EMMPDL

Abstracts

&

Directory

===============================================================

**Title :DIFFRACTIONSUITE**

**Keywords :CBED, HOLZ, KINEMATICAL APPROXIMATION**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS**

**Programming Language :Fortran 77**

**Hardware Requirements :TEKTRONICS 4010 TERMINAL OR SUITABLE EMULATOR**

**Author(s) :JOHN F. MANSFIELD (919)-248-1800**

**Correspondence Address :THE MICROELECTRONICS CENTER OF NORTH
CAROLINA**

**:PO BOX 12889, RESEARCH TRIANGLE PARK, N.C. 27709.**

Abstract:

This set of software routines will calculate a data file of reciprocal

lattice vectors for any crystal, when supplied with the lattice
parameters and

the lattice type, and then plot simulated convergent beam electron
diffraction

zone axis patterns (CBED ZAPs). The simulations are currently limited to

plots of the zero layer discs, plots of the bright field deficiency
higher

order laue zone lines and both of the above simultaneously.

The manual for this suite of routines was written on an apple macintosh

using \"macwrite\", with examples of actual plots \"pasted\" into the
text from the

terminal emulation program \"versaterm\". A copy of the text of the
manual

resides in the emmpdl under the title \"diffractionsuite.doc.

to receive a complete copy including figures, please send a blank
macintosh

disk the author.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :MOCBEDOFF**

**Keywords :CBED, Thickness, TEM Computer Control**

**Computer :IBM PC**

**Operating System :DOS**

**Programming Language :Pascal**

**Hardware Requirements :None**

**Author(s) :M.T. Otten**

**Correspondence Address :Philips Analytical**

**:International Business Centre**

**:Electron Optics,Building AAE**

**:5600 MD Eindhoven,The Netherlands**

Abstract:

CMCBEDOFF is an off-line computer program which allows the users

to determine specimen thicknesses using convergent beam electron

diffraction patterns. Users are prompted to input all relevant
parameters

needed to perform thickness calculations. Unlike CMCBEDON, this program

requires no microscope interfaces and can be run on a standard PC, with
users

supplying data measured from micrographs.

July 1989

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :MOCBEDON**

**Keywords :CBED, Thickness, TEM Computer Control**

**Computer :IBM PC**

**Operating System :DOS**

**Programming Language :Pascal**

**Hardware Requirements :Philips CM Series Computer Interface**

**Author(s) :M.T. Otten**

**Correspondence Address :Philips Analytical**

**:International Business Centre**

**:Electron Optics,Building AAE**

**:5600 MD Eindhoven,The Netherlands**

Abstract:

CMCBEDON is an on-line computer program which allows the user of a

Philips CM series TEM/STEM to determine specimen thicknesses using

convergent beam electron diffraction patterns. Unlike CMCBEDOFF,

this program requires a Philips CM series computer/microscope

interfaces. Using interactive programing data required for

calculations is supplyed/measured directly from microscope. No
micrographs are

therefore required.

July 1989

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :STEREOPROJ**

**Keywords :Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ**

**Computer :IBM PC/XT/AT or compatible**

**Operating System :PC-DOS**

**Programming Language :BASICA or QUICKBASIC (QUICKBASIC preferred)**

**Hardware Requirements :Hewlett Packard HP7470A Plotter required.**

**Author(s) :John R. Porter**

**Correspondence Address :Rockwell International Science Center,**

**:Thousand Oaks, CA 91360.**

Abstract:

The program, written in IBM BASICA, plots stereographic projections,
CBED and

HOLZ line simulations, and performs axis/angle pair calculations. Output
is to

the screen or a Hewlett Packard HP 7470A Plotter. Stereographic
projections

are drawn to scale for subsequent manipulations with a standard 18cm.
Wulff net

and can be plotted for cubic, hexagonal, tetragonal and monoclinic
crystal

systems in any orientation. Plotted poles can be restricted to those
allowed

by structure factor considerations (for certain structures) or
restricted to

those in certain Laue zones. The program leads the user through menus to

determine the structure and orientation for the projection, which is
then

plotted accordingly. Version 4.00 is significantly enhanced compared to

earlier versions. Screen output is improved, more crystal structures are

supported the user interface is more forgiving and the program is
faster.

Also, the HOLZ line routine has been modified and should be more
accurate.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :STERPROJ_IBM_V4**

**Keywords :Stereographic Projection, CBED, SAD, TEM, AEM,**

**HOLZ**

**Computer :IBM PC/XT/AT or compatible**

**Operating System :PC-DOS**

**Programming Language :QUICKBASIC 4.5**

**Hardware Requirements :Hewlett Packard HP7470A Plotter required.**

**Author(s) :John R. Porter**

**Correspondence Address :Rockwell International Science Center,**

**:Thousand Oaks, CA 91360.**

Abstract:

This QuickBASIC program plots stereographic projections, CBED and

HOLZ line simulations, and performs axis/angle pair calculations.

Output is to the screen or a Hewlett Packard HP 7470A Plotter.
Stereographic

projections are drawn to scale for subsequent manipulations with a
standard

18cm. Wulff net and can be plotted for cubic, hexagonal, tetragonal and

monoclinic crystal systems in any orientation. Plotted poles can be

restricted to those allowed by structure factor considerations (for
certain

structures) or restricted to those in certain Laue zones. The program

leads the user through menus to determine the structure and orientation

for the projection, which is then plotted accordingly. Version 4.00 is

significantly enhanced compared to earlier versions.

EDITORS NOTE: THIS IS A NEW UPDATED VERSION OF STERPROJ- IBM

(FEB.1990)

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: STERPROJ_MAC**

**Keywords: Stereographic Projection, CBED, SAD, TEM, AEM, HOLZ**

**Computer: Macintosh Plus or II**

**Language: QuickBASIC for Macintosh**

**Hardware: Hewlett Packard HP7470A Plotter or Laserwriter**

**Author: John R. Porter**

**Address: Rockwell International Science Center, Thousand Oaks**

**CA 91360**

Abstract:

Stereographic Projection for Macintosh is the Macintosh version of the

STERPROJ program previously available for the PC. The program plots

stereographic projections, CBED simulations, HOLZ line patterns and

performs axis/angle pair calculations. The program supports cubic,

hexagonal, tetragonal and monoclinic crystal systems. Separate

executable versions are included for Mac Plus and Mac II (SPMAC+.EXE and

SPMACII.EXE). The .DOC file is in Macwrite format. Sample data files are

also included (extension .MACXTL).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :TCBED**

**Keywords :CBED**

**Computer :VAX, Macintosh, Machine independent**

**Operating System :Any**

**Programming Language :Fortran 77**

**Hardware Requirements :Line printer**

**Author(s) :J.M. Zuo and J.C.H. Spence**

**Correspondence Address :Physics Dept, Arizona State Univ., Tempe, AZ
85287, USA**

**Abstract:**

A Transmission Convergent Beam Electron diffraction program which

simulates the two-dimensional distribution of intensity in CBED disks.
The

program includes three-dimensional (HOLZ) diffraction for
non-centrosymmetric

crystals with absorption and inclined boundaries. It uses Bloch wave
(matrix

diagonalization for general complex matrix) method. A complete
description,

source code and test data are given in J. Elec. Micros. Tech., May, 1989

(Zuo et al). An application to GaAs can be found in Phys. Rev. Lett.,
Vol 61,

P353 (1988). The program produces a numerical output file and a
two-digits

intensity map on line printer.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :DOSE**

**Keywords :Electron Dose Measurement, TEM Computer**

**Control**

**Computer :IBM PC**

**Operating System :DOS**

**Programming Language :Pascal**

**Hardware Requirements :Philips CM Series Computer Interface**

**Author(s) :M.T. Otten**

**Correspondence Address :Philips Analytical**

**:International Business Centre**

**:Electron Optics,Building AAE**

**:5600 MD Eindhoven,The Netherlands**

Abstract:

Dose is an on-line computer program which allows the user of a

Philips CM series TEM/STEM to determine specimen electron irradiation

dose through the use of the Philips CM Series Computer Interface. Simple

interactive questions allow the user to determine experimentally the

nominal irradiation dose from screen current measurements.

Feb. 1990

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :DYNADF**

**Keywords :Dark Field, TEM Computer Control**

**Computer :IBM PC**

**Operating System :DOS**

**Programming Language :Pascal**

**Hardware Requirements :Philips CM Series Computer Interface**

**Author(s) :M.T. Otten**

**Correspondence Address :Philips Analytical**

**:International Business Centre**

**:Electron Optics,Building AAE**

**:5600 MD Eindhoven,The**

**Netherlands**

Abstract:

DYNADF is an on-line computer program which allows the user of a

Philips CM series TEM/STEM to simulate the Dynamic Annular Dark Field

operating mode. DYNADF.COM simulates for the CM TEM the Dynamic

Conical Dark Field mode as it is available on the CM/STEM microscope. In
the

latter, the presence of the scan generator allows continuous scanning of

the beam in a hollow cone. Since the CM TEM doesn\'t have a scan
generator,

the Dynamic mode is not available, but a similar effect can be obtained

by continuously turning the MULTIFUNCTION X knob under computer control.

Feb. 1990

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :MOAUTOCOND**

**Keywords : TEM Computer Control**

**Computer :IBM PC**

**Operating System :DOS**

**Programming Language :Pascal**

**Hardware Requirements :Philips CM Series Computer Interface**

**Author(s) :M.T. Otten**

**Correspondence Address :Philips Analytical**

**:International Business Centre**

**:Electron Optics,Building AAE**

**:5600 MD Eindhoven,The Netherlands**

Abstract:

AUTOCOND is an on-line computer program which allows the user of a

Philips CM series TEM/STEM to automatically condition the High Voltage

of a CM20/CM30 instrument using remote computer control.

JAN. 1992

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :ONEDISANL**

**Keywords :CTEM, DISOLOCATIONS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :R. J. Holton**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

ONEDISANL is a modified version of the original ONEDIS program developed

by the group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and

C.T. Forwood at CSIRO Division of Tribophysics, University of Melbourne,

Autralia for calculating disolcation images for the TEM. This version

modifies only their output algorithms for output to a serial data file
rather

than overprinting upon a line printer. Using the included program
(IMOUT)

this can then be displayed as a randomized dither pattern on a DEC LA100
or

LA50 printer

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :TWODISANL**

**Keywords :CTEM, DISOLOCATIONS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :R. J. Holton**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

TWODISANL is a modified version of the original TWODIS program developed

by the group of A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton and

C.T. Forwood at CSIRO Division of Tribophysics, University of Melbourne,

Autralia for calculating disolcation images for the TEM. This version

modifies only their output algorithms for output to a serial data file
rather

than overprinting upon a line printer. Using the included program
(IMOUT)

this can then be displayed as a randomized dither pattern on a DEC LA100
or

LA50 printer

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :\$\$EELSDATA**

**Keywords :EELS SPECTRA**

**Computer :All systems**

**Operating System :None**

**Programming Language :None**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

Experimental EELS spectra are now available in the EMMPDL.

