# Solicitation 1-057-RCA.1372 MICRO TESTER

# 

# Performance Specification for MicroTester

The instrument must perform tensile, compression, flex, shear, cyclic
and fatigue tests (both static and dynamic) on a variety of materials
including fine wires and fibers (a few micron in diameter).

-   The instrument must perform die shear test for semiconductor and
    button shear testing of molding compound.

-   The instrument must perform monotonic and clyclic indentation tests.

-   The instrument must perform peel test of thin films ans substrates
    and lap shear test of underfills and fracture toughness test of
    adhesions and interfaces.

-   The instrument should be a compact size (500mm deep by 500mm wide)
    to be installed on any lab workbench or table.

## Frame

-   It should be possible for the operator to configure the frame to be
    either vertical or horizontal (e.g. vertical for tensile testing on
    flexible specimens, horizontal for die shear).

-   The instrument must employ a high-resolution linear optical grating
    transducer located directly on the actuator. [The displacement
    accuracy must be better than one micron and a mesurement resolution
    must be 20nm or better]{.underline}.

-   The instrument must have a capability to employ a 500g load cell to
    measure down to 1.0gf with the accuracy within 1%.

-   Maximum actuator travel and vertical test space must at least 100mm
    and 600mm, respectively.

-   The drive system of the frame must employ a High Torque low inertia
    Brushless DC motor for excellent low speed smoothness and dynamic
    performance. Testing speed range must be at least 0.001 to 1,500
    mm/min. The control loop should be isolated from the specimen via a
    ball screw reduction drive.

-   The instrument must operate from a normal single-phase electric
    supply. No compressed air or hydraulic supply should be required.

-   A fixed position emergency stop should be provided on the frame.

```{=html}
<!-- -->
```
-   Push buttons for coarse actuator positioning and a thumb wheel for
    fine actuator positioning must be provided at the frame.

## Controller

-   The instrument must provide a high speed computer interface with a
    data transfer rate between the controller and PC of at least 7.7
    Mbytes/sec continuously.

-   The instrument must have a data sampling rate at least 5kHz on all
    transducer channels; data acquisition on all channels must
    synchronise to avoid data skew.

-   The data resolution must be at least 19 bits per channel (1 part in
    524,288) across the full scale of all transducers (i.e. no ranging).

-   The Waveform generation should be at least 32bit resolution (1 part
    in 10^9^).

-   The controller must have at least one analogue input for an analogue
    waveform drive signal and at least four assignable analogue outputs.

-   Transducer automatic recognition and calibration. The controller
    must have the facility to recognize virtually any number of
    transducers once they are fitted with the correct
    recognition/calibration plug without having to reconfigure either
    the controller or transducer.

-   The controller must prevent any test proceeding with an uncalibrated
    transducer to prevent incorrect data being gathered.

## 

## Software

-   If a PC is used as an interface to the system the on-screen control
    display provided must always be clearly visible; it should not be
    possible to minimise or obscure this area of the screen.

-   The control system must support, and the relevant software packages
    should be available to enable, the user to write and run their own
    application packages directly within a National Instruments Labview
    environment, without any additional compiling being required.

-   Any software supplied must be able to run under Windows 95,98, NT
    and 2000.