Microscopy & Microanalysis Software Library 
(MMSLib)
Abstracts





Title:  AS-EASY-AS Ver 3.01
Directory: MMSLib\GRPH\ASEASY
Keywords: Graphing, Plotting
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: None.
Hardware Requirements: Math Chip, 8087/287/387 gives faster processing.
Author(s):  TRIUS, Inc.
Correspondence Address: 231 Sutton St., Suite 2D-3
North Andover, Mass.  01845
Phone: (508) 794-9377

Abstract:
 A shareware plotting and graphing program.  See Aseasy.doc for full details. AS-EASY-
AS is distributed as evaluation software which means that you can make copies for 
evaluation purposes but that if you use the software we expect you to register. (You can 
use the ORDER.ME file on this disk) Registered members receive the latest version of the 
program, a Printed bound manual, Help Screens,  Demonstration  worksheet  files, 
Technical support and Update Notices. Registration costs $40.00 (U.S.).  For first class 
mail or UPS add $5.00. International orders, add $5.00 for S&H.



Title: ATOM
Directory: MMSLib\DIFF\ATOM
Keywords: High Energy Electron Diffraction, Absorption
Computer: Any with F77 compiler
Operating System: Any
Programming Language: Standard FORTRAN 77
Hardware Requirements: none
Author(s): Q. A. King and D. M. Bird
Correspondence Address: School of Physics, University of Bath, 
					Bath BA2 7AY, UK.
Email: d.bird@gdr.bath.ac.uk (Internet)

Abstract:
Atom is a subroutine which when passed the name of an element,  the length of a g-vector 
and a Debye-Waller factor will compute and return both the real and absorptive atomic 
scattering factors, which can then be incorporated into any existing diffraction program. All 
the data is self-contained within the subroutine, documentation may be found at the head of 
the subroutine.  

 

Title: ATMLVL
Directory: MMSLib\XEDS\ATMLVL
Keywords: XEDS, EELS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN  IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
Materials Science Division, Argonne, Illinois 60439,

Abstract: 
ATMLVL.DAT is a data file containing all inner shell edge energies for elements in the 
range of H (Z=1) to FM (Z=100). The table is stored as simple ASCII characters to allow 
simple access and file transfer.  Each element contains 24 entries which correspond to the 
following shells K, L3, L2, L1, M5,  M4, M3, M2, M1, N7, N6, N5, N4, N3, N2, N1, 
O5, O4, O3, O2, O1, P1, P2, and P3.  If an element does not have a particular edge its 
energy is listed as zero. The program BATMLVL, which is given in the ATMLVL.SRC 
file, can be used to create an efficient binary file from this ASCII listing, while the 
subroutine ELEDGE can be used in a user written program to read the resulting binary 
file. 



Title: BENCHMARKS
Directory: MMSLib\MISC\BENCH
Keywords: COMPUTERS
Computer: DEC, IBM, APPLE, ATT, CDC, HP, PRIME, GOULD, SUN, 
COMMODORE, TI
Operating System: Various as appropriate to above systems
Programming Language: FORTRAN , BASIC, Pascal, Assembler
Hardware Requirements: None
Author(s): Earl J. Kirkland
Correspondence Address: School of Applied and Engineering  Physics,
Cornell University Ithaca, N.Y. 14853

Abstract:
Benchmarks on various computer systems have been run in order to gauge the 
performance of various CPU's to different types of problems. The performance of 11 
different computer systems is described and the source code is documented in order that 
users may repeat comparisons on systems not included in this study.  The comparisons 
include raw computing speed (Integer and Floating Point), memory dependent 
computations, and FFT computations. 



Title: BINHEX - File Translator     
Directory: MMSLib\MISC\BINHEX
Keywords: ASCII, Hexadecimal, Bitnet     
Computer: IBM PC/XT/AT     
Operating System: MS-DOS     
Programming Language: Turbo Pascal v. 5.0     
Hardware Needed: IBM PC/XT/AT     
Author: H.O. Colijn     
Correspondence Address: Ohio State University,
Central Electron Optics Facility
042 Fontana Labs
116 W. 19th Ave. Columbus, OH  43210-1110
Phone: (614)292-0674     

Abstract:   
Some computer networks (such as Bitnet) can transmit ASCII files only.     Others (such 
as Internet) require a special facility (i.e. ftp) to transmit binary files, whereas ASCII files 
can be transmitted easily using the MAIL facilities.  While this allows source code to be 
transmitted easily, it is difficult to send executable programs, spectral  data files, or 
archived files.  Many word processing programs also use non-ASCII characters to store 
document formatting information.  It is difficult for people to exchange information in the 
format they desire over computer networks. This program will convert a binary file to and 
from the hexadecimal equivalents of the binary bytes.  That is, each byte in the binary file 
will be converted into 2 ASCII characters (0-9,A-F) corresponding to the value of the high 
and low four bits  (respectively) of the binary value.  Thus, regardless of the contents of the  
original file, the resulting file is strictly ASCII.  Note that this translation doubles the 
original size of the file since each byte of the binary file is converted into 2 ASCII 
characters, each requiring one byte.



Title: Bioquant
Directory: MMSLib\XEDS\Bioquant
Keywords: Quantitative composition mapping, biological
Computer: Generic PC 386 or higher recommended
Operating System: Microsoft DOS 5.0 (may be able to use 3.0 and above
Programming language: 15 programs in Microsoft FORTRAN 5.1; 2
programs in Microsoft Quick Basic 4.5
Hardware Requirements: 640 KB minimum, Hard Disk, 2 Mb of
memory, (1 MB configured as Virtual Disk), Vga monitor and chip set capable
of supporting 256 simultaneous colors, and at least 640 by 480 resolution, 1
MB VGA memory recommended.
Software Requirements: Graphics Kernel System (Device Independent Graphics drivers) 
can be purchased from Spectrographics GSS P.O. Box 4900
Beaverton Oregon 97005 503-641-2200
Author(s): Robert Heyman and Albert Saubermann
Correspondence Address: Robert Heyman, 4410 Anice, Houston TX 77039.

Abstract:
This is a package of 17 programs used for quantitative compositional mapping of 
biological specimens. The program named DIGEM acts as a traffic director "Shell"ing to 
all other programs as needed. Each program can also be run by itself if desired.  Original 
intensity data is stored in a file with an extension "HDR" and must be converted into two 
files (a header file; and a random access composition file) before the other programs can be 
used.  Each program is highly interactive and should not need operating instructions. The 
only catch 22 in this system, is that the system will not run without certain "device drivers" 
which are only available from Spectrographics GSS.
References: "Quantitative Compositional Mapping of Biological Tissues Using a 
Microcomputer" MAS proceedings August 1992. "A multifunctional Mini Computer 
Program Providing Quantitative and Digital X-Ray Microanalysis of Cryosectioned 
Biological Tissue
for the Inexperienced Analyst" Journal of Electron Microscopy Techniques; April 1987. 
See also other papers by Heyman and/or Saubermann.



Title: CDEMO
Directory: MMSLib\Monte\WILSON\CDEMO
Keywords: Monte Carlo, Image, X-ray
Computer: Macintosh
Operating System: MacOS
Programming Language: MPW C
Hardware Requirements: FPU
Author: Dr Alan R Wilson
DSTO - AMRL, SSMD
GPO Box 4331
Melbourne   3001
Victoria
Australia.
Email: wilsona@blackjack.cis.dsto.gov.au
Phone: 61 3 626 7508
Fax: 61 3 626 7087

Abstract: 
Monte Carlo Programs for calculating the x-ray intensity produced from bulk materials 
containing multiple vertical interfaces.

General.
The programs are used to calculate the x-rays generated from a progressive scan of points 
across multiple interfaces.  The x-rays generated in the specimen are stored in 2-D arrays.  
The cell size of these arrays is variable to ensure that a very thin interface has at least one 
cell devoted to it.
Suite of programs
1. fsexray - the Monte Carlo program.  Produces a set of arrays for each element which 
contain the x-ray intensity at a specific point in the specimen.  The arrays are 2D and sum 
the intensity parallel to the interface.
2. xray - determines the x-ray intensity at the entrance to the detector.  Includes absorption 
in the specimen but no detector absorption etc.  The x-ray detector is assumed to be in a 
plane perpendicular to the interface.  Assumes all x-rays generated in fsexray head towards 
the detector.  (Uses the results from fsexray.)
3. imagexray - converts the fsexray results to an array of 16 bit unsigned integers suitable 
for display in the PD program Image.  Each element at each point in the scan has its own 
array.  Note that each pixel in this array may not be equivalent to the same lateral distance 
in the specimen since the finite element arrays used to store the x-ray intensities may have 
variable element widths to allow for very thin interfaces.
Code.
Written for Apple Macintosh computers with FPU.
Some structures are used across all three routines and if changed in one must be changed in 
the others.
All code has been developed in MPW C.  I expect to migrate the code to native Power 
Macintosh in the future.
Executables.
Executable code is included in this file.
Copyright.
The programs are copyright of the author however they are available for use in the public 
domain but not for sale in any form.  The programs are not guaranteed to be bug free and 
any feed back from there use would be greatly appreciated.  Normal acknowledgment of 
the use of these in any published work is expected.



Title: CITZAF Version 3.03
Directory: MMSLib\EMPA\CITZAF3
Keywords: Combined ZAF and Phi-Rho-Z Electron Probe Correction Programs
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: MS Quick BASIC Vers. 3.0 or Borland Turbo BASIC V. 1.0
Hardware Requirements: Math Chip, 8087/287/387 gives faster processing.
Author(s): John T. Armstrong  Correspondence 
Address: California Institute of Technology, Div. of Geological and 
Planetary Sciences 170-25, Pasadena, CA 91125. 
Phone: (818) 356-6126

Abstract:
  A Data transfer, entry, manipulation and reduction package for  determining compositions 
from electron probe data recorded from conventional  thick polished specimens (TPS), this 
version of the Caltech ZAF program  package (V3.03) comprises three self-extracting ZIP 
files.  CITZAF1.EXE  contains the BASIC source codes of the various programs and 
ASCII text files  of the data tables of line and edge energies and mass absorption 
coefficients   CITZAF2.EXE contains  compiled  versions  of the BASIC-language ZAF 
programs  and random access files containing the line and edge energies, mass absorption  
coefficients, atomic weights and fluorescence yield factors used by the  ZAF  programs. 
CITZAF3.EXE contains batch and text files used in the menu-driven  operating system for 
this package, compiled versions of programs that store the  random access data files, 
copies of public domain utility programs that are  used in this package with their 
instructions, and a README file (README.NEW) 



Title: CITZAF Version 3.04
Directory: MMSLib\EMPA\CITZAFMA
Keywords: Combined ZAF and Phi-Rho-Z Electron Probe Correction Programs
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: C
Hardware Requirements: Math Chip gives faster processing.
Author(s): Paul K. Carpenter
Correspondence Address:
	|Electron Microprobe / X-ray Lab  
	Department of Geology 170-25
	California Institute of Technology  Pasadena CA  91125
Phone: 818-395-6126 (X-ray Lab)  
Fax: 818-568-0935 (Departmental )
email: paulc@cco.caltech.edu or paulc@arms.gps.caltech.edu    |

Abstract: 
NOTICE:
This is the BETA Release of Macintosh Citzaf (Version 3.04).  This initial version of 
CZMAC is freeware, and is NOT SUPPORTED in any way shape or form.  In particular, 
NO TELEPHONE SUPPORT is provided.  Paul Carpenter, John Armstrong, and 
California Institute of Technology are not liable.  Use at your own risk.

Citzaf is copyright:
John Armstrong
Department of Earth and Planetary Sciences
California Institute of Technology
Pasadena CA. 91125

About the Program:

The popular shareware package of ZAF/PRZ X-ray correction programs has been ported 
from the BASIC PC version to a C language version on the MacIntosh by Paul Carpenter.  
This BETA release of Citzaf on the Macintosh is written in Think C, as a minimal 
Macintosh application.  It uses a console window interface for input and output, similar to 
the PC version.  Development has been a time-consuming procedure, with emphasis on 
numerical stability and accurate results rather than user-friendly aspects.  At this time there 
are no hookups to menus, dialogs, or other Mac interface items.  This will be added at the 
appropriate time.  The program currently requires 650k of RAM to operate.  If you 
change the amount of memory used by the program under multifinder to be less than 
650k, the program will crash.  Increasing the memory to be larger than 650k does not 
actually change the amount of memory that the program uses.  Currently we allocate 
memory for 30 elements total (hence the 650k), and just use what we need.  Dynamic 
memory allocation is partially installed. 



