian edota ingurune horren bidez hedatzen diren komunikazioetan (PLC, Power Line Communications ingelesez) eragin baitezakete. Bestalde, BT sarea oso ingurune desegokia da komunikazioetarako, oso propietate aldakorrak baititu, konektatutako gailuen kontsumoaren, motaren, kopuruaren eta abarren araberakoa baita. Horregatik, garrantzitsua da BT sarean dauden emisio elektromagnetikoak behar bezala ezaugarritzea. Horretarako, espektroko emisioen anplitudea neurtzen duten neurketa-metodoak erabili behar dira, eta behe-tentsioko sarerako diseinatuta egon behar dute. Master Amaierako Lan honek bi ekarpen nagusirekin heltzen die gai horiei. Lehenengoan, gaur egun existitzen diren EMI metodoen konparazioa egin da; bai literaturan, bai EMC (Electromagnetic Compatibility) eta energiaren kalitatearen estandarretan definitutako metodoak erabiliz. Lan honen bigarren ekarpenean, sareko emisioak ezaugarritzeko hiru EMI neurketa metodo proposatzen dira. CISPR 16-1-1 estandarraren inplementazio digitala definitu da, parametro finkoak dituena. Izan ere, metodo horrekin sareko emisioen maila neurtu behar da CL-ak betetzen direla egiaztatzeko. Bigarrenik, lan honetan neurketa- metodo berri bat garatu da, RMS-A metodoa, espektroaren RMS balioak CISPRren A bandan kalkulatzeko aukera ematen duena. Beste alde betetik, beste EMI metodo berri bat diseinatu da, Approximated Quasi-Peak (AppQP) deitua, CISPR 16-1-1 metodoaren antzeko balioak ematen dituena, baina kostu konputazional txikiagoa duena eta memoria-baliabide gutxiago behar dituena.