**Recent Publications**

"The 30/60 MHz tuned radiometer---The NIST system for noise temperature
measurements," C.A. Grosvenor and R.L. Billinger, NIST Technical Note
1525 (March, 2002).

"Noise-parameter uncertainties from Monte Carlo simulations," J. Randa
and W. Wiatr, *Digest of the 2001 British Electromagnetic Measurement
Conference*, Harrogate, U.K. (2001).

"Noise characterization of multiport amplifiers," J. Randa, IEEE Trans.
Microwave Theory & Techniques, vol. 49, no. 10, pp. 1757--1763 (2001).

"Stability measurements on noise sources," J. Randa, L.P. Dunleavy, and
L.A. Terrell, IEEE Trans. Instrum. Meas., vol. 50, no. 2, pp. 368--372
(2001).

"International comparison: Noise temperature of coaxial (GPC-7)
sources," J. Randa, J. Achkar, F.-Im. Buchholz, T. Colard, D. Schubert,
M. Sinclair, J. Rice, and G. Williams, Metrologia, vol. 37, pp. 351--352
(2000).

"NFRad---Review of the new NIST noise measurement system," C. Grosvenor,
J. Randa, and R.L. Billinger, *55^st^ ARFTG Conference Digest*, pp.
135--144; Boston, MA (2000).

"Multiport noise characterization and differential amplifiers," J.
Randa, *55^st^ ARFTG Conference Digest*, pp. 106--115; Boston, MA
(2000).

"Noise-source stability measurements," J. Randa, L.P. Dunleavy, and L.A.
Terrell, *2000 Conference on Precision Electromagnetic Measurements
Digest* (Sydney, Australia), pp. 445--446 (2000).

"Design and testing of NFRad---A new noise measurement system," C.
Grosvenor, J. Randa, and R.L. Billinger, NIST Tech. Note 1518 (March,
2000).

"Comparison of adapter characterization methods," J. Randa, W. Wiatr,
and R.L. Billinger, IEEE Trans. Microwave Theory & Techniques, vol. 47,
no. 12, pp. 2613--2620 (1999).

\"On-wafer measurements of noise temperature,\" J. Randa, R.L.
Billinger, and J.L. Rice, IEEE Trans. Instrum. Meas., vol. 48, no. 6,
pp. 1259--1269 (1999).

"Comparison of methods for adapter characterization," W. Wiatr, J.
Randa, and R.L. Billinger, *1999 IEEE MTT-S International Microwave
Symposium Digest* (Anaheim, CA), pp. 1881--1884 (1999).

\"International comparison of thermal noise-temperature measurements at
2, 4, and 12 GHz,\" J. Randa, J. Achkar, F.-Im. Buchholz, T. Colard, D.
Schubert, M. Sinclair, J. Rice, and G. Williams, IEEE Trans. Instrum.
Meas., vol. 48, no. 2, pp. 174--177 (1999).

"Characterization and applications of on-wafer diode noise sources," L.
Dunleavy, J. Randa, D. Walker, R. Billinger, and J. Rice, IEEE Trans.
Microwave Theory & Techniques, MTT-46, pp. 2620--2628 (1998).

\"International comparison of noise-temperature measurements at 2, 4,
and 12 GHz,\" J. Randa, J. Achkar, F.-Im. Buchholz, T. Colard, D.
Schubert, M. Sinclair, J. Rice, and G. Williams, *Conference Digest,
1998 Conference on Precision Electromagnetic Measurements* (Washington,
DC), pp. 615--616 (1998).

"Characterization of on-wafer diode noise sources," J. Randa, D. Walker,
L. Dunleavy, R. Billinger, and J. Rice, *51^st^ ARFTG Conference
Digest*, pp. 53--61, Baltimore, MD (1998).

\"Uncertainties in NIST noise-temperature measurements,\" J. Randa, NIST
Tech. Note 1502 (March, 1998).

\"Noise-temperature measurement system for the WR-28 band,\" J. Randa
and L.A. Terrell, NIST Tech. Note 1395 (August, 1997).

\"Amplifier noise measurements at NIST,\" D.F. Wait and J. Randa, IEEE
Trans. Instrum. Meas., IM-46, pp. 482--485 (1997).

\"Noise temperature measurements on wafer,\" J. Randa, NIST Tech. Note
1390 (March, 1997).