Title: CLEDX
Directory: MMSLib\XEDS\CLEDX
Keywords: EDXS quantitative analysis, Cliff-Lorimer
Computer: IBM PC family or clones
Operating System: Microsoft DOS 3.x or higher
Programming Language: Microsoft FORTRAN Optimizing compiler 4.10
(large library, math-coprocessor emulator mode)
Hardware Requirements: None
Author(s): Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides, Bat. 510
F91405 ORSAY CEDEX FRANCE.
EmailBitnet address: TREBBIA@FRUPS51
 
Abstract:
From experimental conditions (angles, detection system, primary voltage, line intensities & 
backgrounds), this program computes the weight & atomic concentrations of up to 20 
elements in a thin film X-Ray analysis experiment using the Cliff-Lorimer procedure. An 
estimation of the confidence intervals on the concentrations, for different first kind risks, is 
also given. No special hardware is needed (i.e. math coprocessor or graphic monitor). 
Results can be directed either to a line printer or to the screen. From the original COLIJN 
& ROMIG program PCEDS, several  improvements are made concerning both the 
algorithms (parameterized maximum number of elements to analyze, computation speed, 
analysis of the results precision) and the accuracy of the formulae and data. Several 
misprints were also corrected. Reference "CLEDX" a stand-alone program for quantitative 
X-Ray analysis of thin films using the Cliff-Lorimer procedure", P. TREBBIA, 
Ultramicroscopy 27, 343-348 (1989). 



Title: CMS-EDS Utility
Directory: MMSLib\XEDS\EDSUTIL2
Keywords: XEDS
Computer: IBM PC/XT/AT
Operating System: MS-DOS
Programming Language: Quick BASIC
Hardware Needed: IBM PC/XT/AT
Author(s): C.M. Sung and G. Cliff
Correspondence Address: GTE Laboratories Incorporated
				40 Sylvan Road
				Waltham, MA 02254
Phone: (617) 466-2865
Fax: (617) 890-9320

Abstract:
This program will calculate and display many important parameters needed for x-ray 
microanalysis of a given element (i.e. Mass Absorption coefficients, Detector efficiencies, 
Fluorescence yields, etc.). It uses algorithms based on frame to list data normally found in 
tabulated form in reference texts (e.g. Goldstein et al. SEM and X-ray microanalysis, 
Chapter 14, pp 620-641). On pressing "C" the program will prompt for an element identity 
(atomic number or symbol). On pressing return <RET> a data table is produced. If another 
(absorber) element atomic number is then entered the mass absorption coefficients of the 
X-ray lines of the first element being absorbed by the second are also reported.



Title:  CORMONTE
Directory: MMSLib\Monte\CORMONTE
Keywords: Electron Microprobe, Standardless Analysis, Monte Carlo Simulations.
Computer: IBM PC/XT/AT or higher or compatible
Operating System: MS-DOS 3.3 or higher
Programming Language: unknown
Hardware Requirements: None
Author(s): Robert Mykleburst and Chuck Fiori
Correspondence Address: NIST, Gaithersburg, MD 20899

Abstract:
 This package contains the first principles data reduction package for x-ray spectral data 
from the SEM/Microprobe written at NBS (now NIST).  This package is a self-extracting 
ZIP file called CORRMONTE.EXE. It also  contains the NIST Monte Carlo simulation 
routines. The package runs on a PC  or compatible.



Title: DATASAVE & LASERGRAPH
Directory: MMSLib\GRPH\DATASAVE
Keywords: Data Display and Output (via Laser Printer)
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: Compiled MS-Basic
Hardware Requirements: PC and Laserprinter (HP, Parallel Connection)
Author(s): James E. Quick
Correspondence Address: unavailable.

Abstract: 
 DATASAVE is a program for plotting and manipulating data on a PC-type computer, 
both DATASAVE and its partner LASERGRAPH are stored in 4  self-extracting ZIP 
files labelled DATASAVE1.EXE to DATASAVE4.EXE. LASERGRAPH facilitates 
printing graphs, created and stored on disk using DATASAVE with a Hewlet-Packard 
Laserjet II printer. Graphs may be printed in four different  sizes. The program can be used 
to construct individual pages or to batch  process large numbers of graphs.  Individual 
pages can be constructed from one or more graphs using an editor that allows placement of 
miniature  reproductions of graphs on a scale model of an 8.5 x 11 inch page.  The editor 
may also be used to create page formats that control batch plotting of the  graphs stored on 
a single disk. 



Title: DIFFRACTION SUITE
Directory: \MMSLib\CBED\DIFFRAC
Keywords: CBED, HOLZ, KINEMATICAL APPROXIMATION
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS
Programming Language: Fortran 77
Hardware Requirements: TEKTRONICS 4010 TERMINAL OR SUITABLE 
EMULATOR
Author(s): JOHN F. MANSFIELD
Correspondence Address: North campus electron Microbeam Analysis Laboratory
413 SRB, 2455 Hayward, Ann Arbor MI 48109-2143
Phone: (313)-936-3352
Email: John.F.Mansfield@umich.edu

Abstract:
This set of software routines will calculate a data file of reciprocal  lattice vectors for any 
crystal, when supplied with the lattice parameters and the lattice type, and then plot 
simulated convergent beam electron diffraction zone axis patterns (CBED ZAPs).  The 
simulations are currently limited to plots of the zero layer discs, plots of the bright field 
deficiency higher order laue zone lines and both of the above simultaneously. The manual 
for this suite of routines was written on an apple macintosh using "MacWrite", with 
examples of actual plots "pasted" into the text from the terminal emulation program 
"versaterm".  A copy of the text of the manual  resides in the emmpdl under the title 
"diffractionsuite.doc. to receive a complete copy including figures, please send a blank 
macintosh disk the author.



Title: DCJAEMMC
Directory: MMSLib\XEDS\DCJAEMMC
Keywords: Monte Carlo Simulations, XEDS Resolution
Computer: IBM PC and compatibles
Operating System: MS DOS v 2.0 or greater
Programming Language: TurboPascal
Hardware Requirements: Math Chip Optional but recommended
Author(s): David C. Joy                   
Correspondence Address: University of Tenn
Em Facility, Dept. of Zoology, Knoxville, TN
Phone: (615)-974-3638
EWmail: BITNET:JOY@UTKVX1

Abstract:
AEMMC - uses a single scattering Monte Carlo model to investigate the spatial resolution 
of X ray production in  thin films. After  computing and displaying the electron trajectories 
the program plots two  pieces of data. The first is  the cumulative profile  of Xray 
generation  in the solid, calibrated in angstroms and  the 0% and 90% values are  drawn in 
to enable the value to be  measured easily. The second  display  calculates the Xray signal 
that would be observed from a  thin unit  width  plane-parallel  layer  such  as  a monolayer  
of   some material  sandwiched between two  grains.



Title: DFTools (Version 5.1 May 1990)
Directory: MMSLib\DIFF\DFT
Keywords: diffraction, CBED
Computer: PC
Operating System: MS-DOS
Programming Language: unknown
Hardware Requirements: Math Chip gives faster processing.
Author(s): John A. Sutliff
Address:  Bldg K-1, Room ICIO
	General Electric CR&D
	P.O. Box 8
	Schenectady
	NY 12301
Phone: (518) 387-7732
FAX: (518) 387-6972
Email: sutliff@crd.ge.com

Abstract:
DFTools is a program to assist in the analysis of diffraction patterns (DPs).  It provides a 
facility for recording measurements taken from DPs, for conveniently accessing crystal 
structure data, for performing basic crystallographic calculations, for matching 
experimental patterns to calculated patterns, for simulating diffraction patterns, and for 
producing stereographic projections.  DFTools is not a program for determining crystal 
structures, although it may be helpful in doing so.  The user must always provide at least 
one crystal structure with which the program can make calculations.  The atom positions in 
the crystal structure are not used in DFTools; a calculation of structure factors is not
made. DFTools is a shareware type program.  You may give it to anyone, and make as 
many copies as you wish.  If you have a real interest in the program you can write or call 
the programmer and bargain for a copy of the source code. 



Title: dMOTTcs
Directory: MMSLib\HVEM\DMOtTCS
Keywords: Sputtering, Defects, Displacement Damage, EELS, XEDS, HVEM
Computer: DEC VAX 11/785
Operating System: VAX/VMS
Programming Language: VAX FORTRAN
Hardware Requirements: None
Author(s): Charles R. Bradley
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center,  Bldg  
212, Materials Science Division, Argonne, Illinois 60439, USA

Abstract:
This program calculates differential Mott cross-sections of elemental nuclei in collisions 
with relativistic electrons. These cross-sections are useful in the study of displacement 
damage and electron transmission sputtering. For medium and high voltage transmission 
electron microscopes now available, having clean vacuum systems and high brightness 
sources, modification of sample composition due to sputtering and/or displacement by the 
probe will become an important consideration during microanalysis or imaging.



Title: Dose 
Directroy:  MMSLib\CTEM\DOSE
Keywords: Electron Dose Measurement, TEM Computer Control
Computer: IBM PC
Operating System: DOS
Programming Language: Pascal
Hardware Requirements: Philips CM Series Computer Interface
Author(s): M.T. Otten  
Correspondence Address: Philips Analytical
International Business Centre
Electron Optics, Building AAE
5600 MD Eindhoven, The Netherlands

Abstract:          
Dose is an on-line computer program which allows the user of a  Philips CM series 
TEM/STEM to determine specimen electron irradiation  dose through the use of the 
Philips CM Series Computer Interface. Simple interactive questions allow the user to 
determine experimentally the  nominal irradiation dose from screen current measurements. 
Feb.  1990



Title: DYNADF 
Directory: MMSLib\CTEM\DYNADF
Keywords: Dark Field, TEM Computer Control
Computer: IBM PC
Operating System: DOS
Programming Language: Pascal
Hardware Requirements: Philips CM Series Computer Interface
Author(s): M.T. Otten  
Correspondence Address: Philips Analytical
International Business Centre
Electron Optics, Building AAE
5600 MD Eindhoven, The Netherlands

Abstract: 
DYNADF is an on-line computer program which allows the user of a Philips CM series 
TEM/STEM to simulate the  Dynamic Annular Dark Field operating mode. 
DYNADF.COM simulates for the CM TEM the Dynamic Conical Dark Field mode as it 
is available on the CM/STEM microscope. In the latter, the presence of the scan generator 
allows continuous scanning of the beam in a hollow cone. Since the CM TEM doesn't have 
a scan generator, the Dynamic mode is not available, but a similar effect can be obtained by  
continuously turning the MULTIFUNCTION X knob under computer control. 
Feb. 1990



Title: EDAX
Directory: MMSLib\XEDS\EDAX
Keywords: XEDS, SEM
Computer: IBM PC or compatible
Operating System: MS-DOS
Programming Language: Turbo Basic, GWBasic
Hardware Requirements: EDS Edax 9100,RS232C Card
Author(s): Henrik Kaker
Correspondence Address: SEM/EDS Laboratory, Metal d.o.o., Koroska c.14                    
		       62390 Ravne, Slovenia
Email: kaker@ctklj.ctk.si

Abstract:
Program for connection energy dispersive spectrometer Edax 9100 with IBMPC or 
compatible computer via line printer port of the Edax 9100.Program allows transfering 
intensity and spectral data to PC and processing this data with standardless programs for 
bulk and thin film samples.
Documentation: EDAX.DOC
Source Code: Yes



Title: ECPOrient
Directory: MMSLib\DIFF\ECPORI
Keywords: diffraction patterns, rotation matrices, grain boundaries
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: Think Pascal 3.0
Hardware Requirements: Mac & Hard Disk 
Author(s): Doug Crawford
Correspondence Address: Fuels and Engineering Division,
    Argonne National Laboratory West,
    PO Box 2528
    Idaho Falls, ID 83403-2528

Abstract:
 This program is designed to perform orientation analyses on Kikuchi or Electron 
Channelling Patterns. The program reads and displays images in the Kevex 8000 .img file 
format.  The analysis proceeds as the program prompts the user to select points on the 
Kikuchi bands to index the pattern.  The output is displayed on the screen and the user can 
select the solution that makes most sense, this is then saved in both long format and as 
orientation matrices and pattern numbers.  For further information see:
D.C. Crawford and G.S. Was, JEMT 19 (1991) p345-360 and
D.C. Crawford and G.S. Was, Met Trans A 23A 1992 p1195-1206.