They are generally titled in the form of:

\$NAME.PDL

Where the notation PDL indicates that they are ASCII files stored in the

EMMPDL data format (see RWEMMPDL.ABS). To locate these files set your

DIR.FILENAME.FILETYPE to EELS.\*.PDL in the Menu Options of the EMMPDL.

You may access and transfer these file by all telecommunications
options.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :ELSKKT**

**Keywords :EELS,CTEM,OPTICAL PROPERTIES**

**Computer :11/730-785**

**Operating System :Vax/Vms**

**Programing Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Alex H. Buxbaum**

**Correspondence Address :Department of Materials Engineering,**

**Technion- Israel Institute of Technology**

**Haifa 32000, Israel.**

Abstract:

ELSKKT is program written for the purpose of obtaining the loss function

and dielectric constant (real and imaginary parts) of materials, from

Electron Energy Loss (EELS) spectra obtained in the transmission
electron

microscope. Usefull data generally begines around 8eV, for an instrument

with a resolution of 2 eV. After correcting for multiple scattering,
data

is treated by using the Kramers-Kronig Analysis.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :EMMFF V. 1.0**

**Keywords :XEDS,EELS,AES,WDS,CLS,GAM,XRF,PES**

**Computer :IBM, MAC, DEC**

**Operating System :ALL**

**Programming Language :Fortran 77**

**Hardware Requirements :None**

**Author(s) :EMSA/MAS TASK FORCE**

**Ray Egerton ,Charles E. Fiori ,John A. Hunt,**

**Mike S. Isaacson,Earl J. Kirkland ,Nestor J. Zaluzec**

**Correspondence Address :R.F. EGERTON-CHAIRMAN**

**University of Alberta**

**Dept. of Physics**

**Edmonton, Alberta, Canada, T6G2J1**

Abstract:

A simple format for the exchange of digital spectral data is

presented, and proposed as an EMSA/MAS standard. This format is readable
by

both humans and computers and is suitable for transmission through
various

electronic networks (BITNET, ARPANET), the phone system (with modems) or
on

physical computer storage devices (such as floppy disks). The format is
not

tied to any one computer, programming language or computer operating
system.

The adoption of a standard format would enable different laboratories to
freely

exchange spectral data, and would help to standarize data

analysis software. If equipment manufacturers were to support a common
format,

the microscopy and microanalysis community would avoid duplicated effort
in

writing data-analysis software. This version of EMSAMASFF contains two

subroutines which read and write spectral data files Version 1.0 data
format.

The data are stored as simple ASCII characters at a user defined number
of

columns per line for the length of the data file. The spectral data is

preceeded by a series of header lines, which tell the user about the

parameters of the spectrum. The header lines are identified by the first

character in the line being the symbol (#) followed by a descriptor and
if

appropriate its units. An example of a data file format can be found in
the

EMSAMASFF.DOC file.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NELSV21**

**Keywords :EELS**

**Computer :DEC VAX-11/730 - 11/785 or higher series**

**Operating System :VMS**

**Programming Language :Fortran IV**

**Hardware Requirements :Tektronics 4010 Series Graphic Terminal or
Emulator**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Electron Microscopy Center, Materials Science,
Bldg 212**

**:Argonne Nat. Lab, Argonne, IL. 60439 USA**

Abstract:

NELS is a generic data analysis computer program for reduction of EELS

spectra. The program performs the functions of spectral calibration, KLM
edge

identification, background fitting & subtraction, edge integration,
digital

filtering, and general spectral maniputlation. The input spectra are
assumed

to be in the EMMPDL spectral file format (see RWEMMPDL.ABS). The program
can

handle simultaneously three spectra of upto 4096 channels in length. A
shorter

and less elaborate version is available for smaller DEC computers
running

RT-11. The program NELS requires a computer terminal which responds to
the

graphics protocol of Tektronics 4010/4014 series terminal (see
NGRAPH.ABS)

and an atomic inner shell energy level data file (see ATMLVL.ABS).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NTLAMDA**

**Keywords :EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec (312-972-5075,4964)**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

NTLAMDA is a simple fortran program which allows the user to calculate
the

approximate thickness of a specimen based upon the measured EELS
spectral

intensity ratio Io/It, which can be shown to be equal to the ratio of
the

local thickness (t) to the mean free path for inelastic scattering
(lamda).

The formulae are based upon the work of Egerton and Cheng
(Ultramicroscopy, 21,

1987 pge 231-244), but has been generalized to simplify data input and
entry.

The user must know the nominal elemental constitutents of the specimen,
and is

prompted for all necessary input parameters required for the
calculation.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NTRANS**

**Keywords :XEDS, EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

NTRANS is a computer program which translates manufacturers XEDS and
EELS

spectral data into the EMMPDL data format. It utilies the RWEMMPDL
subroutines

contained in the EMMPDL. At present this version translates both EDAX
and

TRACOR-Northern and Link Systems data files. Examples of translated
spectra

can be found spectra can be found in the XEDS and EELS subdirectories of

the EMMPDL.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PINT**

**Keywords :EELS - planar interface calculations**

**Computer :VAX 780**

**Operating System :VAX/VMS version 4.7**

**Programming Language :FORTRAN 77**

**Hardware Requirements :Tektronics 4010 series graphic terminal or
emulator**

**desirable but not essential.**

**Author(s) :C.A. Walsh - based on a BASIC program written by**

**A. Howie.**

**Correspondence Address :Microstructural Physics Group, Cavendish
Laboratory,**

**Madingley Road, Cambridge, CB3 0HE, England.**

Abstract:

The program uses the result obtained by Garcia-Molina, Gras-Marti, Howie
and

Ritchie (J. Phys. C18 (1985) pp5335) to calculate the energy loss of
electrons

travelling parallel to a planar interface. They obtained an expression
for the

differential probability dP/(dzdhf), for an electron travelling in the z

direction and losing energy hf. The probability of losing energy between

hf-dhf/2 and hf+dhf/2 after travelling a distance dz parallel to the
interface

is given by dP/(dzdhf) x dzdhf. The program also uses this result to
calculate

the energy loss of electrons incident at an angle to an interface (see
Howie,

Milne and Walls,(1985) Inst.Phys. Conf. Ser. No. 78: Chapter 4,
EMAG\'85). The

program requires dielectric data for the media on either side of the
interface.

A limited amount of data is stored inside the program for some
materials. Other

data can be supplied to the program by data files.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PTEELS**

**Keywords :EELS,AEM,CTEM,STEM,BACKGROUND,STATISTICS**

**Computer :DEC LSI-11/73**

**Operating System :RSX-11M-PLUS**

**Programming Language :DEC-FORTRAN IV**

**Hardware Requirements :None**

**Author(s) :Dr. Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides**

**:Bat. 510, F91405 ORSAY CEDEX FRANCE**

Abstract: We present an unbiased method for the estimation of the
background in

EELS spectra. It looks for the maximum likelihood of a power law model
whose

two dependent parameters A and R are estimated together with their
variances

and covariance. Applying the usual rules of error propagation, core-loss

characteristic signals and their variances are estimated. Results can be
used

as input data for the programs QUANTI and LIMIT which are also provided
by the

EMMPDL facility. A complete description of the algorithm is given in
\"Unbiased

Method for Signal Estimation in Electron Energy Loss Spectroscopy\...\",

P. TREBBIA, Ultramicroscopy (1988).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PTETHA**

**Keywords :EELS,STEM,COLLECTION EFFICIENCY,CONVERGENT BEAM**

**Computer :DEC LSI-11/73**

**Operating System :RSX-11M-PLUS**

**Programming Language :DEC-FORTRAN IV**

**Hardware Requirements :None**

**Author(s) :Dr. Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides**

**:Bat. 510, F91405 ORSAY CEDEX FRANCE**

Abstract: When EELS spectra are recorded with a convergent beam (STEM
case),

one has to compute an effective collection angle BETA\* which should be
used in

computing the interaction cross sections, instead of the actual
collection

angle BETA. This is the job of program ETHA.

A complete description of the algorithm is given in \"Unbiased

Method for Signal Estimation in Electron Energy Loss Spectroscopy\...\",

P. TREBBIA, Ultramicroscopy (1988).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PTLIMIT**

**Keywords :EELS,EDX,AEM,CTEM,STEM,DETECTION LIMITS,STATISTICS**

**Computer :DEC LSI-11/73**

**Operating System :RSX-11M-PLUS**

**Programming Language :DEC-FORTRAN IV**

**Hardware Requirements :None**

**Author(s) :Dr. Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides**

**:Bat. 510, F91405 ORSAY CEDEX FRANCE**

Abstract: When one tries to detect an element with a very small
SIGNAL/NOISE

ratio, one has to face with two main risks :

FIRST KIND RISK : state the element is present when actually it is
absent.

SECOND KIND RISK : state the element is absent when actually it is
present.

This program gives for two first kind risks (0.05 and 0.01) and four
second

kind risks (0.25, 0.10, 0.05 and 0.01) the resulting 8 possible values
of

minimum SIGNAL and SIGNAL/NOISE ratio.

A complete description of the algorithm is given in \"Unbiased

Method for Signal Estimation in Electron Energy Loss Spectroscopy\...\",

P. TREBBIA, Ultramicroscopy (1988).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PTQUANTI**

**Keywords :EELS,EDX,AEM,CTEM,STEM,CONCENTRATIONS,STATISTICS**

**Computer :DEC LSI-11/73**

**Operating System :RSX-11M-PLUS**

**Programming Language :DEC-FORTRAN IV**

**Hardware Requirements :None**

**Author(s) :Dr. Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides**

**:Bat. 510, F91405 ORSAY CEDEX FRANCE**

Abstract: The purpose of this program is quite general. It can be used
not only

for the determination of atomic concentrations in EELS experiments, but
also,

for example, for the determination of weight concentrations in EDX

spectroscopy. For given SIGNAL, BACKGROUND, H = 1 +
VARIANCE(BACK)/BACKGROUND

and F = Interaction-detection yield (in arbitrary units) values, it
returns

concentrations values, concentration covariances and confidence
intervals at

three different confidence levels : 0.1, 0.05 and 0.01.

A complete description of the algorithm is given in \"Unbiased

Method for Signal Estimation in Electron Energy Loss Spectroscopy\...\",

P. TREBBIA, Ultramicroscopy (1988).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :PTSELECT**

**Keywords :STATISTICS,MEAN VALUE,SELECTION TEST**

**Computer :DEC LSI-11/73**

**Operating System :RSX-11M-PLUS**

**Programming Language :DEC-FORTRAN IV**

**Hardware Requirements :None**

**Author(s) :Dr. Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides**

**:Bat. 510, F91405 ORSAY CEDEX FRANCE**

Abstract: Let us suppose that we obtained N estimations Vi (i=1,N) of a
same

unknown X. If we know the variance and covariance matrix of the Vi, one
can

compute the mean value (estimation of X) and the confidence limits of
this

mean. One can then check whether the Vi are valid measurements or
whether one

of them (at least) must be removed from the measurement set.

