# Bryan Valek Selected Publications

 "Early Stage of Plastic Deformation in Thin Films Undergoing
Electromigration," B.C. Valek, N. Tamura, R. Spolenak, A.A. MacDowell,
R. S. Celestre, H.A. Padmore, W.A. Caldwell, J.C. Bravman, B.W.
Batterman, W.D. Nix,  J. R. Patel, *Journal of Applied Physics*
**94**(6), 3757-61 (2003).

 "Quantitative Analysis of Dislocation Arrangements Induced by
Electromigration in a Passivated Al  (0.5 wt %Cu) Interconnect," R. I.
Barabash, G. E. Ice, N. Tamura, B. C. Valek, J. C. Bravman, R. Spolenak,
J. R. Patel, *Journal of Applied Physics* **93**(9), 5701-6, (2003).

 "Local Plasticity of Al Thin Films as Revealed by X-Ray
Microdiffraction," R. Spolenak, W.L. Brown, N. Tamura, A.A. MacDowell,
R.S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, T. Marieb, H.
Fujimoto, B.W. Batterman, J.R. Patel, *Physical Review Letters*
**90**(9), 096102/1-4 (2003).

 "Scanning X-Ray Microdiffraction with Submicron White Beam for
Strain/Stress and Orientation Mapping in Thin Films," N. Tamura, A.A.
MacDowell, R. Spolenak, B.C. Valek, J. C. Bravman, W.L. Brown, R. S.
Celestre, H.A. Padmore, B.W. Batterman, J.R. Patel, *Journal of
Synchrotron Radiation* **10**(2), 137-143, (2003).

 "Electromigration-Induced Plastic Deformation in Passivated Metal
Lines," B.C. Valek, J. C. Bravman, N. Tamura, A.A. MacDowell, R. S.
Celestre, H.A. Padmore, R. Spolenak, W.L. Brown, B.W. Batterman, J. R.
Patel,  *Applied Physics Letters* **81**(22), 4168-70, (2002).

 "High Spatial Resolution Grain Orientation and Strain Mapping in Thin
Films Using Polychromatic Submicron X-ray Diffraction," N. Tamura, A.A.
MacDowell, R. S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, R.
Spolenak, W.L. Brown, T. Marieb, H. Fujimoto, B.W. Batterman, J. R.
Patel,  *Applied Physics Letters*  **80(20)**, 3724-6, (2002).

 "High Resolution Microdiffraction Studies Using Synchrotron
Radiation," R. Spolenak, N. Tamura, B. C. Valek, A. A. MacDowell, R. S.
Celestre, H. A. Padmore, W. L. Brown, T. Marieb, B. W. Batterman,  J. R.
Patel, *AIP Conference Proceedings* **612**, 217-28, (2002).

 "Submicron X-Ray Diffraction and its Applications to Problems in
Materials and Environmental Science," N. Tamura, R. S. Celestre, A. A.
MacDowell, H. A. Padmore, R. Spolenak, B. C. Valek, N. Meier Chang, A.
Manceau, J. R. Patel, *Review of Scientific Instruments*, **73**(3)
1369-72, (2002).

 "Local Microstructure and Stress in Al(Cu) Thin Film Structures
Studied by X-Ray Microdiffraction,"  B.C. Valek, N. Tamura, R. Spolenak,
A.A. MacDowell, R.S. Celestre, H.A. Padmore, J.C. Bravman, W.L. Brown,
B.W. Batterman, J.R. Patel, *Mat. Res. Soc. Symp. Proc.,* **673**,
P7.7.1-6, (2001).

 "Submicron X-Ray Diffraction," A.A.MacDowell, R.S.Celestre, N.Tamura,
R.Spolenak, B.C. Valek, W.L.Brown, J.C.Bravman, H.A.Padmore,
B.W.Batterman, J.R.Patel, *Nuclear Instruments and Methods in Physics
Research A* **467-468**, 936-943, (2001).

 "Grain Orientation and Strain Measurements in Sub-Micron Wide
Passivated Individual Aluminum Test Structures," N. Tamura, B. C. Valek,
R. Spolenak, A. A. MacDowell, R. S. Celestre, H.A.Padmore, W. L. Brown,
T. Marieb, J. C. Bravman, B. W. Batterman  and J. R. Patel, *Mat. Res.
Soc. Symp. Proc*., **612**, D8.8.1-6, (2001).

 "Microtexture and Strain in Electroplated Copper Interconnects," R.
Spolenak, D.L. Barr, M.E. Gross, K. Evans-Lutherodt, W.L. Brown, N.
Tamura, A.A. MacDowell, R.S. Celestre, H.A.Padmore, J.R. Patel, B.C.
Valek, J.C. Bravman, P. Flinn, T. Marieb, R.R. Keller, B.W. Batterman,
*Mat. Res. Soc. Symp. Proc.,* **612**, D10.3.1-7, (2001).

 "Grain Orientation Measurement of Passivated Aluminum Interconnects by
X-Ray Micro Diffraction," C.H. Chang, B. C. Valek, H. A. Padmore, A. A.
MacDowell, R. Celestre, T. Marieb, J. C. Bravman, Y. M. Koo, J. R.
Patel, *AIP Conference Proceedings* **507**, 284-7, (2000).