Title: EELSDATA
Directory: MMSLib\EELS\EELSDATA
Keywords: EELS SPECTRA
Computer: All systems
Operating System: None
Programming Language: None
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212
Materials Science Division, Argonne, Illinois 60439,

Abstract:
Experimental EELS spectra are now available in the EMMPDL.  They are generally titled 
in the form of: $NAME.PDL where the notation PDL indicates that they are ASCII files 
stored in the  EMMPDL data format (see RWEMMPDL.ABS). To locate these files set 
your DIR.FILENAME.FILETYPE to EELS.*.PDL in the Menu Options of the 
EMMPDL. You may access and transfer these file by all telecommunications options. 



Title: ELSKKT
Directory: MMSLib\EELS\ELSKKT
Keywords: EELS,CTEM,OPTICAL PROPERTIES
Computer: 11/730-785
Operating System: Vax/Vms
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Alex H. Buxbaum
Correspondence Address: Department of Materials Engineering,
Technion- Israel Institute of Technology
Haifa 32000, Israel.

Abstract:
ELSKKT is program written for the purpose of obtaining the loss function  and dielectric 
constant (real and imaginary parts) of materials, from  Electron Energy Loss (EELS) 
spectra obtained in the transmission electron  microscope.  Useful data generally begins 
around 8eV, for an instrument  with a resolution of 2 eV.  After correcting for multiple 
scattering, data is treated by using the Kramers-Kronig Analysis.



Title: EMMFF V. 1.0
Directory: MMSLib\XEDS\EMMFF & MMSLib\EELS\EMMF
Keywords: XEDS, EELS, AES, WDS, CLS, GAM, XRF, PES
Computer: IBM in MMSLib\XEDS or EELS\EMMFF\EMMFF.IBM
	        MAC in MMSLib\XEDS or EELS\EMMFF\EMMFF.MAC
Operating System: ALL
Programming Language: FORTRAN 77
Hardware Requirements: None
Author(s): EMSA/MAS TASK FORCE, Ray Egerton ,Charles E. Fiori ,John A. Hunt,
Mike S. Isaacson,Earl J. Kirkland ,Nestor J. Zaluzec 
Correspondence Address: R.F. EGERTON-CHAIRMAN
University of Alberta
Dept. of Physics
Edmonton, Alberta, Canada, T6G2J1

Abstract:
A simple format for the exchange of digital spectral data is  presented, and proposed as an 
EMSA/MAS standard.  This format is readable by both humans and computers and is 
suitable for  transmission through various electronic networks (BITNET, ARPANET), the 
phone system (with modems) or on physical computer storage devices (such as floppy 
disks).  The format is not tied to any one computer, programming language or computer 
operating system.  The adoption of a standard format would enable different laboratories to 
freely exchange spectral data, and would help to standardize data analysis software. If 
equipment manufacturers were to support a common format, the microscopy and 
microanalysis community would avoid duplicated effort in writing data-analysis software. 
This version of EMSAMASFF contains two subroutines which read and write spectral 
data files  Version 1.0 data format.  The data are stored as simple ASCII characters at a 
user defined number of  columns per line for the  length of the data file. The spectral data is  
preceded by a series of header lines, which tell the user about the  parameters of the 
spectrum. The header lines are identified by the first  character in the line being the symbol 
(#) followed by a descriptor  and if  appropriate its units. An example of a data file format 
can be found in the  EMSAMASFF.DOC file. 



Title: EPMA Database
Directory: MMSLib\EMPA\EPMA
Keywords: EDS, WDS, SEM, EPMA
Computer: None
Operating System: None
Programming Language: None
Hardware Requirements: None
Author(s): Henrik Kaker
Correspondence Address: SEM/EDS Laboratory,.Metal d.o.o.,Koroska c.14                      
		      62390 Ravne,Slovenia
E-mail: kaker&ctklj.ctk.si

Abstract:
Database of 681, 826 and 40 published entries for performance 
testing of EPMA programs. Database EPMA40.DAT present collection of published 
data from different manufacturers of EDS and WDS hardware and software and 
is suitable for testing standardless (no-standard) analysis programs.
Documentation: EPMA.DOC
Source Code: No



Title: FindCSL
Directory: MMSLib\DIFF\FINDCSL
Keywords: 
Computer: Apple Macintosh
Operating System: MacOS or MS-DOS
Programming Language: FORTRAN 77
Hardware Requirements: Mac & Hard Disk (PC also)
Author(s): Doug Crawford
Correspondence Address: Fuels and Engineering Division,
    Argonne National Laboratory West,
    PO Box 2528
    Idaho Falls, ID 83403-2528

Abstract:
 This program will read in angle-axis pairs and rotation matrices for the misorientation 
between two grains, as output by Heilmann's "Misorientation Matrix" program MISMAT, 
and determine if the misorientation lies within the allowable deviation for a CSL boundary.  
The program is written in FORTRAN F77 on the Mac, however it should be possible to 
recompile it on almost any system with an F77 compiler.



Title: FSCATT
Directory: MMSLib\HREM\FSCATT
Keywords: High Energy Electron Diffraction, Absorption
Computer: Any with F77 compiler
Operating System: Any
Programming Language: Standard FORTRAN 77
Hardware Requirements: none
Author(s): Andreas Weickenmeier
Address: Institut fuer Angewandte Physik der TH
                        Hochschulstrasse 6
                        W-6100 Darmstadt, GERMANY
Email: XLTODA6L@DDATHD21.BITNET

Abstract:
The subroutine FSCATT calculates the real part and the phonon contribution to the 
absorptive part of the atomic scattering factor for any element from He to Cf. The real part 
is obtained by a new analytical fit to the tabulated Doyle and Turner (Acta Cryst. A24 
(1968) 133 - 139), Doyle and Cowley (Intern. Tables of X-ray Crystallography, Vol. IV 
(1991) 152 - 174) and Fox and O'Keefe (Acta Cryst. A45 (1989) 786 - 793) values. For
the computation of the absorptive part an Einstein model is used. More details can be 
found in Weickenmeier and Kohl, Acta Cryst. A47 (1991) 590 - 597.



Title: FSEXRAY
Directory: MMSLib\Monte\Wilson\fsexray
Keywords: Monte Carlo, Image, X-ray
Computer: Macintosh
Operating System: MacOS
Programming Language: MPW C
Hardware Requirements: FPU
Author: Dr Alan R Wilson
DSTO - AMRL, SSMD
GPO Box 4331
Melbourne   3001
Victoria
Australia.
E'mail: wilsona@blackjack.cis.dsto.gov.au
Phone: 61 3 626 7508
Fax: 61 3 626 7087

Abstract: 
Monte Carlo Programs for calculating the x-ray intensity produced from bulk materials 
containing multiple vertical interfaces.

General.
The programs are used to calculate the x-rays generated from a progressive scan of points 
across multiple interfaces.  The x-rays generated in the specimen are stored in 2-D arrays.  
The cell size of these arrays is variable to ensure that a very thin interface has at least one 
cell devoted to it.
Suite of programs
1. fsexray - the Monte Carlo program.  Produces a set of arrays for each element which 
contain the x-ray intensity at a specific point in the specimen.  The arrays are 2D and sum 
the intensity parallel to the interface.

Code.
Written for Apple Macintosh computers with FPU.
Some structures are used across all three routines and if changed in one must be changed in 
the others.
All code has been developed in MPW C.  I expect to migrate the code to native 
PowerMacintosh in the future.

Executables.
Executable code is included in this file.

Copyright.
The programs are copyright of the author however they are available for use in the public 
domain but not for sale in any form.  The programs are not guaranteed to be bug free and 
any feed back from there use would be greatly appreciated.  Normal acknowledgment of 
the use of these in any published work is expected.



Title: GENPLOT
Directory: MMSLib\GRPH\GENPLOT
Keywords: Data Display and Plotting (via HP Plotter)
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: Turbo Pascal
Hardware Requirements: CGA or EGA graphics & HP Plotter
Author(s): Matthew J. Kramer
Correspondence Address: Department of Earth Sciences, Iowa State University, Iowa

Abstract:
 GENPLOT was designed to be an easy to use data entry, edit, and  plotting program. This 
program is a combination of a simple spreadsheet and  plotting routines that include XY, 
ternary, tetrahedral, and scalar  (distribution) plots. Hard copies of the graphs can be made 
with a dot matrix printer capable of graphics mode and the HP 7470 series plotter.  The 
program  and its associated files are located in the self extracting ZIP file 
GENPLOT1.EXE.



Title:  GMRFILM for IBM
Directory: MMSLib\XEDS\GMRFILM
Keywords: XEDS Thin Film Analysis
Computer: IBM PC /XT/AT or higher
Operating System: MS-DOS 3.3 or higher
Programming Language: IBM Professional FORTRAN Version 1.3
Hardware Requirements: Math CoProcessor Required
Author(s): Richard A. Waldo
Correspondence Address: GM Research Labs, 30500 Mound Road, 
	Warren, MI 48090-9055   
Phone: (313)-986-2871

Abstract:    
This program is a thin film XEDS data reduction package. Contained in this distribution 
are the source codes for the main program GMRFILM and the ~60 subprograms which 
are called.  Details of the correction procedure are contained within the individual 
subroutines.  The  file "GMRFILM.LIB" contains the library of subroutine  object 
modules.  The ASCII file STANDARD.DAT should be copied to the account or directory 
from which you run the program. STANDARD.DAT  contains  any  compound standards 
which are common to the types of specimens  which  the operator analyzes.  Edit this 
according to your own needs.  GMRFILM.EXE is the executable file. The program is self-
explanatory as it is executed.



Title: GMRFILM for The Mac.
Directory: MMSLib\XEDS\GMRFilmM
Keywords: XEDS Thin Film Analysis
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: FORTRAN 77
Hardware Required: Math CoProcessor Required
Author: Richard A. Waldo, modified by Paul Carpenter and Carl Henderson
Correspondence Address: GM Research Labs, 30500 Mound Rd.,
Warren, MI 48090-9055   
Phone: (313) 986-2871

Modifiers:
Carl Henderson
Electron Microbeam Analysis Laboratory
University of Michigan 
2005 C.C. Little Bldg.
Ann Arbor, MI  48109-1063  USA
 (313) 936-1550 (voice)
(313) 763-4690 (FAX)
chender@umich.edu (e-mail)

Paul K. Carpenter     
Electron Microprobe / X-ray Lab  
Department of Geology 170-25             
California Institute of Technology  
Pasadena CA  91125                    
Phone: 818-395-6126 (X-ray Lab)  
FAX: 818-568-0935 (FAX, Departmental)                
paulc@cco.caltech.edu or paulc@arms.gps.caltech.edu 

Abstract:
This is a simple Mac version of GMRFilm.
This program is a thin film XEDS data reduction package.  Contained in this distribution 
are the source codes for the main program GMRFILM and the ~60 subprograms which 
are called.  Details of the correction procedure are contained within the individual 
subroutines.  The file " GMRFILM.LIB" contains the library of subroutine object modules.  
The ASCII file STANDARD.DAT should be copied to the account or directory from 
which you run the program.  STANDARD.DAT contains any compound standards which  
are common to the types of specimens which the operator analyzes.  Edit this according to 
your own needs.  GMRFILM.EXE is the executale file. The program is self explanatory as 
it is executed.



Title: Graphics Interchange Format (GIF)
Directory: MMSLib\IMAG\GIFSTD
Keywords: Image Storage
Computer: All Computers
Operating System: All Computers
Programming Language: None
Hardware Requirements: None
Author(s): ComputerServe (Information Submitted by M. Disko)
Correspondence Address: 5000 Arlington Centre Blvd.
Columbus, Ohio 43220   
Phone: (614) 457-8600

Abstract:
A device independent file format for image file storage and  transmission is presented. This 
file format is copyrighted by  ComputerServe.Editors Note: It is proposed that this file 
format be adopted by the EMMPDL for image storage and transmission.  