This program SELECT is of general purpose and can be used as a valuable

substitute to the general method of the \"bad-looking\" rejection
criterion.

A complete description of the algorithm is given in \"Unbiased

Method for Signal Estimation in Electron Energy Loss Spectroscopy\...\",

P. TREBBIA, Ultramicroscopy (1988).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :RWEMMDPL**

**Keywords :XEDS, EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

RWEMMPDL contains two subroutines which read and write spectral data

files (XEDS or EELS) in the EMMPDL Version 1.1 data format. The data are
stored

as simple ASCII characters at a user defined number of columns per line
for the

length of the data file. The spectral data is preceeded by a series of
header

lines, which tell the user about the parameters of the spectrum. The
header

lines are identified by the first character in the line being the symbol
(#)

followed by a four letter descriptor and if appropriate its units. An
example

of a data file format can be found in the RWEMMPDL.DOC file. Other
examples

spectra can be found in the XEDS and EELS subdirectories of the EMMPDL.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :TRANSPORT**

**Keywords :Optics, Quadropoles, Sextapoles, Bending Magnets, EELS**

**Computer :DEC VAX 11/730-785**

**Operating System :VAXVMS,**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :K.L.Brown, F.Rothacker D.C., Carey, Ch. Iselin**

**Correspondence Address :Stanford linear Accelerator Center, Stanford
CA. USA**

**:Fermi National Accelerator Lab. Batavia, IL. USA**

**: CERN, Geneva, Switzerland**

Abstract:

Transport is a computer code which calculates charged particle
trajectories

using first and second-order matrix multiplication methods for the
design

of static electromagnetic beam-line systems. It has been in existence in

various versions since 1963. It is capable of computing a wide range of

operating characteristics of electromagnetic systems including

Quadrupoles, Sextupoles, Solenoids, Bending Magnets etc. and such can be

used to calculate the optics of many EELS systems. Specific instructions

on the use of TRANSPORT are extensive and should be obtained from: The
Reports

Office, Fermi National Accelerator Laboratory, P.O. Box 500, Batavia IL

60510, USA (Ref. NAL-91, \"Transport Appendix\")

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NGRAPH**

**Keywords :GRAPHICS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :TEKTRONICS 4010 terminal or an EQUIVALENT
emulator**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,
Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439, USA**

Abstract:

This subroutine library provides graphics functions for Tektronics
4010-1

terminals and/or their emulators. The current terminals supported are:

Tektronics 4010-1,4014-1, Lear Siegler ADM-3,ADM-5 (with Retrographics
RG-512)

Peritek VCG-512 bit map color graphics, Tektronics 4027, HP 7470A/7475A
plotters

DEC LA100/LA50 printers, Intecolor VT-100 with TEK 4010-1,4014-1, 4027
modes,

DEC VT-200 with 4010-1,4014-1 mode, Tektronics 4105/4107 with VT-100
mode,

Plessey VT-100/TEK 4010-1, Espirit VT-100/TEK 4010-1, Tektronics 4695
Copier.

The computer program NGTEST is a fortran demonstration program which
exercises

this graphics package. The purpose of this graphics library is to
provide a

standard set of routine for producing x-y plots of XEDS and EELS data
for the

analysis programs NEDS, NELS and graphics for plotting CBED patterns.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NGTEST (Demonstration Program) - Abstract**

**Keywords :GRAPHICS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :TEKTRONICS 4010 terminal or an EQUIVALENT
emulator**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,
Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439, USA**

Abstract:

The computer program NGTEST is a fortran demonstration program which
exercises

the NGRAPH library package. It demonstrates the symbol plotting, x-y
plotting,

vector plotting, hardcopy output and cursor control subroutines
available in the

package. It requires that a file TERMIN.DAT exist on the default storage
device

named DAT:. A copy of the file TERMIN.dat can be found in the
documentation of

the NGRAPH routines.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: ATMSCAT**

**Keywords: High Energy Electron Diffraction, Absorption**

**Computer: Any with F77 compiler**

**Operating System: Any**

**Programming Language: Standard Fortran 77**

**Hardware Requirements: none**

**Author(s): Q. A. King and D. M. Bird**

**Correspondence Address: School of Physics, University of Bath,**

**Bath BA2 7AY, UK.**

**Email: d.bird@gdr.bath.ac.uk (Internet)**

Abstract:

Atom is a subroutine which when passed the name of an element, the

length of a g-vector and a Debye-Waller factor will compute and return

both the real and absorptive atomic scattering factors, which can then

be incorporated into any existing diffraction program. All the data is

self-contained within the subroutine, documentation may be found at the

head of the subroutine.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: FSCATT**

**Keywords: High Energy Electron Diffraction, Absorption**

**Computer: Any with F77 compiler**

**Operating System: Any**

**Programming Language: Standard Fortran 77**

**Hardware Requirements: none**

**Author(s): Andreas Weickenmeier**

**Address: Institut fuer Angewandte Physik der TH**

**Hochschulstrasse 6**

**W-6100 Darmstadt, GERMANY**

**Email: XLTODA6L@DDATHD21.BITNET**

Abstract:

The subroutine FSCATT calculates the real part and the phonon

contribution to the absorptive part of the atomic scattering

factor for any element from He to Cf. The real part is obtained

by a new analytical fit to the tabulated Doyle and Turner

(Acta Cryst. A24 (1968) 133 - 139), Doyle and Cowley (Intern.

Tables of X-ray Crystallography, Vol. IV (1991) 152 - 174) and

Fox and O\'Keefe (Acta Cryst. A45 (1989) 786 - 793) values. For

the computation of the absorptive part an Einstein model is used.

More details can be found in Weickenmeier and Kohl, Acta Cryst.

A47 (1991) 590 - 597.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :DMOTTCS**

**Keywords :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM**

**Computer :DEC VAX 11/785**

**Operating System :VAX/VMS**

**Programming Language :VAX Fortran**

**Hardware Requirements :None**

**Author(s) :Charles R. Bradley**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,
Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439, USA**

Abstract:

This program calculates differential Mott cross-sections of

elemental nuclei in collisions with relativistic electrons. These

cross-sections are useful in the study of displacement damage and

electron transmission sputtering. For medium and high voltage
transmission

electron microscopes now available, having clean vacuum systems and high

brightness sources, modification of sample composition due to sputtering

and/or displacement by the probe will become an important consideration

during microanalysis or imaging.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :RECOIL**

**Keywords :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM**

**Computer :DEC VAX 11/785**

**Operating System :VAX/VMS**

**Programming Language :VAX Fortran**

**Hardware Requirements :None**

**Author(s) :Charles R. Bradley**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,
Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439, USA**

Abstract:

This program calculates differential Mott cross-sections of elemental

nuclei in collisions with relativistic electrons. The cross-sections are

output as functions of the nuclear recoil angle and are proportional to
the

probability that a nucleus will recoil in a given direction. These

cross-sections are useful in the study of displacement damage, electron

transmission sputtering, electron beam mixing, and recoil implantation.
For

medium and high voltage transmission electron microscopes now available,

having clean vacuum systems and high brightness sources, modification of

sample composition due to sputtering and/or displacement by the probe
will

become an important consideration during microanalysis or imaging.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :TOTCS**

**Keywords :Sputtering,Defects,Displacement Damage,EELS,XEDS,HVEM**

**Computer :DEC VAX 11/785**

**Operating System :VAX/VMS**

**Programming Language :VAX Fortran V4.0**

**Hardware Requirements :None**

**Author(s) :Charles R. Bradley**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy Center,
Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439, USA**

Abstract:

This program calculates displacement cross-sections that are useful

in estimating the amount of sputtering and displacement damage due to

collisions of relativistic electrons with nuclei in elemental samples.
The

total displacement cross-section is obtained by evaluating the
differential

Mott cross-section and numerically integrating over the range of allowed

angles. An upper limit for cascade cross-sections is evaluated in
version 2.0.

For the medium and high voltage electron microscopes now available,
having

clean vacuum systems and high brightness sources, modification of sample

composition due to sputtering and/or displacement by the probe will
become

an important consideration during microanalysis or imaging. This program
allows

the analyst to estimate the potential adverse effects on the specimen
prior

to study in the TEM.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :GIFSTD**

**Keywords :Image Storage**

**Computer :All Computers**

**Operating System :All Computers**

**Programming Language :None**

**Hardware Requirements :None**

**Author(s) :ComputerServe (Information Submitted by M. Disko)**

**Correspondence Address :5000 Arlington Centre Blvd.**

**:Columbus, Ohio 43220 (614) 457-8600**

Abstract:

A device independent file format for image file storage and

transmission is presented. This file format is copyrighted by
ComputerServe.

Editors Note: It is proposed that this file format be adopted by the
EMMPDL

for image storage and transmission.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :HTPSG**

**Keywords :IMAGE PROCESSING, HALFTONE, POSTSCRIPT**

**Computer :VAX**

**Operating System :VMS**

**Programming Language :DEC FORTRAN 77 V4.8**

**Hardware Requirements :PostScript compatible printer**

**Author(s) :Mark M. Disko**

**Correspondence Address :140 Fairview Avenue**

**:High Bridge, New Jersey 08829**

**\"HTPSG.DOC\" - HalfTone PostScript Generic**

\| \| \| \| \|

This is the routine for you if you would like to display calculated
images

on a PostScript compatible printer. Data is read in from an ASCII text
file.

Several dispay options are supported including image box layout,
halftone

screen type and spacing, text labels, and a micron marker bar.

File ICOS128.SRC contains a 128 x 128 pixel image that can be used to

demonstrate the output capabilities of HTPSG.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :ICOS128**

**Keywords :IMAGE PROCESSING, HALFTONE, POSTSCRIPT, ICOSAHEDRAL**

**Computer :VAX**

**Operating System :VMS**

**Programming Language :DEC FORTRAN 77 V4.8**

**Hardware Requirements :PostScript compatible printer**

**Author(s) :Mark M. Disko**

**Correspondence Address :140 Fairview Avenue**

**:High Bridge, New Jersey 08829**

This is a data file for program HTPSG which consists of a 128 x 128

pixel image of the five-fold axis diffraction pattern in the Al-Mn

icosahedral phase. Image data is stored with 32 two digit hex values

per line.

