## Nobumichi Tamura Selected Publications

##### 1.-'Submicron X-Ray Diffraction and its Applications to Problems in Materials and Environmental Science'

N. Tamura; R. Spolenak, B.C. Valek; A. Manceau; M. Meier Chang; R.S.
Celestre; A.A. MacDowell; H.A. Padmore and J.R. Patel; Review of
Scientific Instruments **73** (2002) 1369-1372.

2.-'High Spatial Resolution Grain Orientation and Strain Mapping in Thin
Films using Polychromatic Submicron X-ray Diffraction'

N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.C. Valek, J.C.
Bravman, R. Spolenak, W.L. Brown, T. Marieb, H. Fujimoto, B.W. Batterman
and J.R. Patel, Appl. Phys. Lett. **80** (2002) 3724-3727.

3.-'Deciphering Ni sequestration in soil ferromanganese nodules by
combining x-ray fluorescence, absorption and diffraction at micrometer
scales of resolution'

A. Manceau, N. Tamura, M. A. Marcus, A.A. MacDowell, R.S. Celestre, R.E.
Sublett, G.S. Sposito, H.A. Padmore, American Mineralogist **87** (2002)
1494-1499.

##### 4.-'Quantitative speciation of heavy metals in soils and sediments by synchrotron X-ray techniques'

A. Manceau, M. A. Marcus, and N. Tamura,

In *Applications of Synchrotron Radiation in Low-Temperature
Geochemistry and Environmental Science*, (ed. P. A. Fenter, M. L.
Rivers, N. C. Sturchio, and S. R. Sutton), Reviews in Mineralogy and
Geochemistry, Mineralogical Society of America., Vol **49** (2002)
341-428.

## *5.-'Electromigration-Induced Plastic Deformation in Passivated Metal Lines'*

B.C. Valek, J.C. Bravman, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A.
Padmore, R. Spolenak, W.L. Brown, B.W. Batterman and J.R. Patel, Appl.
Phys. Lett. **81** (2002) 4168-4170. .

*6.-'Molecular-Scale Speciation of Zn and Ni in Soil Ferromanganese
Nodules from Loess Soils of the Mississippi Bassin'*

A. Manceau, N. Tamura, R.S. Celestre, A.A. MacDowell, N. Geoffroy, G.
Sposito and H.A. Padmore, Environmental Science and Technology **37**
(2003) 75-80.

*7.-'Scanning X-ray Microdiffraction with submicron white beam for
strain/stress and orientation mapping in thin films'*

N. Tamura, A.A. MacDowell, R. Spolenak, B.C. Valek, J. C. Bravman, W.L.
Brown, R. S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel, J.
of Synchrotron Radiation **10** (2003) 137-143.

##### 8.-'Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction'

R. Spolenak, W.L. Brown, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A.
Padmore, B.C. Valek, J.C. Bravman, T. Marieb, H. Fujimoto, B.W.
Batterman, and J.R. Patel, Phys. Rev. Lett. **90** (2002) 096102-1-4.

*9.- 'Quantitative Analysis of Dislocation Arrangements induced by
Electromigration in a passivated Al (0.5wt% Cu) Interconnect'*

R.I. Barabash, G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, R.
Spolenak and J.R. Patel, *J. Appl. Phys.* **93** (2003) 5701-5706.

*10.- 'Direct Measurement of Triaxial Strain Fields around Ferroelectric
Domains Using X-Ray Microdiffraction'*

R. C. Rogan, N. Tamura, G. A. Swift and E. Üstündag, *Nature Materials*
**2** (2003) 379-381.

*11.- 'Mesoscale x-ray diffraction measurement of stress relaxation
associated with buckling in compressed thin films'*

P. Goudeau, P. Villain, N. Tamura and H.A. Padmore, *Appl. Phys. Lett*.
**83** (2003) 51-53.

*12.- 'Early Stage of Plastic Deformation in Thin Films Undergoing
Electromigration'*

B. C. Valek, N. Tamura, R. Spolenak, W.A. Caldwell, J.C. Bravman, A.A.
MacDowell, R.S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel,
*J. Appl. Phys.* **94** (2003) 3757-3761.

*13.- 'Twinning in La~0.95~Sr~0.05~Ga~0.9~Mg~0.1~O~2.92~ crystals
studied by white beam (Laue) X-Ray Microdiffraction'*

D.Savytskii, D. Trots, L.Vasylechko, N.Tamura and M.Berkowski, *J. Appl.
Cryst.* 36 (2003) 1197-1203.

*14.- 'Synchrotron radiation micro-diffraction study of Sn whiskers on
Pb-free surface finish'*

W.J. Choi, T.Y. Lee, K.N. Tu, N. Tamura, R.S. Celestre, A.A. MacDowell,
Y.Y. Bong and L. Nguyen, *Acta Materialia* (2003) in press.