Title: HKPLOT
Directory: MMSLib\XEDS\HKPLOT
Keywords: XEDS Spectrum Plotting and Printing
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.11 or higher
Programming Language: Turbo Basic (Source Included)
Hardware Requirements: CGA,EGA, VGA or Hercules graphics, Dot Matrix Printer
Author(s): Henrik Kaker
Correspondence Address: Zelezarna Ravne, Metallographic Lab, Koroska c.14, 62390 
Ravne, Slovenia, Yugoslavia

Abstract: 
 HKPlot is a collection of programs for printing XEDS spectra from an EDAX 9100 
system on the screen of a PC or compatible and to dot-matrix printers and HP plotters. The 
package is comprised of 2 self-extracting ZIP archives,  HKEXE1.EXE and 
HKEXE2.EXE. There is a README.DOC file accompanying these  archives. Routines 
are supplied that will convert the 9100 binary files to  ASCII files. A series of further 
routines allow the spectra to be plotted on  CGA, EGA, VGA or Hercules Graphics 
monitors or output to compatible dot matrix printers and to an HP ColorPro plotter. 
Identification of peaks is possible by KLM markers and routines for drawing 
superimposed plots are included. Author  would like to expand his conversion routines and 
wants people to send him  Tracor, Link and Kevex files so he can work on converting 
them.



Title: HP45 Calculator program (enhanced) V1mod6
Directory: MMSLib\MISC\HP
Keywords: HREM, Wavelength, Scherzer, Resolution, hex, oct, bin
Computer: anything with F77
Operating System: anything with F77
Programming Language: FORTRAN 77
Hardware Requirements: CPU, terminal
Authors: Tony Pitt, Owen Saxton, Graeme Wood, Mike O'Keefe, ...
Correspondence Address: M.A. O'Keefe, NCEM, LBL 72-213, Berkeley, CA 94720
 Email: MAOK@LBL.BITNET

Abstract: 
This is a program designed to emulate a scientific calculator operating in reverse polish 
mode (originally based on a HP45, but now with many enhancements, including binary, 
hex, and octal numbers, and electron microscope functions like wavelength and resolution).   
The HELP command provides one-line explanations of each command. Commands are -
 +        -        *        /        SQRT     REP      SIN      COS      TAN
 TYPE     DEL      PI       EXP      CLR      CUBE     SQU      REC      SWOP
 SWAP     CHS      POC      ROLL     LOG      ALOG     ASIN     ACOS     ATAN
 LN       OCT      HEX      X        DISP     INT      COMS     BIN      DEC
 INV      DEG      RAD      D>R      R>D      EXIT     WAVL     KV       SCH
 OPT      RSCH     ROPT     STO      RCL      HELP



Title: HTPSG
Directory: MMSLib\IMAG\HTPSG
Keywords: IMAGE PROCESSING, HALFTONE, POSTSCRIPT
Computer: VAX
Operating System: VMS
Programming Language: DEC FORTRAN 77 V4.8
Hardware Requirements: PostScript compatible printer
Author(s): Mark M. Disko
Correspondence Address: 140 Fairview Avenue
High Bridge, New Jersey  08829	

Abstract:
"HTPSG.DOC"  -   HalfTone PostScript Generic. This is the routine for you if you would 
like to display calculated images on a PostScript compatible printer.  Data is read in from 
an ASCII text file.  Several dispay options are supported including image box layout, 
halftone screen type and spacing, text labels, and a micron marker bar.  File ICOS128.SRC 
contains a 128 x 128 pixel image that can be used to demonstrate the output capabilities of  
HTPSG.



Title: ICOS128
Directory: MMSLib\IMAG\ICOS128
Keywords: IMAGE PROCESSING, HALFTONE, POSTSCRIPT, ICOSAHEDRAL
Computer: VAX
Operating System: VMS
Programming Language: DEC FORTRAN 77 V4.8
Hardware Requirements: PostScript compatible printer
Author(s): Mark M. Disko
Correspondence Address: 140 Fairview Avenue
High Bridge, New Jersey  08829

Abstract:
This is a data file for program HTPSG which consists of a 128 x 128 pixel image of the 
five-fold axis diffraction pattern in the Al-Mnicosahedral phase.  Image data is stored with 
32 two digit hex values per line.  See HTPSG.DOC and HTPSG.SRC for more on the data 
file format used by program HTPSG for HalfTone PostScript Generic display of images 
on PostScript equipped display devices.



Title: IMAGE PLUG-INS
Directory: MMSLib\IMAG\JRUSSPLU
Keywords: Imaging
Computer: None
Operating System: none
Programming Language: none
Hardware Requirements: none
Software Requirements:  Adobe Photoshop for Adobe plug-ins, Signal Analytics 	Prism 
for SAP plug-ins
Author: John Russ
Correspondence Address: Materials Science and Engineering Dept.
	North Carolina State University
	Raleigh, NC 27695-7907
Phone: (919) 515-3328
Email: john_russ@ncsu.edu

Abstract:
Here are two folders containing image processing drop-ins that may be distributed via the 
EMPPDL library. Each folder contains a brief description of the various image processing 
modules, the modules themselves, and the complete source code. One folder contains 
drop-ins for Adobe Photoshop and the other for Signal Analytics Prism. There is some 
overlap between the two sets of operations, for instance both include 3x3 and 5x5 median 
filters. The source code examples show in detail how to write drop-ins for each of these 
programs. As noted in the descriptions, these routines are all copyrighted by myself and 
my son, but may be distributed freely so long as the copyright notice accompanies them.



Title: IMAGEXRAY
Directory: MMSLib\Monte\Wilson\xray&image
Keywords: Monte Carlo, Image, X-ray
Computer: Macintosh
Operating System: MacOS
Programming Language: MPW C
Hardware Requirements: FPU
Author: Dr Alan R Wilson
DSTO - AMRL, SSMD
GPO Box 4331
Melbourne   3001
Victoria
Australia.
E'mail: wilsona@blackjack.cis.dsto.gov.au
Phone: 61 3 626 7508
Fax: 61 3 626 7087

Abstract: 
Monte Carlo Programs for calculating the x-ray intensity produced from bulk materials 
containing multiple vertical interfaces.

General.
The programs are used to calculate the x-rays generated from a progressive scan of points 
across multiple interfaces.  The x-rays generated in the specimen are stored in 2-D arrays.  
The cell size of these arrays is variable to ensure that a very thin interface has at least one 
cell devoted to it.
Suite of programs
1. xray - determines the x-ray intensity at the entrance to the detector.  Includes absorption 
in the specimen but no detector absorption etc.  The x-ray detector is assumed to be in a 
plane perpendicular to the interface.  Assumes all x-rays generated in fsexray head towards 
the detector.  (Uses the results from fsexray.)
2. imagexray - converts the fsexray results to an array of 16 bit unsigned integers sutiable 
for display in the PD program Image.  Each element at each point in the scan has its own 
array.  Note that each pixel in this array may not be equivalent to the same lateral distance 
in the specimen since the finite element arrays used to store the x-ray intensities may have 
variable element widths to allow for very thin interfaces.

Code.
Written for Apple Macintosh computers with FPU.
Some structures are used across all three routines and if changed in one must be changed in 
the others.
All code has been developed in MPW C.  I expect to migrate the code to native 
PowerMacintosh in the future.

Executables.
Executable code is included in this file.

Copyright.
The programs are copyright of the author however they are available for use in the public 
domain but not for sale in any form.  The programs are not guaranteed to be bug free and 
any feed back from there use would be greatly appreciated.  Normal acknowledgment of 
the use of these in any published work is expected.




Title: JOURNALARTICLES.
Directory: MMSLib\MISC\JOURNAL
Keywords: Computer programs 
Computer: None
Operating System: None
Programming Language: None
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:
This listing is a bibilography of Journal articles which document computer code or 
information which are applicable to electron microscopy.  The code documented or 
referenced in these articles is not available in the  EMMPDL but the information is being 
provided for those who may wish to access this resource for program development.   The 
current listing documents 16 references and was last updated March 1988



Title: Kaker Microanalysis Programs for the PC
Directory: MMSLib\XEDS\KAKER
Computer: IBM PC, XT, AT, PS2 or compatible
Keywords: XEDS Spectrum Plotting and Printing
Operating System: MS-DOS 2.11 or higher 
Programming Language: Turbo Basic (Source Included) or PowerBasic
Hardware Requirements: CGA,EGA, VGA or Hercules graphics, Dot Matrix Printer
Author(s): Henrik Kaker
Correspondence Address: Zelezarna Ravne, Metallographic Lab, Koroska c.14,
62390 Ravne, Slovenia.
Phone: 602-21-131 ext 5562
FAX: 602-21-013

Abstract: 
Public domain XEDS analysis programs.  See Kraker.doc for full info. Commercial use is 
prohibited without written permission. If you use this computer code in any paper an 
acknowledgment would be appreciated by the author.



Title: Kaker UCFImage Image Processing Software
Directory: MMSLib\IMAG\UCF Image
Computer: AT CLASS (286) IBM compatible PC, 520 Kbytes of RAM available 
Keywords: Image Processing
Operating System: MS-DOS 
Hardware Requirements: VGA display system (8-bit color or monochrome).  Hard Disk 
with at least 3 Megabytes file space available 
Author(s): Unknown

Abstract:
Simple image processing program.  Has following functions.

		cf-bmp   reads/writes BMP format images
		cf-gif                  "      GIF       "
		cf-pcx                "      PCX       "
		cf-tifr         reads  TIFF format images
		cf-tifw       writes        "
		fil-ada        adaptive filters
		fil-cir         circularly symmetric filters*
		fil-fft         Fast Fourier Transform
		fil-mor       morphological filters
		fil-non       nonlinear filters
		fil-spa        spatial filters
		algebra       algebraic operations
		geometry    geometric operations
		histogrm     histograms
		measure      measurements on images
		noise           noise generation
		palette         color operations
		warping      image distortion

It is recommended that images be stored in GIF format for maximum use of disk space 
(GIF compresses). If disk storage is not an issue, then storage in UCFImage format (raw) 
will allow fastest load/save operations.



Title: LATTPARM    A Personal Computer Program for finding
Lattice Parameters from Powder Data
Directory: MMSLib\XRAYDIFF\LATTPARM
Keywords: Powder Diffraction, Lattice Parameters
Computer: PC, XT, AT
Operating System: MS(PC)-DOS
Programming Language: TURBO Pascal
Hardware: Math Co-Processor desirable
Author: Roy Garvey
Correspondence Address: Department of Chemistry
North Dakota State University
Fargo, North Dakota
58105 - 5516     U S A      

Abstract:
Using the algorithm of Visser (1969), the problem of finding the lattice parameters from 
powder diffraction data becomes one of finding the six constants, A, B, C, D, E, and F 
where Q(hkl)  =  10**4 / d**2  =  hh A + kk B + ll C + kl D + hl D + hk F 
The unknown unit cell so derived will be triclinic. A perfectly general approach to the 
problem is to first find zones of the lattice (net-planes of the reciprocal lattice containing the 
origin). Any two such zones will have a line of intersection.  If the angle between two such 
zones is found, a reciprocal lattice is determined.  Sometimes this lattice can be reduced 
(described on symmetry axes in the reciprocal lattice).



Title:LEAST SQUARES UNIT CELL REFINEMENT with INDEXING on the 
PERSONAL COMPUTER:    LSUCRIPC
Directory: MMSLib\XRAYDIFF\LSUCRIPC
KeyWords: Powder Diffraction, Unit Cell Refinement
Computer: PC, XY, AT
Operating System: MS(PC)-DOS
Programming Language: TURBO Pascal
Hardware: 192K memory, 1 diskette drive, math  coproc.(recommended)
Author: Roy Garvey
Correspondence Address: Department of Chemistry                          
North Dakota State University
Fargo,  ND  58105-5516

Abstract:
L S U C R I P C 
A  computer  program implementing the procedure of Appleman and Evans (1973)  is 
now available for the IBM-PC.   Output of refinement data has been  condensed for 
economy of presentation.  For a discussion of methodology, see  the USGS-GD-73-003 
report number 20 by Appleman and Evans (1973).