See HTPSG.DOC and HTPSG.SRC for more on the data file format used by

program HTPSG for HalfTone PostScript Generic display of images on

PostScript equipped display devices.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :IMAGEV1.55**

**Keywords :Image Processing**

**Computer :MACII**

**Operating System :Mac**

**Programming Language :Pascal**

**Hardware Requirements :8 bit Video**

**Author(s) :Wayne Rasband**

**Correspondence Address :National Institues of Health**

**:Bldg 36, Room 2A-03, Bethesda, Md.20892**

Image is a program for the Macintosh II for doing digital image
processing and

analysis. It can acquire, enhance, measure, edit, animate, print and
pseudo-

color images. It reads and writes TIFF and PICT files, providing
compatibility

with many other Macintosh programs, including ImageStudio, PixelPaint,
and

Digital Darkroom. It supports many standard image processing functions
including

histogram equalization, contrast enhancement, density profiling,
smoothing,

sharpening, edge detection, and noise reduction. It can measure lengths
and

x-y coordinates, and compute the average density and area of user
defined

regions of interest. Length and area measurements results can be
calibrated

to provide real world values.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :ATMLVL**

**Keywords :XEDS, EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

ATMLVL.DAT is a data file containing all inner shell edge energies

for elements in the range of H (Z=1) to FM (Z=100). The table is stored
as

simple ASCII characters to allow simple access and file transfer. Each
element

contains 24 entries which correspond to the following shells K, L3, L2,
L1, M5,

M4, M3, M2, M1, N7, N6, N5, N4, N3, N2, N1, O5, O4, O3, O2, O1, P1, P2,
and P3.

If an element doesnot have a particuliar edge its energy is listed as
zero.

The program BATMLVL, which is given in the ATMLVL.SRC file, can be used

to create an efficient binary file from this ASCII listing, while the
subroutine

ELEDGE can be used in a user written program to read the resulting
binary file.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :CLEDX**

**Keywords :EDXS quantitative analysis, Cliff-Lorimer**

**Computer :IBM PC family or clones**

**Operating System :Microsoft DOS 3.x or higher**

**Programming Language :Microsoft FORTRAN Optimizing compiler 4.10**

**:(large library, math-coprocessor emulator mode)**

**Hardware Requirements :None**

**Author(s) :Pierre TREBBIA**

**Correspondence Address :Laboratoire de Physique des Solides, Bat.
510**

**:F91405 ORSAY CEDEX FRANCE.**

**:Email : Bitnet address : TREBBIA@FRUPS51**

Abstract:

From experimental conditions (angles, detection system, primary voltage,

line intensities & backgrounds), this program computes the weight &

atomic concentrations of up to 20 elements in a thin film X-Ray analysis

experiment using the Cliff-Lorimer procedure. An estimation of the

confidence intervals on the concentrations, for different first kind

risks, is also given. No special hardware is needed (i.e. math
coprocessor

or graphic monitor). Results can be directed either to a lineprinter or
to the

screen. From the original COLIJN & ROMIG program PCEDS, several
improvements

are made concerning both the algorithms (parameterized maximum number

of elements to analyse, computation speed, analysis of the results

precision) and the accuracy of the formulae and data. Several misprints

were also corrected. Reference : \"CLEDX : a stand-alone program for

quantitative X-Ray analysis of thin films using the Cliff-Lorimer

procedure\", P. TREBBIA, Ultramicroscopy 27, 343-348 (1989).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :XMAQNT**

**Keywords :quantitative correction, PAP, PROZA, XPP**

**Computer :Any with ANSI-C; tested on IBM-PC, Unix (Sun and HP)**

**Operating System :Any**

**Programming Language :ANSI-C**

**Hardware Requirements :None**

**Author(s) :Cameron Davidson**

**Correspondence Address :CSIRO, Division of Manuf. Technol., P.O Box
883**

**:Kenmore, 4069, Australia**

**:e-mail (Internet): cjd@brb.dmt.csiro.au**

**Compression Method :ZIP -use \'unzip\' or \'pkunzip -d\' on MS-DOS,
or**

**: \'unzip -a\' on Unix.**

Abstract:

XMAQNT is a software package for performing quantitative X-ray

microanalysis. It provides:

1\. A program to perform PAP, PROZ-A or XPP quantitative corrections on

X-ray intensity ratios.

2\. a library of basic atomic chemistry and X-ray related utility
routines.

3\. use of databases for X-ray lines, edges and Mass Absorption
coefficients,

with the possibility of supporting multiple such databases.

4\. utility programs for creating, examining and editing these
databases.

5\. support for plotting the calculated Phi-Rho-Z curves. (This requires

the user to obtain the free plotting package GNUPLOT - available

for many different operating systems.)

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :DCJAEMMC**

**Keywords :Monte Carlo Simulations, XEDS Resolution**

**Computer :IBM PC and compatibles**

**Operating System :MS DOS v 2.0 or greater**

**Programming Language :TurboPascal**

**Hardware Requirements :Math Chip Optional but recommended**

**Author(s) :David C. Joy**

**Correspondence Address :University of Tenn**

**:Em Facility, Dept. of Zoology, Knoxville, TN**

**:(615)-974-3638**

**:BITNET:JOY@UTKVX1**

AEMMC - uses a single scattering Monte Carlo model to investigate

the spatial resolution of X ray production in thin films. After

computing and displaying the electron trajectories the program plots two

pieces of data. The first is the cumulative profile of Xray generation

in the solid, calibrated in angstroms and the 0% and 90% values are

drawn in to enable the value to be measured easily. The second display

calculates the Xray signal that would be observed from a thin unit

width plane-parallel layer such as a monolayer of some material

sandwiched between two grains.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :EMMFF V. 1.0**

**Keywords :XEDS,EELS,AES,WDS,CLS,GAM,XRF,PES**

**Computer :IBM, MAC, DEC**

**Operating System :ALL**

**Programming Language :Fortran 77**

**Hardware Requirements :None**

**Author(s) :EMSA/MAS TASK FORCE**

**Ray Egerton ,Charles E. Fiori ,John A. Hunt,**

**Mike S. Isaacson,Earl J. Kirkland ,Nestor J. Zaluzec**

**Correspondence Address :R.F. EGERTON-CHAIRMAN**

**University of Alberta**

**Dept. of Physics**

**Edmonton, Alberta, Canada, T6G2J1**

**Ab**stract:

A simple format for the exchange of digital spectral data is

presented, and proposed as an EMSA/MAS standard. This format is readable
by

both humans and computers and is suitable for transmission through
various

electronic networks (BITNET, ARPANET), the phone system (with modems) or
on

physical computer storage devices (such as floppy disks). The format is
not

tied to any one computer, programming language or computer operating
system.

The adoption of a standard format would enable different laboratories to
freely

exchange spectral data, and would help to standarize data

analysis software. If equipment manufacturers were to support a common
format,

the microscopy and microanalysis community would avoid duplicated effort
in

writing data-analysis software. This version of EMSAMASFF contains two

subroutines which read and write spectral data files Version 1.0 data
format.

The data are stored as simple ASCII characters at a user defined number
of

columns per line for the length of the data file. The spectral data is

preceeded by a series of header lines, which tell the user about the

parameters of the spectrum. The header lines are identified by the first

character in the line being the symbol (#) followed by a descriptor and
if

appropriate its units. An example of a data file format can be found in
the

EMSAMASFF.DOC file.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NEDQNT**

**Keywords :XEDS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

NEDQNT is a quantitative data analysis program which converts

relative x-ray intensities (K and L lines only) into composition
measurements

using the standardless analysis approach. The user can modify the XEDS

detector parameters to specify Windowless, UTW or Be configurations of

arbitrary thickness as well as perform an iterative absorption
correction for

thicker samples if the specimen/detector geometry is known. The program
also

has the capability of calculating relative intensities when the user
inputs

composition values, allowing the analyst to explore theoritically the

expected intensities of samples yet to be analyzed. All necessary
subroutines

and data tables are included in the source code/documentation.

NOTE: THE NEDQNT.SRC FILE CONTAINS ALL NEED DATA FILES INCLUDING TABLES

OF X-RAY LINE AND ABSORPTION EDGES THE FILE IS \> 7000 LINES LONG AS A
RESULT

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :NTRANS**

**Keywords :XEDS, EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

NTRANS is a computer program which translates manufacturers XEDS and
EELS

spectral data into the EMMPDL data format. It utilies the RWEMMPDL
subroutines

contained in the EMMPDL. At present this version translates both EDAX
and

TRACOR-Northern and Link Systems data files. Examples of translated
spectra

can be found spectra can be found in the XEDS and EELS subdirectories of

the EMMPDL.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title PCEDS**

**Keywords AEM, EDS, X-RAY, CLIFF-LORIMER, THIN FILM,**

**XEDS**

**Computer IBM PC/XT/AT, generic MS-DOS machine**

**Operating System MS-DOS**

**Programming Language Microsoft Fortran v3.31**

**Hardware Needed IBM PC/XT/AT or generic MS-DOS machine,**

**8087 is optional, 256kB min.**

**Authors A.D. Romig, H.O. Colijn**

**Correspondence Addr. Ohio State University, Central Electron**

**Optics Facility, 042 Fontana Labs, 116**

**W. 19th Ave. Columbus, OH 43210-1110**

**(614)292-0674**

Abstract:

This program will calculate composition of thin foils using the

Cliff-Lorimer analysis of x-ray intensities. The inte-

grated intensities of the peaks are entered manually and

the atomic and weight concentrations are calculated using

either empirical or theoretical K-factors. This program

will not do spectral processing (i.e. background subtrac-

tion or peak deconvolution).

Al Romig of Sandia Labs wrote the original version of this

program using DEC PDP-11 Fortran. His work is documented in

Sandia Labs report number SAND82-2938. Henk Colijn of OSU

translated the program to run on an IBM PC using Microsoft

Fortran v3.31 and v4.0. Anyone needing the compiled version

should contact Henk Colijn at the above address. The accompany-

ing PCEDS.DOC file has been formatted to be copied to a

generic printer. If you type the file to your CRT screen,

you will not be able to read all the lines.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :RWEMMDPL**

**Keywords :XEDS, EELS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

RWEMMPDL contains two subroutines which read and write spectral data

files (XEDS or EELS) in the EMMPDL Version 1.1 data format. The data are
stored

as simple ASCII characters at a user defined number of columns per line
for the

length of the data file. The spectral data is preceeded by a series of
header

lines, which tell the user about the parameters of the spectrum. The
header

lines are identified by the first character in the line being the symbol
(#)

followed by a four letter descriptor and if appropriate its units. An
example

of a data file format can be found in the RWEMMPDL.DOC file. Other
examples

spectra can be found in the XEDS and EELS subdirectories of the EMMPDL.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :XEDSDETECT**

**Keywords :XEDS**

**Computer :DEC VAX-11/730 - 11/785 or higher series**

**Operating System :VMS**

**Programming Language :Fortran IV**

**Hardware Requirements :NONE**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Electron Microscopy Center, Materials
Science,**

**:Argonne Nat. Lab, Argonne, IL. 60439 USA**

**:Email: Zaluzec @ ANLEMC (BITNET)**

Abstract:

B\[BXEDSDETECTis a general program which computes the relative detector
efficiency

of Si(Li) and HP Ge EDS detector systems. The user inputs as parameters
the

thickness of the respective detector absorbing layers (Parylene, Al, Be,
Au,

Dead Layer and Active Layer) as well as the energy range and increment
for the

calculation. Output is in simple tabular form listing energy and
relative

efficiency for the chosen parameters.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :XENRGY**

**Keywords :XEDS**

**Computer :DEC VAX 11/730-785, DEC PDP 11/2-11/73**

**Operating System :VAXVMS, RT-11**

**Programming Language :Fortran IV**

**Hardware Requirements :None**

**Author(s) :Nestor J. Zaluzec**

**Correspondence Address :Argonne Nat. Lab, Electron Microscopy
Center,Bldg 212**

**:Materials Science Division, Argonne, Illinois 60439,**

Abstract:

XENRGY.DAT is a data file containing all X-ray Line and Relative

Intensity ratios for elements in the range of H (Z=1) to ES (Z=99). The
table

is stored as simple ASCII characters to allow simple access and file
transfer.