Title: LOTMAS           
Directory: MMSLib\GRPH\LOTMAS
Keywords: Spectral data reduction, curve fitting
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.11 or higher
Programming Language: Lotus 123
Hardware Requirements: none
Author(s): Roy Geiss
Correspondence Address: IBM

Abstract: 
 This archive, a self-extracting ZIP file, is not a program but a  collection of Lotus-123 
documents which may be used for spectral data analysis and curve fitting.  Macintosh 
users please note that some of these files are  usable in Microsoft Excel 2.2



Title: MACFAC 1.1
Directory: MMSLib\MISC\MACFAC1.1FO
Keywords: multivariate statistics, data analysis, processing, filtering
Computer: Macintosh II family 
Operating system: system 7
Programming language: THINK C 5.0
Hardware requirements: math co-processor
Author(s): Noel BONNET & Pierre TREBBIA
Correspondence Address: Faculte des sciences, Universite de Reims, B.P. 347, F51062 
Reims cedex FRANCE.
Fax: (33) 26 05 32 50
e-mail: pierre.trebbia@univ-reims.fr

Abstract:
The purpose of MacFAC is to extract orthogonal sources of information from data 
(images, spectra,...). See any basic statistic book for more information about multivariate 
statistics and Factorial Analysis of Correspondence (FAC). MacFAC is given with a test 
data set in order to let you be sure that it works properly on your own computer. Read the 
text file READ.ME which is embedded in the file MacFAC.sea.hqx for more information 
on how the test must be done.



Title: MINFILE
Directory: MMSLib\XEDS\MINFILE
Keywords: Mineral Data Analysis
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.1 or higher
Programming Language: MS QuickBasic (Source Included)
Hardware Requirements: Epson compatible printer for output.
Author(s): Abdulkader M. Afifi* & Eric J. Essene
Correspondence Address: Department of Geological Sciences, 
University of Michigan, 1006 C.C. Little,   Ann Arbor, MI 48109
*Present address: P.O. Box 297, Jeddah, Saudi Arabia

Abstract: 
MINFILE is a menu-driven program for the storage and manipulation of chemical data on 
minerals.  The program package consists of 5 self-extracting ZIP archives, MFDAT.EXE, 
MFTXT.EXE, MINDOS.EXE, MIN.EXE and MINBAS.EXE.  The program contains 
subroutines for rapid normalization of chemical analyses of any compound into a formula 
on the basis of a specified number of cations or oxygens, for conversion of elements to 
oxides and of oxides to elements, for performing arithmetic operations, and for plotting.  
Several external subprograms are provided to optimize normalizations and distribution of 
elements among sites for specific mineral groups.



Title:   MINFORM
Directory: MMSLib\EMPA\MINFORM
Keywords: Microprobe Data Conversion and Reduction.
Computer: IBM PC or compatible and VAX Systems.
Operating System: MS-DOS 3.1 or higher and 4.3BSD Unix.
Programming Language: MS FORTRAN 4.1 or BSD F77
Hardware Requirements: None
Author(s): Julie M. Paque
Correspondence Address: Center for Materials Research, 105 McCullough, 
Stanford University, Stanford, CA 94305-4045,     
Phone: (415)723-6595

Abstract: 
 This collection of programs can be used alone,by producing data  files within each 
program, or in conjunction with other packages in the  library (e.g. MINFILE & 
TRANSFER).  The programs are stored as a self- extracting ZIP archive 
MINFORM1.EXE.  MINFORM converts wt% to atomic  stoichiometry and calculates 
mineral end member components for a variety of  minerals. NORM1 does CIPW 
normative calculations.  The output gives the  normative minerals in wt% (the CIPW 
standard) and in mole %.QWIKFIX takes wt% input (for the relevant oxides only), 
converts to mole proportions, and  calculates simple atomic ratios for various minerals.



Title: MISMAT
Directory: MMSLib\DIFF\MISMAT
Keywords: rotation matrices, grain boundaries
Computer: Apple Macintosh or PC
Operating System: MacOS (or MS-DOS)
Programming Language: FORTRAN 77
Hardware Requirements: Mac & Hard Disk (PC also)
Author(s): Doug Crawford (This current version)
Correspondence Address: Fuels and Engineering Division,
    Argonne National Laboratory West,
    PO Box 2528
    Idaho Falls, ID 83403-2528

Abstract:
 This program was originally written by P. Heilmann of Ohio State University Dpet of 
Met. Engineering and was modified and compiled on the Macintosh (under MacFortran) 
by Doug Crawford.  It is loosely based on a application written by C. T. Young of Virginia 
Polytechnic Institute and State University  Dept of Met. Engineering, the details of which 
were published in C.T. Young, J.H. Steele,Jr., and J.L. Lytton Met. Trans., 1973, Vol.4, 
2081-2089.  This program either takes input from the keyboard or from a file written by 
the program Orient (or ECPOrient).  Keyboard input includes the beam direction, a 
Kikuchi line (vector pointing away from the origin) and the rotation angle gamma from 
pattern to reference frame (in deg, counterclockwise = positive).  Input from a file includes 
the rotation matrix from crystal to reference frame and paired pattern numbers.  the 
program output consists of misorientation matrices for selected grain boundary pairs.



Title: MOAUTOCOND
Directory: MMSLib\CTEM\MOAUTOCO
Keywords: TEM Computer Control
Computer: IBM PC
Operating System: DOS
Programming Language: Pascal
Hardware Requirements: Philips CM Series Computer Interface
Author(s): M.T. Otten
Correspondence Address: Philips Analytical
International Business Centre
Electron Optics, Building AAE
5600 MD Eindhoven, The Netherlands

Abstract:
AUTOCOND is an on-line computer program which allows the user of a Philips CM 
series TEM/STEM to automatically condition the High Voltage of a CM20/CM30 
instrument using remote computer control.



Title: MOCBEDOFF
Directory: MMSLib\CBED\MOCBEDOF
Keywords: CBED, Thickness, TEM Computer Control
Computer: IBM PC
Operating System: DOS
Programming Language: Pascal
Hardware Requirements: None
Author(s): M.T. Otten
Correspondence Address: Philips Analytical
International Business Centre
Electron Optics, Building AAE
5600 MD Eindhoven, The Netherlands

Abstract:
CMCBEDOFF is an off-line computer program which allows the users to determine 
specimen thicknesses using convergent beam electron diffraction patterns. Users are 
prompted to input all relevant parameters needed to perform thickness calculations. Unlike 
CMCBEDON, this program requires no microscope interfaces and can be run on a 
standard PC, with users supplying data measured from micrographs.



Title: MOCBEDON
Directory: MMSLib\CBED\MOCBEDON
Keywords: CBED, Thickness, TEM Computer Control
Computer: IBM PC
Operating System: DOS
Programming Language: Pascal
Hardware Requirements: Philips CM Series Computer Interface
Author(s): M.T. Otten
Correspondence Address: Philips Analytical
International Business Centre
Electron Optics, Building AAE
5600 MD Eindhoven, The Netherlands

Abstract:b 
CMCBEDON is an on-line computer program which allows the user of a Philips CM 
series TEM/STEM to determine specimen thicknesses using convergent beam electron 
diffraction patterns. Unlike CMCBEDOFF, this program requires a Philips CM series 
computer/microscope interfaces. Using interactive programing data required for 
calculations is supplyed/measured directly from microscope.  No micrographs are 
therefore required.July 1989



Title: Monte Carlo Routines for Mac
Directory: MMSLib\Monte\Joy\JoyMac
Keywords: Monte Carlo Simulations of Electron Beam - Solid Interactions
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: Unknown
Hardware Requirements: Math Coprocessor desirable 
Author(s): D.C. Joy 
Correspondence Address: U of Tennessee, Knoxville, Tennessee. 
Phone: (615)-974-3638 
FAX: (615)-974-3642
Email: BITNET as JOY@UTKVX1

Abstract: 
Essentially Mac versions of David's PC Monte Carlo Programs.  Unstuff and see the 
"Read Me" Folder for details.



Title: Monte Carlo Routines for PC 
Directory: MMSLib\Monte\Joy\JoyPC
Keywords: Monte Carlo Simulations of Electron Beam - Solid Interactions
Computer: IBM PC/XT/AT or higher or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: Version 5.0  Turbo Pascal    
Hardware Requirements: Math Coprocessor desirable 
Author(s): D.C. Joy 
Correspondence Address: U of Tennessee, Knoxville, Tennessee. 
  (615)-974-3638 or on BITNET as JOY@UTKVX1 or on FAX at (615)-974-3642

Abstract: 
 The programs that accompany these notes are designed for use with  an IBM PC or most 
compatible clones. For some programs you will need a graphics adapter.  These programs  
will automatically determine which type of graphics card is in use and set themselves up 
appropriately. The program will sense whether or not a math chip is installed and use it if it 
is available. The programs included are SS_MC  -  a single  scattering simulation for thin 
or   bulk samples with trajectory plotting, PS_MC - a  plural scattering simulation for bulk  
samples with trajectory plotting. These  programs are the framework around which specific 
applications can be built and so are supplied in source code form as well.  Five examples of  
ways to use these programs are also provided: AEMMC - uses SS_MC to investigate 
Xray production in thin films, PHIROZ - uses PS_MC to determine and plot depth 
variation of X-ray production, SE_MC - computes variation of secondary electron yield 
with incident energy, PLOT2Z - computes and plots scattering for thin  film on a bulk 
substrate, EBIC_MC - current the  current gain for an  Au on Si Schottky diode.

    These programs are copyrighted  (C) by David C  Joy 1991.  They may be freely copied  
and distributed but only  for  non-commercial purposes. If you use them in a publication  I 
would appreciate an acknowledgement.



Title: MONTE-CARLO SIMULATION (Z's MC   v. 1.1) 
Directory: MMSLib\Monte\MCSim
Keywords: Electron-beam, Monte-Carlo simulation, energy loss, backscattered electrons, 
Rutherford cross section, Mott cross section.
Computer: Macintosh
Operating System: 6.0 or 7.0
Programming Language: Pascal (Think Pascal)
Hardware Requirements: standardAuthor(s) Zbigniew J. Radzimski.
Correspondence Address: Analytical Instrumentation Facility
North Carolina State University
Raleigh, NC 27695-7916
Telephone: (919) 515-234
Email Address: radzimsk@mat.mte.ncsu.edu

Abstract: 
The current program is the further development of the program written many years ago by 
R. Myklebust and D.C. Joy and modified later by J. C. Russ (J. of Computer Assisted 
Microscopy, 1990, 2(2), p. 59). It calculates various parameters related to electron-beam 
interactions with solids related to absorbed and backscattered electrons.  It accepts multi-
element and multi-component structures. It uses Rutherford or Mott cross section for 
scattering. Special thanks to Zbigniew Czyzewski and David Joy for providing Mott tables 
(see J. Appl. Phys., 1990, 68(7), p. 3066).
Documentation: Short manual attached
Source Code: available on the request



Title: NEDQNT 
Directory: MMSLib\XEDS\NEDQNT
Keywords: XEDS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract: 
NEDQNT is a quantitative data analysis program which converts  relative x-ray intensities 
(K and L lines only) into composition measurements using the standardless analysis 
approach. The user can modify the XEDS  detector parameters to specify Windowless, 
UTW or Be configurations of  arbitrary thickness as well as perform an iterative absorption 
correction for thicker samples if the specimen/detector geometry is known. The program 
also has the capability of calculating relative intensities when the user inputs composition 
values, allowing the analyst to explore theoretically the expected intensities of samples yet 
to be analyzed. All necessary subroutines and data tables are included in the source 
code/documentation.  NOTE: THE NEDQNT.SRC FILE CONTAINS ALL NEED 
DATA FILES INCLUDING TABLES OF X-RAY LINE AND ABSORPTION 
EDGES THE FILE IS > 7000 LINES LONG AS A RESULT


 
Title: NEDQNT for Mac. 
Directory: MMSLib\XEDS\NedqntM
Keywords: XEDS
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: FORTRAN 77, Language Systems for The Mac
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center,Bldg 212
                       Materials Science Division, Argonne, Illinois 60439,

Abstract: 
	This is a version of Nedqnt recompiled for the Mac by John Mansfield.
All questions on this version should be sent to:
John Mansfield
North Campus Electron Microbeam Analysis Laboratory
413 SRB, University of Michigan
2455 Hayward, Ann Arbor MI 48109-2143   
Phone: (313)936-3352   FAX (313)936-3352
Email: jfmjfm@engin.umich.edu, John.F.Mansfield@umich.edu
or jfmjfm@umich.edu they all reach me!
URL:  http://www.engin.umich.edu/~jfmjfm/jfmjfm.html

This is Nestor's abstract for this program.
NEDQNT is a quantitative data analysis program which converts relative x-ray intensities 
(K and L lines only) into composition measurements using the standardless analysis 
approach. The user can modify the XEDS detector parameters to specify Windowless, 
UTW or Be configurations of arbitrary thickness as well as perform an iterative absorption 
correction for
thicker samples if the specimen/detector geometry is known. The program also has the 
capability of calculating relative intensities when the user inputs composition values, 
allowing the analyst to explore theoretically the expected intensities of samples yet to be 
analyzed. All necessary subroutines and data tables are included in the source 
code/documentation. 
NOTE: THE NEDQNT.SRC FILE CONTAINS ALL NEED DATA FILES 
INCLUDING TABLES OF X-RAY LINE AND ABSORPTION EDGES THE FILE 
IS > 7000 LINES LONG AS A RESULT



Title: NELSV21
Directory: MMSLib\EELS\NELSV21
Keywords: EELS
Computer: DEC VAX-11/730 - 11/785 or higher series
Operating System: VMS
Programming Language: FORTRAN IV
Hardware Requirements: Tektronics 4010 Series Graphic Terminal or Emulator
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:          
NELS is a generic data analysis computer program for reduction of EELS spectra. The 
program performs the functions of spectral calibration, KLM edge identification, 
background fitting & subtraction, edge integration, digital filtering, and general spectral 
manipulation. The input spectra are assumed to be in the EMMPDL spectral file format 
(see RWEMMPDL.ABS). The program can handle simultaneously three spectra of up to 
4096 channels in length.  A shorter and less elaborate version is available for smaller DEC 
computers running RT-11.  The program NELS requires a computer terminal which 
responds to the graphics protocol of Tektronics 4010/4014 series terminal (see 
NGRAPH.ABS) and an atomic inner shell energy level data file (see ATMLVL.ABS).



Title: NGRAPH (Subroutine Library) - 
Directory: MMSLib\GRPH\NGRAPH
Keywords: GRAPHICS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: TEKTRONICS 4010 terminal or an EQUIVALENT 
emulator
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract: 
This subroutine  library  provides  graphics  functions  for  Tektronics  4010-1terminals   
and/or  their  emulators.   The  current  terminals  supported  are: Tektronics 4010-1,4014-
1, Lear Siegler ADM-3,ADM-5 (with  Retrographics  RG- 512), Peritek VCG-512 bit 
map color graphics, Tektronics 4027, HP 7470A/7475A  plotters, DEC LA100/LA50 
printers, Intecolor VT-100 with TEK  4010-1,4014-1,  4027   modes, DEC  VT-200  with  
4010-1,4014-1  mode,  Tektronics  4105/4107 with VT-100  mode, Plessey VT-100/TEK 
4010-1, Espirit VT-100/TEK 4010-1,  Tektronics  4695   Copier.  The computer  program 
NGTEST is a FORTRAN demonstration program which  exercises this graphics package.  
The purpose of this graphics library  is  to  provide  a standard  set  of  routine for 
producing x-y plots of XEDS and EELS data for the analysis programs NEDS, NELS 
and graphics for plotting CBED patterns.



Title: NGTEST (Demonstration Program) 
Directory: MMSLib\GRPH\NGTEST
Keywords: GRAPHICS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: TEKTRONICS 4010 terminal or an EQUIVALENT 
emulator
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:
 The computer program NGTEST is a FORTRAN demonstration program   which  
exercises the  NGRAPH library package.  It demonstrates the symbol  plotting, x-y 
plotting, vector plotting, hardcopy output and cursor control  subroutines available in the 
package.  It requires that a file TERMIN.DAT exist on the  default storage device named 
DAT:.  A copy of the file TERMIN.dat can be found in the documentation  of the 
NGRAPH routines. 



Title: NTLAMDA
Directory: MMSLib\EELS\NTLAMDA
Keywords: EELS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec (312-972-5075,4964)
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:
NTLAMDA  is a simple FORTRAN program which allows the user to calculate the 
approximate thickness of a specimen based upon the measured EELS spectral intensity 
ratio Io/It, which can be shown to be equal to the ratio of the local thickness (t) to the mean 
free path for inelastic scattering (lambda).
The formulae are based upon the work of Egerton and Cheng (Ultramicroscopy,  21,1987 
pge 231-244), but has been generalized to simplify data input and entry. The user must 
know the nominal elemental constitutents of the specimen, and is prompted for all 
necessary input parameters required for the calculation.



Title: NTRAN VERSION 1.1
Directory: MMSLib\XEDS\NTRANS & MMSLib\MISC\NTRANS
Keywords: XEDS, EELS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:
NTRANS is a computer program which translates manufacturers XEDS and EELS  
spectral data into the EMMPDL data format. It utilies the RWEMMPDL  subroutines 
contained in the EMMPDL. At present this version translates both EDAX and TRACOR-
Northern and Link Systems data files. Examples of translated spectra  can be found spectra  
can be found in the XEDS and EELS subdirectories of  the EMMPDL.



Title: ONEDIS
Directory: MMSLib\CTEM\ONEDIS
Keywords: CTEM, DISOLOCATIONS
Computer: IBM PC or Compatible
Operating System: MS-DOS
Programming Language: Pascal
Hardware Requirements: None
Author(s): Gerry Webber 
Correspondence Address: Currently unknown, contact John Mansfield at
(313)-936-3352 or John.F.Mansfield@umich.edu 
for questions

Abstract:
 ONEDIS is a modified version of the original ONEDIS program  developed by the group 
of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and C.T. Forwood at CSIRO 
Division of Tribophysics, University of Melbourne,  Australia. The program calculates 
disolcation images for the TEM. This version  displays the resulting dislocation image on 
the screen (CGA, EGA or VGA). A C code version is included, but the completeness of 
the code is unknown.



Title: ONEDISANL
Directory: MMSLib\CTEM\ONEDISAO
Keywords: CTEM, DISOLOCATIONS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): R. J. Holton 
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:
ONEDISANL is a modified version of the original ONEDIS program developed by the 
group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and C.T. Forwood at 
CSIRO Division of Tribophysics, University of Melbourne,  Autralia for calculating 
disolcation images for the TEM. This version modifies only their output algorithms for 
output to a serial data file rather than over printing upon a line printer. Using the included 
program (IMOUT)  this can then be displayed as a randomized dither pattern on a DEC 
LA100 or  LA50 printer



Title: Overlap
Directory: MMSLib\XEDS\OVERLAP
Keywords: X-ray lines, Overlaps
Computer: BM PC or Compatible
Operating System: MS-DOS
Programming Language: 
Hardware Requirements: None
Author(s): Chuck Herrington 
Correspondence Address: JEOL USA, Inc. 11 Dearborn Rd. Peabody, MA 01960

Abstract:
The data and programs on this disk have been the result of work by Chuck Herrington of 
JEOL USA, Inc. The following is a list of files contained in this package. LVALUE is a 
Lotus 123 spreadsheet which calculates the crystal spectrometer X-ray positions given the 
crystal names and their 2d spacings in angstroms. LVALUE.PRN is the ASCII print out 
of 123. MDL is another 123 spreadsheet which calculates the Minimum Detection Limits 
of X-ray lines given the peak and background intensities in counts per second per nA, the 
beam current and the counting time.WAVELENG.DAT is an ASCII data file which 
contains the wavelengths in angstroms of the major X-ray lines for all the elements. This 
was necessary to do as the only data bases available were in keV and they do not have 
enough decimal places to do a good job calculating crystal spectrometer 
positions.OVERLAP has its own instructions in OVERLAP.DOC. It will determine any 
X-ray line overlaps within a set of elements. 



Title: PCEDS Cliff-Lorimer EDS Analysis
Directory: MMSLib\XEDS\PCEDS
Keywords: AEM, EDS, X-RAY, CLIFF-LORIMER, THIN FILM, XEDS
Computer: IBM PC/XT/AT, generic MS-DOS machine
Operating System: MS-DOS
Programming Language: Microsoft FORTRAN v3.31
Hardware Needed: IBM PC/XT/AT or generic MS-DOS machine,
	8087 is optional, 256kB min.
Authors: A.D. Romig, H.O. Colijn
Correspondence Address: Ohio State University, Central Electron
	Optics Facility, 042 Fontana Labs, 116
	W. 19th Ave. Columbus, OH  43210-1110
Phone: (614)292-0674

Abstract:
This program will calculate composition of thin foils using the Cliff-Lorimer analysis of x-
ray intensities.  The integrated intensities of the peaks are entered manually and the atomic 
and weight concentrations are calculated using either empirical or theoretical K-factors.  
This program will not do spectral processing (i.e. background subtraction or peak 
deconvolution). Al Romig of Sandia Labs wrote the original version of this program using 
DEC  PDP-11 FORTRAN.  His work is documented in Sandia Labs report number 
SAND82-2938.  Henk Colijn of OSU translated the program to run on an IBM PC using 
Microsoft FORTRAN v3.31 and v4.0.  Anyone needing the compiled version should 
contact Henk Colijn at the above address.  The accompanying PCEDS.DOC  file has been 
formatted to be copied to a generic printer.  If you type the file to  your CRT screen,  you 
will not be able to read all the lines.



Title: PINT
Directorty: MMSLib\EELS\PINT
Keywords: EELS - planar interface calculations
Computer: VAX 780
Operating System: VAX/VMS version 4.7
Programming Language: FORTRAN 77
Hardware Requirements: Tektronics 4010 series graphic terminal or emulator
	desirable but not essential.
Author(s): C.A. Walsh - based on a BASIC program written by A. Howie.
Correspondence Address: Microstructural Physics Group, Cavendish Laboratory, 
	Madingley Road, Cambridge, CB3 0HE, England

Abstract:
The program uses the result obtained by Garcia-Molina, Gras-Marti, Howie and Ritchie (J. 
Phys. C18 (1985) pp5335) to calculate the energy loss of electrons travelling parallel to a 
planar interface. They obtained an expression for the  differential probability dP/(dzdhf), for 
an electron travelling in the z  direction and losing energy hf. The probability of losing 
energy between  hf-dhf/2 and hf+dhf/2 after travelling a distance dz parallel to the interface  
is given by dP/(dzdhf) x dzdhf. The program also uses this result to calculate  the energy 
loss of electrons incident at an angle to an interface (see Howie,  Milne and Walls, (1985) 
Inst.Phys. Conf. Ser. No. 78: Chapter 4, EMAG'85). The  program requires dielectric data 
for the media on either side of the interface.  A limited amount of data is stored inside the 
program for some materials. Other  data can be supplied to the program by data files.



Title: PKZIP/PKUNZIP/PKSFX
Directory: MMSLib\MISC\PKZ101
Keywords: Compression, Archiving
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: Unknown
Hardware Requirements: none
Author(s):
Correspondence Address:

Abstract: 
This package consists of a single self-extracting ZIP file, PKZ101.EXE.  It contains 
programs for the creation and extraction of ZIP files ZIP files are compressed files that 
may be used to archive files in order to save space.  The package contains twelve files: 
PKZIP.EXE the main compression program, PKUNZIP.EXE  the main extraction 
program, MAKESFX.COM  which starts the process of creating self-extracting files, 
ZIP2EXE.EXE  used in creating 
self-extracting files, README.DOC  general information, DEDICATE.DOC dedication 
of file format and extension to the public domain, ORDER.DOC registration information 
and order form, LICENSE.DOC, information on site and distribution licenses,  
OMBDSMAN.ASP  association of shareware professionals info, MANUAL.DOC  
reference manual for PKWARE file compression programs, APPNOTE.TXT  technical 
background material and PKZIPFIX.EXE  Reconstructs corrupted ZIP files.



Title: PRSUPR v. 6.84
Directory: MMSLib\EMPA\PRSUPR684
Keywords: X-RAY, WDS, Microprobe, XEDS
Computer: IBM PC/XT/AT, generic MS-DOS machine
Operating System: MS-DOS
Programming Language: Microsoft FORTRAN v3.31
Hardware Needed: IBM PC/XT/AT or generic MS-DOS machine,
8087 is optional, 256kB min.
Authors: A.D. Romig, H.O. Colijn
Correspondence Address: John Donovan, rm 301, ESB, Dept. of Geology and 
Geophysics
Univ. of Calif., Berkeley, CA 94720
Phone: (614)292-0674
EMail: jdonovan@garnet.berkeley.edu

Abstract:
X-ray analysis program for PC.  Full source and example spectral files.