Each element contains 28 entries which correspond to the following lines

KA1, KA2, KB1, KB2, KB3, LA1, LA2, LB1, LB2, LB3, LB4, LB5, LB6, LB7,
LB8, LB9,

LG1, LG2, LG3, LG4, LG5, LG6, LN, LL, MA1, MA2, MB, MG, If an element
doesnot

have a particuliar X-ray line its energy is listed as zero. The program
BXENRGY,

which is given in the XENRGY.SRC file, can be used to create an
efficient

binary file from this ASCII listing, while the subroutine XENRGY can be
used

in a user written program to read the resulting binary file.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: LATTPARM**

**KeyWords: Powder Diffraction, Lattice Parameters**

**Computer: PC, XT, AT**

**Operating System: MS(PC)-DOS**

**Programming Language: TURBO Pascal**

**Hardware: Math Co-Processor desirable**

**Author: Roy Garvey**

**Correspondence Address: Department of Chemistry**

**North Dakota State University**

**Fargo, North Dakota**

**58105 - 5516 U S A**

Using the algorithm of Visser (1969), the problem of finding the

lattice parameters from powder diffraction data becomes one of finding
the

six constants, A, B, C, D, E, and F where

Q(hkl) = 10\*\*4 / d\*\*2 = hh A + kk B + ll C + kl D + hl D + hk F \< 3
\>

The unknown unit cell so derived will be triclinic.

A perfectly general approach to the problem is to first find zones of

the lattice (net-planes of the reciprocal lattice containing the
origin).

Any two such zones will have a line of intersection. If the angle
between

two such zones is found, a reciprocal lattice is determined. Sometimes
this

lattice can be reduced (described on symmetry axes in the reciprocal
lattice).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: Least Squares Unit Cell Refinement with Indexing on the**

**Personal Computer LSUCRIPC**

**KeyWords: Powder Diffraction, Unit Cell Refinement**

**Computer: PC, XY, AT**

**Operating System: MS(PC)-DOS**

**Programming Language: TURBO Pascal**

**Hardware: 192K memory, 1 diskette drive, math coproc.(recommended)**

**Author: Roy Garvey**

**Correspondence Address: Department of Chemistry**

**North Dakota State University**

**Fargo, ND 58105-5516**

Abstract:

L S U C R I P C

A computer program implementing the procedure of

Appleman and Evans (1973) is now available for the

IBM-PC. Output of refinement data has been condensed

for economy of presentation. For a discussion of

methodology, see the USGS-GD-73-003 report number 20 by

Appleman and Evans (1973).

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title BINHEX**

**Keywords ASCII, Hexadecimal, Bitnet**

**Computer IBM PC/XT/AT**

**Operating System MS-DOS**

**Programming Language Turbo Pascal v. 5.0**

**Hardware Needed IBM PC/XT/AT**

**Author H.O. Colijn**

**Correspondence Addr. Ohio State University,**

**Central Electron Optics Facility**

**042 Fontana Labs**

**116 W. 19th Ave. Columbus, OH 43210-1110**

**(614)292-0674**

Abstract:

Some computer networks (such as Bitnet) can transmit ASCII files only.

Others (such as Internet) require a special facility (i.e. ftp) to

transmit binary files, whereas ASCII files can be transmitted easily

using the MAIL facilities. While this allows source code to be trans-

mitted easily, it is difficult to send executable programs, spectral

data files, or archived files. Many word processing programs also use

non-ASCII characters to store document formatting information. It is

difficult for people to exchange information in the format they desire

over computer networks.

This program will convert a binary file to and from the hexadecimal

equivalents of the binary bytes. That is, each byte in the binary

file will be converted into 2 ASCII characters (0-9,A-F) corresponding

to the value of the high and low four bits (respectively) of the

binary value. Thus, regardless of the contents of the original file,

the resulting file is strictly ASCII. Note that this translation

doubles the original size of the file since each byte of the binary

file is converted into 2 ASCII characters, each requiring one byte.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :HP45 Calculator program (enhanced) V1mod6**

**Keywords :HREM, Wavelength, Scherzer, Resolution, hex, oct, bin**

**Computer :anything with F77**

**Operating System :anything with F77**

**Programming Language :Fortran 77**

**Hardware Requirements :CPU, terminal**

**Authors :Tony Pitt, Owen Saxton, Graeme Wood, Mike O\'Keefe, \...**

**Correspondence Address :MAOK@LBL.BITNET**

**:M.A. O\'Keefe, NCEM, LBL 72-213, Berkeley, CA 94720**

Abstract: This is a program designed to emulate a scientific calculator

operating in reverse polish mode (originally based on a HP45, but now
with

many enhancements, including binary, hex, and octal numbers, and
electron

microscope functions like wavelength and resolution). The HELP command

provides one-line explanations of each command. Commands are -

\+ - \* / SQRT REP SIN COS TAN

TYPE DEL PI EXP CLR CUBE SQU REC SWOP

SWAP CHS POC ROLL LOG ALOG ASIN ACOS ATAN

LN OCT HEX X DISP INT COMS BIN DEC

INV DEG RAD D\>R R\>D EXIT WAVL KV SCH

OPT RSCH ROPT STO RCL HELP

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title :HP45 Calculator program (enhanced) V1mod7**

**Keywords :HREM, Wavelength, Scherzer, Resolution, hex, oct, bin**

**Computer :anything with F77**

**Operating System :anything with F77**

**Programming Language :Fortran 77**

**Hardware Requirements :CPU, terminal**

**Authors :Tony Pitt, Owen Saxton, Graeme Wood, Mike O\'Keefe, \...**

**Correspondence Address :MAOK@CSA2.LBL.GOV**

**:M.A. O\'Keefe, NCEM, LBL 72-213, Berkeley, CA 94720**

Abstract: This is a program designed to emulate a scientific calculator

operating in reverse polish mode (originally based on a HP45, but now
with

many enhancements, including binary, hex, and octal numbers, and
electron

microscope functions like wavelength and resolution). The HELP command

provides one-line explanations of each command. Commands are -

\+ - \* / SQRT REP SIN COS TAN

TYPE DEL PI EXP CLR CUBE SQU REC SWOP

SWAP CHS POC ROLL LOG ALOG ASIN ACOS ATAN

LN OCT HEX X DISP INT COMS BIN DEC

INV DEG RAD D\>R R\>D EXIT WAVL KV SCH

OPT RSCH ROPT LIMD LIMA STO RCL HELP

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Title: MacFAC 1.1**

**Keywords: multivariate statistics, data analysis, processing,**

**filtering**

**Computer: MacIntosh II family**

**Operating system: system 7**

**Programming language: THINK C 5.0**

**Hardware requirements: math co-processor**

**Author(s): Noel BONNET & Pierre TREBBIA**

**Correspondence: Faculte des sciences, Universite de Reims,**

**B.P. 347,F51062 Reims cedex FRANCE.**

**Fax: (33) 26 05 32 50,**

**e-mail: pierre.trebbia@univ-reims.fr**

Abstract:

The purpose of MacFAC is to extract orthogonal sources of information
from

data (images, spectra,\...). See any basic statistic book for more

information about multivariate statistics and Factorial Analysis of

Correspondence (FAC). MacFAC is given with a test data set in order to
let

you be sure that it works properly on your own computer. Read the text
file

READ.ME which is embedded in the file MacFAC.sea.hqx for more
information

on how the test must be done.

\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\-\--

**Directory of EMMPDL**

**Directory EMC\$DISK:\[EMMPDL.AES\]**

NO_FILES.;1 0 5-AUG-1986 11:06:19.00

Total of 2 files, 1 block.

**Directory EMC\$DISK:\[EMMPDL.CBED\]**

DIFFRACTIONSUITE.ABS;3

3 17-APR-1991 12:47:34.00 (RWED,RWED,RWE,RWE)

DIFFRACTIONSUITE.DOC;2

132 10-AUG-1989 13:31:46.00 (RWED,RWED,RWE,RWE)

DIFFRACTIONSUITE.SRC;6

93 10-AUG-1989 14:18:28.00 (RWED,RWED,RWE,RWE)

DIFFRACTIONSUITE.TOTAL;1

228 26-NOV-1990 16:44:22.00 (RWED,RWED,RWE,RWE)

MOCBEDOFF.ABS;2 2 17-APR-1991 13:22:51.00 (RWED,RWED,RWE,RWE)

MOCBEDOFF.DOC;1 28 26-NOV-1990 10:30:22.00 (RWED,RWED,RWE,RWE)

MOCBEDOFF.SRC;1 16 26-NOV-1990 10:30:46.00 (RWED,RWED,RWE,RWE)

MOCBEDOFF.TOTAL;1 46 26-NOV-1990 10:32:46.00 (RWED,RWED,RWE,RWE)

MOCBEDON.ABS;2 3 17-APR-1991 13:23:32.00 (RWED,RWED,RWE,RWE)

MOCBEDON.DOC;1 28 26-NOV-1990 10:31:01.00 (RWED,RWED,RWE,RWE)

MOCBEDON.SRC;1 61 26-NOV-1990 10:31:25.00 (RWED,RWED,RWE,RWE)

MOCBEDON.TOTAL;1 91 26-NOV-1990 10:33:00.00 (RWED,RWED,RWE,RWE)

STEREOPROJ.ABS;2 4 17-APR-1991 13:28:10.00 (RWED,RWED,RWE,RWE)

STEREOPROJ.DOC;1 29 5-AUG-1988 09:31:02.00 (RWED,RWED,RWE,RWE)

STEREOPROJ.SRC;1 120 5-AUG-1988 09:28:30.00 (RWED,RWED,RWE,RWE)