Title: PTEELS
Directory: MMSLib\EELS\PTEELS
Keywords: EELS,AEM,CTEM,STEM,BACKGROUND,STATISTICS
Computer: DEC LSI-11/73
Operating System: RSX-11M-PLUS
Programming Language: DEC-FORTRAN IV
Hardware Requirements: None
Author(s): Dr. Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides
Bat. 510, F91405 ORSAY CEDEX FRANCE

Abstract: 
We present an unbiased method for the estimation of the background in EELS spectra. It 
looks for the maximum likelihood of a power law model whose two dependent parameters 
A and R are estimated together with their variances and covariance. Applying the usual 
rules of error propagation, core-loss characteristic signals and their variances are estimated. 
Results can be used as input data for the programs QUANTI and LIMIT which are also 
provided by  the EMMPDL facility. A complete description of the algorithm is given in 
"Unbiased Method for Signal Estimation in Electron Energy Loss Spectroscopy...", P. 
TREBBIA, Ultramicroscopy (1988).



Title: PTETHA
Directory: MMSLib\EELS\PTETHA
Keywords: EELS,STEM,COLLECTION EFFICIENCY,CONVERGENT BEAM
Computer: DEC LSI-11/73
Operating System: RSX-11M-PLUS
Programming Language: DEC-FORTRAN IV
Hardware Requirements: None
Author(s): Dr. Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides
Bat. 510, F91405 ORSAY CEDEX FRANCE

Abstract: 
When EELS spectra are recorded with a convergent beam (STEM case),  one has to 
compute an effective collection angle BETA* which should be used in computing the 
interaction cross sections, instead of the actual collection angle BETA. This is the job of 
program ETHA. A complete description of the algorithm is given in "Unbiased  Method 
for Signal Estimation in Electron Energy Loss Spectroscopy...",  P. TREBBIA, 
Ultramicroscopy (1988).



Title: PTLIMIT
Directory: MMSLib\EELS\PTLIMIT
Keywords: EELS,EDX,AEM,CTEM,STEM,DETECTION 
LIMITS,STATISTICS
Computer: DEC LSI-11/73
Operating System: RSX-11M-PLUS
Programming Language: DEC-FORTRAN IV
Hardware Requirements: None
Author(s): Dr. Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides
Bat. 510, F91405 ORSAY CEDEX FRANCE

Abstract: 
When one tries to detect an element with a very small SIGNAL/NOISE ratio, one has to 
face with two main risks:  FIRST KIND RISK: state the element is present when actually 
it is absent. SECOND KIND RISK: state the element is absent when actually it is present. 
This program gives for two first kind risks (0.05 and 0.01) and four second  kind risks 
(0.25, 0.10, 0.05 and 0.01) the resulting 8 possible values of  minimum SIGNAL and 
SIGNAL/NOISE ratio. A complete description of the algorithm is given in "Unbiased  
Method for Signal Estimation in Electron Energy Loss Spectroscopy...",  P. TREBBIA, 
Ultramicroscopy (1988).



Title: PTQUANTI
Directory: MMSLib\EELS\PTQUANTI
Keywords: EELS,EDX,AEM,CTEM,STEM,CONCENTRATIONS,STATISTICS
Computer: DEC LSI-11/73
Operating System: RSX-11M-PLUS
Programming Language: DEC-FORTRAN IV
Hardware Requirements: None
Author(s): Dr. Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides
Bat. 510, F91405 ORSAY CEDEX FRANCE

Abstract: 
The purpose of this program is quite general. It can be used not only  for the determination 
of atomic concentrations in EELS experiments, but also, for example, for the 
determination of weight concentrations in EDX  spectroscopy. For given SIGNAL, 
BACKGROUND, H = 1 +  VARIANCE(BACK)/BACKGROUND and F = Interaction-
detection yield (in arbitrary units) values, it returns concentrations values, concentration 
covariances and confidence intervals at three different confidence levels0.1, 0.05 and 
0.01.A complete description of the algorithm is given in "Unbiased  Method for Signal 
Estimation in Electron Energy Loss Spectroscopy...",  P. TREBBIA, Ultramicroscopy 
(1988).



Title: PTSELECT
Directory: MMSLib\EELS\PTSELECT
Keywords: STATISTICS,MEAN VALUE,SELECTION TEST
Computer: DEC LSI-11/73
Operating System: RSX-11M-PLUS
Programming Language: DEC-FORTRAN IV
Hardware Requirements: None
Author(s): Dr. Pierre TREBBIA
Correspondence Address: Laboratoire de Physique des Solides
Bat. 510, F91405 ORSAY CEDEX FRANCE

Abstract: 
Let us suppose that we obtained N estimations Vi (i=1,N) of a same  unknown X. If we 
know the variance and covariance matrix of the Vi, one can  compute the mean value 
(estimation of X) and the confidence limits of this  mean. One can then check whether the 
Vi are valid measurements or whether  one  of them (at least) must be removed from the 
measurement set. This program SELECT is of general purpose and can be used as a 
valuable  substitute to the general method of the "bad-looking" rejection criterion. A 
complete description of the algorithm is given in "Unbiased  Method for Signal Estimation 
in Electron Energy Loss Spectroscopy...",  P. TREBBIA, Ultramicroscopy (1988).



Title: RECOIL
Directory: MMSLib\HVEM\RECOIL
Keywords: Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM
Computer: DEC VAX 11/785
Operating System: VAX/VMS
Programming Language: VAX FORTRAN
Hardware Requirements: None
Author(s): Charles R. Bradley
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 

Abstract:
This program calculates differential Mott cross-sections of elemental nuclei in collisions 
with relativistic electrons. The cross-sections are output as functions of the nuclear recoil 
angle and are proportional to the probability that a nucleus will recoil in a given direction.  
These cross-sections are useful in the study of displacement damage, electron transmission 
sputtering, electron beam mixing, and recoil implantation.  For medium and high voltage 
transmission electron microscopes now available, having clean vacuum systems and high 
brightness sources, modification of sample composition due to sputtering and/or 
displacement by the probe will become an important consideration during microanalysis or 
imaging.



Title: RWEMMDPL VERSION 1.1
Directory: MMSLib\MISC\RWEMMPDL
Keywords: XEDS, EELS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract:	
RWEMMPDL contains two subroutines which read and write spectral 
data files (XEDS or EELS) in the EMMPDL Version 1.1 data format. The data are stored 
as simple ASCII characters at a user defined number of columns per line for the  length of 
the data file. The spectral data is preceeded by a series of header  lines, which tell the user 
about the parameters of the spectrum. The header  lines are identified by the first character 
in the line being the symbol (#)  followed by a four letter descriptor  and if appropriate its 
units. An example of a data file format can be found in the RWEMMPDL.DOC file. Other  
examples spectra  can be found in the XEDS and EELS subdirectories of the EMMPDL.



Title: Spplot
Directory: MMSLib\XEDS\SPPLOT
Keywords: Spectrum Printing and Plotting
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.11 or higher
Programming Language: Turbo Basic (Source Included)
Hardware Requirements: CGA,EGA, VGA or Hercules graphics, HP Plotter
Author(s): Henrik Kaker
Correspondence Address: Zelezarna Ravne, Metallographic Lab., Koroska c.14,
62390 Ravne, Slovenia, Yugoslavia

Abstract: 
Spplot (Spectrum Plotting and Printing Programs) is a collection of programs for printing 
XEDS spectra from an EDAX 9100 system on the screen of  a PC or compatible  and to 
dot-matrix printers and HP plotters.  Routines are supplied that will convert the 9100 
binary files to ASCII files.   A series of further routines allow the spectra to be plotted on 
CGA, EGA, VGA or Hercules Graphics monitors or output to compatible dot matrix 
printers and to an HP  colorPro plotter.  Identification of peaks is possible by KLM 
markers and  routines for drawing superimposed plots are included.  Author would like to  
expand his conversion routines and wants people to send him Tracor, Link and Kevex files 
so he can work on converting them.



Title: STACKEY2
Directory: MMSLib\GRPH\STACKEY2
Keywords:
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language:
Hardware Requirements: CGA or EGA graphics & HP Plotter
Author(s): Richard M. Wilson & Barry Simon
Correspondence Address: 253-37 Caltech, Pasadena, CA 91125

Abstract:
 This program is contained in a single ZIP self-extracting archive  STACKEY2.EXE.  
STACKEY is a utility from the makers of CTRLALT.  It will  automatically place 
keystrokes in your keyboard buffer.  It is intended for use in connection with BATch files. 
The archive contains the program and full instructions and examples.



Title: Stereographic Projection Program Version 4.00
Directory: MMSLib\DIFF\STEREOPROJ\STEREOIBM
Keywords: Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ
Computer: IBM PC/XT/AT or compatible
Operating System: PC-DOS
Programming Language: BASICA or QUICKBASIC (QUICKBASIC preferred)
Hardware Requirements: Hewlett Packard HP7470A Plotter required.
Author(s): John R. Porter
Correspondence Address: Rockwell International Science Center,
Thousand Oaks, CA 91360.

Abstract:
The program, written in IBM BASICA, plots stereographic projections, CBED and HOLZ 
line simulations, and performs axis/angle pair calculations.  Output is to the screen or a 
Hewlett Packard HP 7470A Plotter.  Stereographic projections are drawn to scale for 
subsequent manipulations with a standard 18cm. Wulff  net can be plotted for cubic, 
hexagonal, tetragonal and monoclinic crystal systems in any orientation.  Plotted poles can 
be restricted to those allowed by structure factor considerations (for certain structures) or 
restricted to those in certain Laue zones.  The program leads the user through menus to 
determine the structure and orientation for the projection, which is then plotted accordingly.  
Version 4.00 is significantly enhanced compared to earlier versions.  Screen output is 
improved, more crystal structures are supported the user interface is more forgiving and 
the program is faster. Also, the HOLZ line routine has been modified and should be more 
accurate.



Title: Stereographic Projection for Macintosh
Directory: MMSLib\DIFF\STEREOPROJ\STEREOMAC
Keywords: Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ
Computer: Macintosh Plus or II
Language: QuickBASIC for Macintosh
Hardware: Hewlett Packard HP7470A Plotter or Laserwriter
Author: John R. Porter
Address: Rockwell International Science Center, Thousand Oaks CA 91360

Abstract:
Stereographic Projection for Macintosh is the Macintosh version of the STERPROJ 
program previously available for the PC.  The program plots stereographic projections, 
CBED simulations, HOLZ line patterns and performs axis/angle pair calculations.  The 
program supports cubic, hexagonal, tetragonal and monoclinic crystal systems.  Separate 
executable versions are included for Mac Plus and Mac II (SPMAC+.EXE and 
SPMACII.EXE).  The .DOC file is in Macwrite format.  Sample data files are also  
included  (extension .MACXTL).



Title: TCBED
Directory: MMSLib\CBED\TCBED
Keywords: CBED
Computer: VAX, Macintosh, Machine independent
Operating System: Any
Programming Language: FORTRAN 77
Hardware Requirements: Line printer
Author(s): J.M. Zuo and J.C.H. Spence
Correspondence Address: Physics Dept, Arizona State Univ., Tempe, AZ 85287, 
USA

Abstract:
A Transmission Convergent Beam Electron Diffraction program which simulates the two-
dimensional distribution of intensity in CBED disks. The program includes three-
dimensional (HOLZ) diffraction for non-centrosymmetric crystals with absorption and 
inclined boundaries. It uses Bloch wave (matrix diagonalization for general complex 
matrix) method. A complete description, source code and test data are given in J. Elec. 
Micros. Tech., May, 1989 (Zuo et al). An application to GaAs can be found in Phys. Rev. 
Lett., Vol 61, P353 (1988). The program produces a numerical output file and a two-digits 
intensity map on line printer.



Title: Tiff Maker
Directory: MMSLib\IMG\TIFFMKR
Keywords: 
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: Think Pascal
Hardware Requirements: Mac & Hard Disk
Author(s): Hal W.Estry
Correspondence Address: North Campus Electron Microbeam Analysis Laboratory
    University of Michigan
    2455 Hayward
    Ann Arbor, MI, 48109-2143

Abstract:
 This small utility converts Tracor/Noran and Kevex image files from their native  formats 
to TIFF file formats that may be read by programs like Adobe Photoshop and NIH  
Image.  The output files may be saved as greyscale files with palettes/look-up tables or as  
RGB files (24bit).  Please note that Image is unable to read 24-bit TIFF files, but 
Photoshop can.  The program is  provided as is with no warranty.  



Title: TFA (v1.3) (7/89)
Directory: MMSLib\XEDS\TFA
Keywords: XEDS, Thin Film Analysis
Computer: Apple Macintosh
Operating System: MacOS
Programming Language: No source
Hardware Requirements: Math chip.
Author(s): Martin J. Carr or Alton D. Romig, Jr.
Correspondence Address: Martin J. Carr or Alton D. Romig, Jr.
                                         Sandia National Laboratories
                                          Division 1822
                                          Albuquerque, New Mexico 87185

Abstract: 
Performs Cliff-Lorimer quantitative thin film x-ray compositional analysis according to an 
algorithm developed by A.D.Romig,Jr. and described in general in report #SAND82-2938 
by Sandia National Laboratories.  Earlier versions of this program, written in FORTRAN 
for the VAX & IBM PC were named 'STEM'.



Title: TOTCS
Directory: MMSLib\HVEM\TOTCS
Keywords: Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM
Computer: DEC VAX 11/785
Operating System: VAX/VMS
Programming Language: VAX FORTRAN V4.0
Hardware Requirements: None
Author(s): Charles R. Bradley
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 

Abstract:
This program calculates displacement cross-sections that are useful in estimating the 
amount of sputtering and displacement damage due to collisions of relativistic electrons 
with nuclei in elemental samples. The total displacement cross-section is obtained by 
evaluating the differential Mott cross-section and numerically integrating over the range of 
allowed angles.  An upper limit for cascade cross-sections is evaluated in version 2.0.  For 
the medium and high voltage electron microscopes now available, having clean vacuum 
systems and high brightness sources, modification of sample composition due to 
sputtering and/or displacement by the probe will become an important consideration during 
microanalysis or imaging. This program  allows the analyst to estimate the potential 
adverse effects on the specimen prior to study in the TEM.



Title: TRANSFER
Directory: MMSLib\XEDS\TRANSFER
Keywords: Microprobe Data Conversion and Reduction.
Computer: IBM PC or compatible and VAX Systems.
Operating System: MS-DOS 3.1 or higher and 4.3BSD Unix.
Programming Language: MS FORTRAN 4.1 or BSD F77
Hardware Requirements: None
Author(s): Julie M. Paque
Correspondence Address: Center for Materials Research, 105 McCullough, 
Stanford University, Stanford, CA 94305-4045
Phone: (415)723-6595

Abstract:
 The following programs were originally written to streamline the  data manipulation 
procedures for geologists at Stanford University. The  programs (Wdxtrans, Restrans, and 
Sstrans) are designed to work with data  files produced by the Kevex Sesame microprobe 
automation package. These  programs act as filters,  taking as input the Kevex data file and 
producing  as output an ASCII file that will be accepted by other program packages such  
as GENPLOT,,MINFILE, MINFORM, and NORM1 etc (see separate abstracts).  The  
TRANSFER programs are contained within a single self-extracting ZIP file  called 
TRANSFER.EXE.



Title: TRANSPORT
Directory: MMSLib\ EELS\TRANSPOR
Keywords: Optics, Quadropoles, Sextapoles, Bending Magnets, EELS
Computer: DEC VAX 11/730-785
Operating System: VAXVMS, 
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): K.L.Brown, F.Rothacker D.C., Carey, Ch. Iselin
Correspondence Address: Stanford linear Accelerator Center, Stanford CA. USA or Fermi 
National Accelerator Lab. Batavia, IL. USA
CERN, Geneva, Switzerland

Abstract:         
Transport is a computer code which calculates charged particle trajectories using first and 
second-order matrix multiplication methods for the design of static electromagnetic beam-
line systems.   It has been in existence in  various versions since 1963.  It is capable of 
computing a wide range of  operating characteristics of electromagnetic systems including 
Quadrupoles, Sextupoles, Solenoids, Bending Magnets etc.  and such can be used to 
calculate the optics of many EELS systems.  Specific instructions on the use of 
TRANSPORT are extensive and should be obtained from: The  Reports Office, Fermi 
National Accelerator Laboratory, P.O. Box 500, Batavia IL60510, USA (Ref. NAL-91, 
"Transport Appendix")



Title: TWODISANL
Directory: MMSLib\CTEM\TWODISAN
Keywords: CTEM, DISOLOCATIONS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): R. J. Holton 
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212
Materials Science Division, Argonne, Illinois 60439,

Abstract:
TWODISANL is a modified version of the original TWODIS program developed by the 
group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and C.T. Forwood at 
CSIRO Division of Tribophysics, University of Melbourne, Autralia for calculating 
disolcation images for the TEM. This version modifies only their output algorithms for 
output to a serial data file rather than overprinting upon a line printer. Using the included 
program (IMOUT)  this can then be displayed as a randomized dither pattern on a DEC 
LA100 or  LA50 printer



Title: UTILITY
Directory: MMSLib\MISC\DOSUTIL
Keywords: File and Directory and Disk Utilities
Computer: IBM PC, XT, AT, PS2 or compatible
Operating System: MS-DOS 2.0 or higher
Programming Language: Unknown
Hardware Requirements: none
Author(s):
Correspondence Address:

Abstract:
This package consists of a single self-extracting ZIP file,  UTIL.EXE.  It contains utility 
programs for the manipulation of files ,  directories and disks.  The programs are either 
public domain or shareware.   Individual document files are contained within the archive 
for each program.



Title: WKDATA
Directory: MMSLib\EMPA\WKDATA
Keywords: Cameca, spreadsheet, import
Computer: PDP-11
Operating System: RSX 11M (or 11M+)
Programming language: FORTRAN 77
Hardware needed: PDP-11 w/ RSX OS
Authors: Michael Shaffer
Correspondence Address: Geological Sciences, University of Oregon,
Eugene, OR 97403. 
Phone: (503) 346-4632

Abstract:
 WKDATA, like Cameca's RESUME, is a DEC PDP-11 utility program for converting 
label.COR and label.KEX files to a quotation and comma delineated label.WKD file for 
easy import into your spreadsheet.  The primary improvement is that WKDATA lists 
quotation delineated labels, e.g., elements analyzed, across the top, and lists the comma 
delineated data, e.g., weight %, down from the labels (see WKDATA.DOC).  Other 
improvements are the inclusion of x and y coordinates and the first 40 characters of the 
analysis comment.  Secondary improvements include the user's ability to indicate previous 
versions of the label.COR and label.KEX file sets, and the ability to work with all your 
files without leaving WKDATA.  Source code is included.  Also included is  
IMAGDAT8.FTN which can be used as an example for reading OFPP "stored" image 
files.



Title: XEDSDETECT
Directroy: MMSLib\XEDS\XEDSDETE
Keywords : XEDS
Computer: DEC VAX-11/730 - 11/785 or higher series
Operating System: VMS
Programming Language: FORTRAN IV
Hardware Requirements: NONE
Author(s): Nestor J. Zaluzec
Correspondence Address : Electron Microscopy Center, Materials Science,
Argonne Nat. Lab, Argonne, IL. 60439 USA
Email: Zaluzec @ ANLEMC (BITNET)

Abstract: 
XEDSDETECTis a general program which computes the relative detector efficiency of 
Si(Li) and HP Ge EDS detector systems. The user inputs as parameters the thickness of 
the respective detector absorbing layers (Parylene, Al, Be, Au, Dead Layer and Active 
Layer) as well as the energy range and increment for the calculation. Output is in simple 
tabular form listing energy and relative efficiency for the chosen parameters.



Title: XENRGY
Directory: MMSLib\XEDS\XENRGY
Keywords: XEDS
Computer: DEC VAX 11/730-785, DEC PDP 11/2-11/73
Operating System: VAXVMS, RT-11
Programming Language: FORTRAN IV
Hardware Requirements: None
Author(s): Nestor J. Zaluzec
Correspondence Address: Argonne Nat. Lab, Electron Microscopy Center, Bldg 212 
Materials Science Division, Argonne Il. 60439 USA
Phone: (312)-972-5075 
Email: Zaluzec at ANLMST on BITNET

Abstract: 
XENRGY.DAT is a data file containing all X-ray Line and Relative
Intensity ratios for elements in the range of H (Z=1) to ES (Z=99). The table 
is stored as simple ASCII characters to allow simple access and file transfer.  
Each element contains 28 entries which correspond to the following lines
KA1, KA2, KB1, KB2, KB3, LA1, LA2, LB1, LB2, LB3, LB4, LB5, LB6, LB7, LB8,  
LB9,LG1, LG2, LG3, LG4, LG5, LG6, LN, LL, MA1, MA2, MB, MG, If an element  
doesnot have a particuliar X-ray line its energy is listed as zero. The program  BXENRGY,  
which is given in the XENRGY.SRC file, can be used to create an efficient  binary file 
from this ASCII listing, while the subroutine XENRGY can be used  in a user written 
program to read the resulting binary file.



Title:XMAQNT
Directory: MMSLib\XEDS\XMAQNT
Keywords: quantitative correction, PAP, PROZA, XPP
Computer: Any with ANSI-C; tested on IBM-PC, Unix
Operating System: Any (MS-DOS binaries are also available)
Programming Language: ANSI-C
Hardware Requirements: None
Author(s): Cameron Davidson and others.
Correspondence Address: CSIRO, Division of Manuf. Technol., P.O Box 883
                       Kenmore, 4069, Australia
 e-mail (Internet): cjd@cat.csiro.au

Abstract:
	XMAQNT is a software package for performing quantitative X-ray
microanalysis.  It provides:
1. A program to perform PAP, PROZ-A or XPP quantitative corrections on
	X-ray intensity ratios.
2. a library of basic atomic chemistry and X-ray related utility routines.
3. use of databases for X-ray lines, edges and Mass Absorption coefficients,
	with the possibility of supporting multiple such databases.
4. utility programs for creating, examining and editing these databases. 
5. support for plotting the calculated Phi-Rho-Z curves. (This requires
	the user to obtain the free plotting package GNUPLOT - available
	for many different operating systems.)
Compression Method: ZIP -use 'unzip' or 'pkunzip -d' on MS-DOS, or
                      'unzip -a' on Unix.



Title:XPHI 
Directory: MMSLib\EMPA\Xphi
Keywords: PhiRhoZ correction

Abstract:
For a description see:
 "An Accurate Computer Correction Program for Quantitative Electron Probe 
Microanalysis", Claude Merlet,  Mikrochim. Acta 114/115 363-376 (1994).  Install the 
program by exploding the auto-unzip file xphiz.exe into a directory on your hard drive 
(say, c:\xphi).  Install the fonts, FIX8X14.FON and FIX8X16.FON that come with the 
program in the Windows sytem directory (e.g. in c:\windows\system).  The program is 
called xphi.exe, add the program to your program manager listing so that you may double 
click it to run it from the windows shell.

John Mansfield
jfmjfm@umich.edu.



Title: XRAYLINE
Directory: MMSLib\XEDS\XRAYLINE
Computer: Any
Keywords: XEDS, WDS, Spectra X-ray Lines
Operating System: any
Hardware Requirements: none
Author(s): Chuck Fiori
Correspondence Address: None.  Contact NIST for possible further info.

Abstract:
This data base contains 4985 entries and includes all the  measurable
X-ray  lines,  satellites  and  absorption edges from under 100 eV to
over 120 keV. Additionally, most of the X-ray  lines  and  satellites
are  assigned  a  relative intensity (relative to the alpha-1 line in
each family).  The  data  base  was  assembled  primarily  from  four
sources:
 
1.)  B.L.  Doyle, W.F. Chambers, T.M. Christensen, J.M. Hall and G.H.
Pepper "SINE THETA SETTINGS FOR X-RAY SPECTROMETERS", Atomic Data 
and
Nucleur Data Tables Vol. 24, No 5, 1979.
 
2.)  E.W. White, G.V. Gibbs, G.G. Johnson Jr. and G.R. Zechman "X-RAY
WAVELENGTHS AND CRYSTAL INTERCHANGE SETTINGS  FOR  
WAVELENGTH  GEARED
CURVED CRYSTAL SPECTROMETERS" Report of the Pennsylvania State Univ.,
1964.
 
3.) J.A. Bearden "X-RAY WAVELENGTHS AND X-RAY ATOMIC  ENERGY  
LEVELS"
Rev. Mod. Phys., Vol. 39, No. 78, 1967.
 
4.)  J.A  Bearden  and A.F. Burr,"REEVALUATION OF X-RAY ATOMIC ENERGY
LEVELS", Rev. Mod. Phys., Vol. 31, No. 1, 1967.