STEREOPROJ.TOTAL;1 151 29-MAR-1989 16:44:53.00 (RWED,RWED,RWE,RWE)

STERPROJ.DOC;1 21 25-JUN-1990 13:42:05.00 (RWED,RWED,RWE,RWE)

STERPROJ.SRC;1 133 25-JUN-1990 13:41:27.00 (RWED,RWED,RWE,RWE)

STERPROJ_IBM_V4.ABS;3

3 17-APR-1991 13:28:38.00 (RWED,RWED,RWE,RWE)

STERPROJ_IBM_V4.DOC;1

29 5-JUN-1990 16:48:56.00 (RWED,RWED,RWE,RWE)

STERPROJ_IBM_V4.SRC;1

130 5-JUN-1990 16:49:40.00 (RWED,RWED,RWE,RWE)

STERPROJ_IBM_V4.TOTAL;1

161 25-JUN-1990 13:35:21.00 (RWED,RWED,RWE,RWE)

STERPROJ_MAC.ABS;4 2 17-APR-1991 13:31:13.00 (RWED,RWED,RWE,RWE)

STERPROJ_MAC.DOC;2 19 25-JUN-1990 13:44:51.00 (RWED,RWED,RWE,RWE)

STERPROJ_MAC.SRC;2 132 25-JUN-1990 13:45:29.00 (RWED,RWED,RWE,RWE)

STERPROJ_MAC.TOTAL;2

303 25-JUN-1990 13:46:45.00 (RWED,RWED,RWE,RWE)

TCBED.ABS;4 3 17-APR-1991 13:31:48.00 (RWED,RWED,RWE,RWE)

TCBED.DOC;4 23 10-APR-1989 09:16:50.00 (RWED,RWED,RWE,RWE)

TCBED.SRC;3 75 8-FEB-1990 09:15:11.00 (RWED,RWED,RWE,RWE)

TCBED.TOTAL;5 100 8-FEB-1990 09:19:06.00 (RWED,RWED,RWE,RWE)

Total of 31 files, 2171 blocks.

**Directory EMC\$DISK:\[EMMPDL.CTEM\]**

DOSE.ABS;4 2 17-APR-1991 13:32:53.00 (RWED,RWED,RWE,RWE)

DOSE.DOC;2 2 6-JUN-1990 09:22:00.00 (RWED,RWED,RWE,RWE)

DOSE.SRC;2 13 6-JUN-1990 09:20:40.00 (RWED,RWED,RWE,RWE)

DYNADF.ABS;3 3 17-APR-1991 13:33:26.00 (RWED,RWED,RWE,RWE)

DYNADF.DOC;2 6 6-JUN-1990 09:26:27.00 (RWED,RWED,RWE,RWE)

DYNADF.SRC;2 48 6-JUN-1990 09:25:27.00 (RWED,RWED,RWE,RWE)

MOAUTOCOND.ABS;1 2 17-APR-1991 13:23:32.00 (RWED,RWED,RWED,RWED)

MOAUTOCOND.DOC;3 5 28-APR-1992 12:35:46.64 (RWED,RWED,RWED,RWED)

MOAUTOCOND.SRC;1 20 20-JAN-1992 14:24:36.00 (RWED,RWED,RWED,RWED)

ONEDISANL.ABS;2 3 17-APR-1991 13:37:27.00 (RWED,RWED,RWE,RWE)

ONEDISANL.DOC;1 38 4-AUG-1989 19:50:59.00 (RWED,RWED,RWE,RWE)

ONEDISANL.SRC;1 66 4-AUG-1989 19:55:03.00 (RWED,RWED,RWE,RWE)

ONEDISANL.TOTAL;1 105 8-OCT-1990 10:04:42.00 (RWED,RWED,RWE,RWE)

TWODISANL.ABS;2 3 17-APR-1991 13:38:01.00 (RWED,RWED,RWE,RWE)

TWODISANL.DOC;1 4 4-AUG-1989 20:01:41.00 (RWED,RWED,RWE,RWE)

TWODISANL.SRC;1 78 4-AUG-1989 20:02:03.00 (RWED,RWED,RWE,RWE)

TWODISANL.TOTAL;1 84 8-OCT-1990 10:04:59.00 (RWED,RWED,RWE,RWE)

Total of 18 files, 483 blocks.

**Directory EMC\$DISK:\[EMMPDL.EELS\]**

\$\$EELSDATA.ABS;3 2 17-APR-1991 13:38:56.00 (RWED,RWED,RE,RWE)

\$BE.JOU;1 0 29-MAR-1989 12:57:14.38 (RWED,RWD,,RWE)

\$BE.PDL;2 24 29-MAR-1989 12:57:49.00 (RWED,RWED,RWE,RWE)

\$BE.TMP;1 24 29-MAR-1989 12:57:19.00 (RWED,RWED,RWE,RWE)

\$BN.PDL;2 24 29-MAR-1989 12:58:18.00 (RWED,RWED,RWE,RWE)

\$CAF2.PDL;2 24 29-MAR-1989 12:58:45.00 (RWED,RWED,RWE,RWE)

\$COO.PDL;2 24 29-MAR-1989 12:59:08.00 (RWED,RWED,RWE,RWE)

\$CR.PDL;2 24 29-MAR-1989 12:59:20.00 (RWED,RWED,RWE,RWE)

\$CU.PDL;2 24 29-MAR-1989 12:59:34.00 (RWED,RWED,RWE,RWE)

\$FE.PDL;2 24 29-MAR-1989 13:00:34.00 (RWED,RWED,RWE,RWE)

\$LI.PDL;2 24 29-MAR-1989 13:00:44.00 (RWED,RWED,RWE,RWE)

\$MNO.PDL;2 24 29-MAR-1989 13:00:55.00 (RWED,RWED,RWE,RWE)

\$MO.PDL;2 24 29-MAR-1989 13:01:03.00 (RWED,RWED,RWE,RWE)

\$NB.PDL;2 24 29-MAR-1989 13:01:14.00 (RWED,RWED,RWE,RWE)

\$NIO.PDL;2 24 29-MAR-1989 13:01:23.00 (RWED,RWED,RWE,RWE)

\$SC.PDL;2 24 29-MAR-1989 13:01:36.00 (RWED,RWED,RWE,RWE)

\$TI.PDL;2 24 29-MAR-1989 13:01:45.00 (RWED,RWED,RWE,RWE)

\$TIB.PDL;2 24 29-MAR-1989 13:01:54.00 (RWED,RWED,RWE,RWE)

\$V.PDL;2 24 29-MAR-1989 13:02:02.00 (RWED,RWED,RWE,RWE)

\$ZR.PDL;2 24 29-MAR-1989 13:02:11.00 (RWED,RWED,RWE,RWE)

ELSKKT.ABS;2 2 17-APR-1991 13:40:08.00 (RWED,RWED,RWE,RWE)

ELSKKT.DOC;1 20 8-NOV-1990 14:41:02.00 (RWED,RWED,RWE,RWE)

ELSKKT.SRC;1 93 8-NOV-1990 14:41:17.00 (RWED,RWED,RWE,RWE)

ELSKKT.TOTAL;1 115 8-NOV-1990 14:43:44.00 (RWED,RWED,RWE,RWE)

EMMFF.ABS;1 4 29-OCT-1991 13:10:07.00 (RWED,RWED,RWED,RWED)

EMMFF.DOC;1 74 29-OCT-1991 13:10:45.00 (RWED,RWED,RWED,RWED)

EMMFF.SRC;1 329 29-OCT-1991 15:34:36.00 (RWED,RWED,RWED,RWED)

FOR008.DAT;1 2 18-JAN-1991 17:04:15.00 (RWED,RWED,RWE,RWE)

NEDQNT.OUTPUT;1 1 4-APR-1989 20:47:30.00 (RWED,RWED,RWE,RWE)

NELSV21.ABS;3 3 17-APR-1991 13:40:55.00 (RWED,RWED,RWE,RWE)

NELSV21.DOC;5 35 31-MAY-1988 14:34:41.00 (RWED,RWED,RWE,RWE)

NELSV21.SRC;2 233 11-MAY-1988 12:59:08.00 (RWED,RWED,RWE,RWE)

NELSV21.TOTAL;1 270 29-MAR-1989 16:47:26.00 (RWED,RWED,RWE,RWE)

NTLAMDA.ABS;4 3 17-APR-1991 13:41:36.00 (RWED,RWED,RWE,RWE)

NTLAMDA.DOC;4 9 22-MAR-1988 23:08:18.00 (RWED,RWED,RWE,RWE)

NTLAMDA.SRC;6 31 28-MAR-1989 14:19:31.00 (RWED,RWED,RWE,RWE)

NTLAMDA.TOTAL;1 41 29-MAR-1989 16:47:35.00 (RWED,RWED,RWE,RWE)

NTRANS.ABS;4 2 17-APR-1991 13:42:11.00 (RWED,RWED,RWE,RWE)

NTRANS.DOC;3 5 30-JUN-1989 10:14:03.00 (RWED,RWED,RWE,RWE)

NTRANS.SRC;5 98 17-JAN-1990 22:51:52.00 (RWED,RWED,RWE,RWE)

NTRANS.TOTAL;4 128 17-JAN-1990 22:55:34.00 (RWED,RWED,RWE,RWE)

PINT.ABS;2 4 17-APR-1991 13:42:47.00 (RWED,RWED,RWE,RWE)

PINT.DOC;1 44 16-MAR-1989 10:42:04.00 (RWED,RWED,RWE,RWE)

PINT.SRC;1 121 16-MAR-1989 10:41:16.00 (RWED,RWED,RWE,RWE)

PINT.TOTAL;1 167 29-MAR-1989 16:47:15.00 (RWED,RWED,RWE,RWE)

PTEELS.ABS;2 3 17-APR-1991 13:43:42.00 (RWED,RWED,RWE,RWE)

PTEELS.DOC;1 3 23-MAR-1988 15:21:29.00 (RWED,RWED,RWE,RWE)

PTEELS.SRC;1 96 23-MAR-1988 15:16:17.00 (RWED,RWED,RWE,RWE)

PTEELS.TOTAL;1 101 29-MAR-1989 16:46:38.00 (RWED,RWED,RWE,RWE)

PTETHA.ABS;2 2 17-APR-1991 13:44:24.00 (RWED,RWED,RWE,RWE)

PTETHA.DOC;1 3 23-MAR-1988 15:24:02.00 (RWED,RWED,RWE,RWE)

PTETHA.SRC;1 17 23-MAR-1988 15:26:43.00 (RWED,RWED,RWE,RWE)

PTETHA.TOTAL;1 20 29-MAR-1989 16:46:57.00 (RWED,RWED,RWE,RWE)

PTLIMIT.ABS;2 3 17-APR-1991 13:45:14.00 (RWED,RWED,RWE,RWE)

PTLIMIT.DOC;1 3 23-MAR-1988 15:23:54.00 (RWED,RWED,RWE,RWE)

PTLIMIT.SRC;1 12 23-MAR-1988 15:24:17.00 (RWED,RWED,RWE,RWE)

PTLIMIT.TOTAL;1 16 29-MAR-1989 16:46:25.00 (RWED,RWED,RWE,RWE)

PTQUANTI.ABS;2 3 17-APR-1991 13:48:08.00 (RWED,RWED,RWE,RWE)

PTQUANTI.DOC;1 3 23-MAR-1988 15:23:46.00 (RWED,RWED,RWE,RWE)

PTQUANTI.SRC;1 31 23-MAR-1988 15:21:53.00 (RWED,RWED,RWE,RWE)

PTQUANTI.TOTAL;1 36 29-MAR-1989 16:46:16.00 (RWED,RWED,RWE,RWE)

PTSELECT.ABS;2 3 17-APR-1991 13:49:21.00 (RWED,RWED,RWE,RWE)

PTSELECT.DOC;1 3 23-MAR-1988 15:24:09.00 (RWED,RWED,RWE,RWE)

PTSELECT.SRC;1 34 23-MAR-1988 15:24:54.00 (RWED,RWED,RWE,RWE)

PTSELECT.TOTAL;1 39 29-MAR-1989 16:46:04.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.ABS;5 3 17-APR-1991 13:49:55.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.DOC;4 33 16-MAR-1989 22:33:13.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.SRC;5 30 16-MAR-1989 22:30:02.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.TOTAL;1 66 29-MAR-1989 16:45:54.00 (RWED,RWED,RWE,RWE)

TRANSPORT.ABS;4 3 17-APR-1991 13:50:25.00 (RWED,RWED,RWE,RWE)

TRANSPORT.DOC;6 295 5-SEP-1986 11:49:00.00 (RWED,RWED,RWE,RWE)

TRANSPORT.SRC;2 993 5-SEP-1986 11:50:33.00 (RWED,RWED,RWE,RWE)

TRANSPORT.TOTAL;1 1290 29-MAR-1989 16:45:39.00 (RWED,RWED,RWE,RWE)

Total of 74 files, 5417 blocks.

**Directory EMC\$DISK:\[EMMPDL.GRPH\]**

NGRAPH.ABS;8 3 17-APR-1991 13:51:53.00 (RWED,RWED,RWE,RWE)

NGRAPH.DOC;4 8 5-AUG-1986 23:07:38.00 (RWED,RWED,RWE,RWE)

NGRAPH.SRC;6 159 19-AUG-1991 09:25:33.00 (RWED,RWED,RWE,RWE)

NGRAPH.TOTAL;2 169 17-APR-1991 13:51:53.00 (RWED,RWED,RWE,RWE)

NGTEST.ABS;3 3 17-APR-1991 13:56:37.00 (RWED,RWED,RWE,RWE)

NGTEST.DOC;2 4 5-AUG-1986 23:15:07.00 (RWED,RWED,RWE,RWE)

NGTEST.SRC;2 13 5-AUG-1986 23:21:46.00 (RWED,RWED,RWE,RWE)

NGTEST.TOTAL;1 19 29-MAR-1989 16:53:16.00 (RWED,RWED,RWE,RWE)

Total of 9 files, 379 blocks.

**Directory EMC\$DISK:\[EMMPDL.HREM\]**

ATMSCAT.ABS;2 2 17-APR-1991 13:58:06.00 (RWED,RWD,R,RWE)

ATMSCAT.DOC;1 5 26-FEB-1990 12:26:51.00 (RWED,RWD,R,RWE)

ATMSCAT.SRC;1 90 26-FEB-1990 12:26:45.00 (RWED,RWD,R,RWE)

ATMSCAT.TOTAL;1 96 26-FEB-1990 12:34:10.00 (RWED,RWED,RWE,RWE)

FSCATT.ABS;2 3 27-JAN-1992 09:50:20.00 (RWE,RWED,RWE,E)

FSCATT.DOC;7 6 27-JAN-1992 09:50:05.00 (RWE,RWED,RWE,E)

FSCATT.SRC;2 38 27-JAN-1992 10:19:28.00 (RWE,RWED,RWE,E)

FSCATT.TOTAL;1 46 27-JAN-1992 10:20:37.00 (RWE,RWED,RWE,E)

Total of 9 files, 287 blocks.

**Directory EMC\$DISK:\[EMMPDL.HVEM\]**

DMOTTCS.ABS;2 2 17-APR-1991 14:08:42.00 (RWED,RWED,RWE,RWE)

DMOTTCS.DOC;1 9 9-FEB-1988 13:24:39.00 (RWED,RWED,RWE,RWE)

DMOTTCS.SRC;1 41 9-FEB-1988 12:47:23.00 (RWED,RWED,RWE,RWE)

DMOTTCS.TOTAL;1 51 29-MAR-1989 16:50:33.00 (RWED,RWED,RWE,RWE)

RECOIL.ABS;2 3 18-APR-1991 11:15:30.00 (RWED,RWED,RWE,RWE)

RECOIL.DOC;1 11 16-MAR-1989 10:51:20.00 (RWED,RWED,RWE,RWE)

RECOIL.SRC;1 44 16-MAR-1989 10:51:47.00 (RWED,RWED,RWE,RWE)

RECOIL.TOTAL;1 56 29-MAR-1989 16:50:42.00 (RWED,RWED,RWE,RWE)

TOTCS.ABS;8 3 18-APR-1991 11:16:22.00 (RWED,RWED,RWE,RWE)

TOTCS.DOC;13 14 9-FEB-1988 13:24:16.00 (RWED,RWED,RWE,RWE)

TOTCS.SRC;9 58 9-FEB-1988 12:45:46.00 (RWED,RWED,RWE,RWE)

TOTCS.TOTAL;1 74 29-MAR-1989 16:50:50.00 (RWED,RWED,RWE,RWE)

Total of 13 files, 367 blocks.

**Directory EMC\$DISK:\[EMMPDL.IMAG\]**

DIR_FILE.RSC;1 1 3-AUG-1989 09:22:21.00 (RWED,RWD,R,RWE)

GIFSTD.ABS;3 2 18-APR-1991 11:19:26.00 (RWED,RWED,RWE,RWE)

GIFSTD.DOC;1 62 23-MAR-1988 22:29:02.00 (RWED,RWED,RWE,RWE)

GIFSTD.SRC;2 2 23-MAR-1988 22:38:18.00 (RWED,RWED,RWE,RWE)

GIFSTD.TOTAL;1 65 29-MAR-1989 16:54:34.00 (RWED,RWED,RWE,RWE)

HTPSG.ABS;2 2 18-APR-1991 11:20:52.00 (RWED,RWED,RWE,RWE)

HTPSG.DOC;1 19 29-JAN-1990 14:39:55.00 (RWED,RWED,RWE,RWE)

HTPSG.SRC;1 97 29-JAN-1990 14:40:13.00 (RWED,RWED,RWE,RWE)

ICOS128.ABS;2 2 18-APR-1991 11:21:45.00 (RWED,RWED,RWE,RWE)

ICOS128.DOC;1 2 29-JAN-1990 14:41:48.00 (RWED,RWED,RWE,RWE)

ICOS128.SRC;1 70 29-JAN-1990 14:41:50.00 (RWED,RWED,RWE,RWE)

IMAGE103.ABS;4 3 18-APR-1991 11:24:57.00 (RWED,RWED,RWE,RWE)

IMAGE103.DOC;1 98 30-MAR-1989 18:41:59.00 (RWED,RWED,RWE,RWE)

IMAGE103.SRC;2 615 3-APR-1989 08:22:51.00 (RWED,RWED,RWE,RWE)

IMAGE114B.ABS;3 3 18-APR-1991 11:22:54.00 (RWED,RWED,RWE,RWE)

IMAGE114B.DOC;2 98 3-AUG-1989 11:02:31.00 (RWED,RWED,RWE,RWE)

IMAGE114B.HEX;1 1254 3-AUG-1989 10:51:51.00 (RWED,RWED,RWE,RWE)

IMAGE114B.SRC;3 760 3-AUG-1989 10:48:51.00 (RWED,RWED,RWE,RWE)

IMAGE124.INFO;1 9 1-FEB-1990 13:40:36.00 (RWED,RWED,RWE,RWE)

IMAGE125.ABS;4 3 18-APR-1991 11:23:41.00 (RWED,RWED,RWE,RWE)

IMAGE125.DOC;4 204 6-JUN-1990 09:28:18.00 (RWED,RWED,RWE,RWE)

IMAGE125.SRC;4 1053 5-JUN-1990 13:52:15.00 (RWED,RWED,RWE,RWE)

IMAGE125.TOTAL;1 1259 5-JUN-1990 14:32:31.00 (RWED,RWED,RWE,RWE)

IMAGE125A.HEX;1 350 2-FEB-1990 15:55:22.00 (RWED,RWED,RWE,RWE)

IMAGE125B.HEX;1 428 2-FEB-1990 15:55:45.00 (RWED,RWED,RWE,RWE)

IMAGE125C.HEX;1 522 2-FEB-1990 15:56:06.00 (RWED,RWED,RWE,RWE)

IMAGE125D.HEX;1 634 2-FEB-1990 15:56:25.00 (RWED,RWED,RWE,RWE)

IMAGE133.2TWO;1 64 6-JUN-1991 12:58:30.00 (RWED,RWED,RWE,RWE)

IMAGE133.ONE;1 418 26-DEC-1990 08:45:56.00 (RWED,RWED,RWE,RWE)

IMAGE133.THREE;1 821 26-DEC-1990 08:46:33.00 (RWED,RWED,RWE,RWE)

IMAGE133.TWO;2 566 6-JUN-1991 13:00:07.00 (RWED,RWED,RWE,RWE)

IMAGE138A.HEX;1 835 1-JUL-1991 09:04:27.00 (RWED,RWED,RWE,RWE)

IMAGE138B.HEX;1 690 1-JUL-1991 09:05:04.00 (RWED,RWED,RWE,RWE)

IMAGE138C.HEX;1 442 1-JUL-1991 09:06:24.00 (RWED,RWED,RWE,RWE)

IMAGE155.HEX;1 442 1-JUL-1994 09:06:24.00 (RWED,RWED,RWE,RWE)

Total of 35 files, 11457 blocks.

**Directory EMC\$DISK:\[EMMPDL.INFO\]**

BENCHMARKS.ABS;3 3 18-APR-1991 11:25:38.00 (RWED,RWED,RWE,RWE)

BENCHMARKS.DOC;2 135 28-OCT-1987 16:38:48.00 (RWED,RWED,RWE,RWE)

BENCHMARKS.SRC;2 28 28-OCT-1987 16:53:02.00 (RWED,RWED,RWE,RWE)

BENCHMARKS.TOTAL;1 164 29-MAR-1989 16:55:09.00 (RWED,RWED,RWE,RWE)

EMMFF.ABS;1 4 29-OCT-1991 13:10:07.00 (RWED,RWED,RWED,RWED)

EMMFF.DOC;1 74 29-OCT-1991 13:10:45.00 (RWED,RWED,RWED,RWED)

EMMFF.SRC;1 329 29-OCT-1991 15:34:36.00 (RWED,RWED,RWED,RWED)

JOURNALARTICLES.ABS;4

2 18-APR-1991 11:26:18.00 (RWED,RWED,RWE,RWE)

JOURNALARTICLES.DOC;2

7 25-MAR-1988 12:15:15.00 (RWED,RWED,RWE,RWE)

JOURNALARTICLES.SRC;2

2 25-MAR-1988 16:16:02.00 (RWED,RWED,RWE,RWE)

JOURNALARTICLES.TOTAL;1

11 29-MAR-1989 16:55:26.00 (RWED,RWED,RWE,RWE)

Total of 12 files, 760 blocks.

**Directory EMC\$DISK:\[EMMPDL.MISC\]**

BINHEX.ABS;4 4 18-APR-1991 12:07:33.00 (RWED,RWED,RWE,RWE)

BINHEX.BIN;1 25 27-DEC-1990 14:55:40.00 (RWED,RWED,RWE,RWE)

BINHEX.DOC;1 24 27-DEC-1990 14:37:18.00 (RWED,RWED,RWE,RWE)

BINHEX.SRC;1 24 27-DEC-1990 14:37:37.00 (RWED,RWED,RWE,RWE)

BINHEX.TOTAL;1 51 27-DEC-1990 14:38:14.00 (RWED,RWED,RWE,RWE)

HP.ABS;1 3 26-MAY-1988 16:28:59.00 (RWED,RWED,RWE,RWE)

HP.SRC;1 52 26-MAY-1988 17:10:01.00 (RWED,RWED,RWE,RWE)

HP.TOTAL;1 64 29-MAR-1989 16:53:55.00 (RWED,RWED,RWE,RWE)

HPV17.ABS;3 3 1-JUL-1991 09:21:19.00 (RWED,RWED,RWE,RWE)

HPV17.DOC;2 12 1-JUL-1991 09:18:07.00 (RWED,RWED,RWE,RWE)

HPV17.SRC;2 63 26-JUN-1991 20:23:23.00 (RWED,RWED,RWE,RWE)

HPV17.TOTAL;1 78 1-JUL-1991 09:22:05.00 (RWED,RWED,RWE,RWE)

MACFAC.ABS;1 4 1-NOV-1993 14:35:24.99 (RWE,RWED,RWE,E)

MACFAC.DOC;1 3 1-NOV-1993 14:35:01.42 (RWE,RWED,RWE,E)

MACFAC.HQX;1 397 1-NOV-1993 14:35:50.65 (RWE,RWED,RWE,E)

MACFAC.SRC;1 54 1-NOV-1993 14:35:35.61 (RWE,RWED,RWE,E)

MACFAC.TOTAL;1 60 2-DEC-1993 20:05:34.99 (RWE,RWED,RWE,E)

Total of 18 files, 922 blocks.

**Directory EMC\$DISK:\[EMMPDL.SAED\]**

NO_FILES.;1 0 5-AUG-1986 11:06:19.00 (RWED,RWED,RWE,RWE)

Total of 2 files, 1 block.

**Directory EMC\$DISK:\[EMMPDL.SEM\]**

NO_FILES.;1 0 5-AUG-1986 11:06:19.00 (RWED,RWED,RWE,RWE)

Total of 2 files, 1 block.

**Directory EMC\$DISK:\[EMMPDL.STEM\]**

NO_FILES.;1 0 5-AUG-1986 11:06:19.00 (RWED,RWED,RWE,RWE)

Total of 2 files, 1 block.

**Directory EMC\$DISK:\[EMMPDL.XEDS\]**

ATMLVL.ABS;5 3 26-JUL-1987 22:45:17.00 (RWED,RWED,RWE,RWE)

ATMLVL.DAT;1 151 11-JUN-1987 10:45:21.00 (RWED,RWED,RWE,RWE)

ATMLVL.DOC;2 3 26-JUL-1987 22:33:35.00 (RWED,RWED,RWE,RWE)

ATMLVL.SRC;4 8 26-JUL-1987 22:08:07.00 (RWED,RWED,RWE,RWE)

ATMLVL.TOTAL;1 163 29-MAR-1989 16:48:30.00 (RWED,RWED,RWE,RWE)

CLEDX.ABS;3 4 18-APR-1991 11:30:57.00 (RWED,RWED,RWE,RWE)

CLEDX.DOC;2 28 29-JAN-1990 14:22:36.00 (RWED,RWED,RWE,RWE)

CLEDX.SRC;2 194 29-JAN-1990 14:23:26.00 (RWED,RWED,RWE,RWE)

CLEDX.TOTAL;1 226 29-JAN-1990 14:24:48.00 (RWED,RWED,RWE,RWE)

DAVIDSON.ABS;1 10 24-AUG-1993 09:51:32.35 (RWE,RWED,RWE,E)

DCJAEMMC.ABS;2 3 18-APR-1991 11:31:31.00 (RWED,RWED,RWE,RWE)

DCJAEMMC.DOC;1 17 27-DEC-1990 14:48:08.00 (RWED,RWED,RWE,RWE)

DCJAEMMC.SRC;1 56 27-DEC-1990 14:48:22.00 (RWED,RWED,RWE,RWE)

DCJAEMMC.TOTAL;1 74 27-DEC-1990 14:51:02.00 (RWED,RWED,RWE,RWE)

DJAEMMC.BIN;1 90 27-DEC-1990 14:52:50.00 (RWED,RWED,RWE,RWE)

EMMFF.ABS;1 4 29-OCT-1991 13:10:07.00 (RWED,RWED,RWED,RWED)

EMMFF.DOC;1 74 29-OCT-1991 13:10:45.00 (RWED,RWED,RWED,RWED)

EMMFF.SRC;1 329 29-OCT-1991 15:34:36.00 (RWED,RWED,RWED,RWED)

EMMFF.TOTAL;1 407 12-MAY-1992 14:17:31.17 (RWE,RWED,RWE,E)

NEDQNT.ABS;1 3 11-JUN-1987 10:44:17.00 (RWED,RWED,RWE,RWE)

NEDQNT.DOC;5 33 11-JUN-1987 12:31:48.00 (RWED,RWED,RWE,RWE)

NEDQNT.SRC;3 574 30-JAN-1991 16:05:55.00 (RWED,RWED,RWE,RWE)

NEDQNT.TOTAL;2 609 30-JAN-1991 16:07:00.00 (RWED,RWED,RWE,RWE)

NEDSLIB.SRC;5 93 8-SEP-1986 09:54:57.00 (RWED,RWED,RWE,RWE)

NTRANS.ABS;5 2 18-APR-1991 11:32:41.00 (RWED,RWED,RWE,RWE)

NTRANS.DOC;5 5 30-JUN-1989 10:14:03.00 (RWED,RWED,RWE,RWE)

NTRANS.SRC;5 98 17-JAN-1990 22:51:52.00 (RWED,RWED,RWE,RWE)

NTRANS.TOTAL;4 128 17-JAN-1990 22:55:34.00 (RWED,RWED,RWE,RWE)

PCEDS.ABS;3 4 18-APR-1991 11:37:39.00 (RWED,RWED,RWE,RWE)

PCEDS.BIN;1 126 16-MAR-1989 12:57:28.00 (RWED,RWED,RWE,RWE)

PCEDS.CFG;2 1 26-SEP-1988 13:43:07.00 (RWED,RWED,RWE,RWE)

PCEDS.DOC;1 76 26-SEP-1988 13:32:28.00 (RWED,RWED,RWE,RWE)

PCEDS.SRC;1 86 26-SEP-1988 13:38:15.00 (RWED,RWED,RWE,RWE)

PCEDS.TOTAL;1 290 29-MAR-1989 16:49:29.00 (RWED,RWED,RWE,RWE)

PCEDS87.BIN;1 111 16-MAR-1989 12:57:29.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.ABS;5 3 18-APR-1991 11:38:15.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.DOC;4 33 16-MAR-1989 22:33:13.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.SRC;6 30 16-MAR-1989 22:30:02.00 (RWED,RWED,RWE,RWE)

RWEMMPDL.TOTAL;1 66 29-MAR-1989 16:50:00.00 (RWED,RWED,RWE,RWE)

XEDSDETECT.ABS;3 2 18-APR-1991 11:38:57.00 (RWED,RWED,RWE,RWE)

XEDSDETECT.DOC;2 6 3-APR-1989 23:31:04.00 (RWED,RWED,RWE,RWE)

XEDSDETECT.SRC;5 41 30-JAN-1991 16:29:11.00 (RWED,RWED,RWE,RWE)

XEDSDETECT.TOTAL;1 48 30-JAN-1991 16:30:24.00 (RWED,RWED,RWE,RWE)

XENRGY.ABS;4 3 18-APR-1991 11:40:08.00 (RWED,RWED,RWE,RWE)

XENRGY.DAT;1 282 11-JUN-1987 10:44:57.00 (RWED,RWED,RWE,RWE)

XENRGY.DOC;2 3 26-JUL-1987 23:09:13.00 (RWED,RWED,RWE,RWE)

XENRGY.SRC;2 11 26-JUL-1987 22:50:17.00 (RWED,RWED,RWE,RWE)

XENRGY.TOTAL;1 298 29-MAR-1989 16:49:13.00 (RWED,RWED,RWE,RWE)

Total of 49 files, 4912 blocks.

**Directory EMC\$DISK:\[EMMPDL.XRD\]**

LATTPARM.ABS;3 3 18-APR-1991 11:41:23.00 (RWED,RWED,RWE,RWE)

LATTPARM.DOC;2 62 28-OCT-1987 22:17:57.00 (RWED,RWED,RWE,RWE)

LATTPARM.SRC;2 232 28-OCT-1987 22:16:41.00 (RWED,RWED,RWE,RWE)

LATTPARM.TOTAL;1 296 29-MAR-1989 16:51:18.00 (RWED,RWED,RWE,RWE)

LSUCRIPC.ABS;2 3 18-APR-1991 11:48:12.00 (RWED,RWED,RWE,RWE)

LSUCRIPC.DOC;3 30 18-APR-1991 11:46:46.00 (RWED,RWED,RWE,RWE)

LSUCRIPC.SRC;2 112 28-OCT-1987 22:23:21.00 (RWED,RWED,RWE,RWE)

LSUCRIPC.TOTAL;1 143 29-MAR-1989 16:51:30.00 (RWED,RWED,RWE,RWE)

Total of 9 files, 882 blocks.