[^1]LIST OF RADIATION HARDNESS ASSURANCE RELATED DOCUMENTS

**MILITARY PERFORMANCE SPECIFICATIONS**

19500, General Specification for Semiconductor Devices.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-PRF-19500>)

38510, General Specification for Microcircuits.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-M-38510>)

38534, Performance Specification for Hybrid Microcircuits.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-PRF-38534>)

38535, General Specification for Integrated Circuits (Microcircuits)
Manufacturing.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-PRF-38535>)

**MILITARY HANDBOOKS**

814, Ionizing Dose and Neutron HA Guidelines for Microcircuits and
Semiconductor Devices.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-HDBK-814>)

815, Dose Rate HA Guidelines.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-HDBK-815>)

816, Guidelines for Developing Radiation Hardness Assured Device
Specifications.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-HDBK-816>)

817, System Development Radiation Hardness Assurance.
(<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-HDBK-817>)

339, Custom Large Scale Integrated Circuits Development and Acquisition
for Space Vehicles,
(<http://combatindex.com/mil_docs/pdf/Hopper/MIL-HDBK/CI-339-MH-9849-0284.pdf>)

1547, Electronic Parts, Materials, and Processes for Space and Launch
Vehicles,
(<http://ax.losangeles.af.mil/se_revitalization/aa_functions/parts/Attachments/1547C.DOC>)

1766, Nuclear Hardness and Survivability Program Guidelines for ICBM
Weapon Systems and Space Systems.

# MILITARY TEST METHODS

[IN MIL-STD-750]{.underline} (Test Methods for Semiconductor Devices,
<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-STD-750>):

1017, Neutron Irradiation Procedure

1019, Ionizing Radiation (Total Dose) Test Procedure

1032, Package Induce Soft Error Test Procedure (Due To Alpha Particles)

1080, Single Event Burnout and Single Event Gate Rupture

3478, Power MOSFET Electrical Dose Rate Test Method

5001, Wafer Lot Acceptance Testing

[IN MIL-STD-883]{.underline} (Test Methods and Procedures for
Microelectronics,
<http://www.dscc.dla.mil/Programs/MilSpec/listdocs.asp?BasicDoc=MIL-STD-883>):

1017, Neutron Irradiation Procedure

1019, Ionizing Radiation (Total Dose) Test Procedure

1020, Dose Rate Induced Latchup Test Procedure

1021, Dose Rate Upset Testing of Digital Microcircuits

1023, Dose Rate Response of Linear Microcircuits

5004, Screening Procedures

5005, Qualification and Quality Conformance Procedures

5010, Test Procedures for Complex Monolithic Microcircuits

Military standards, specifications, and handbooks can also be viewed and
ordered from the Web site of the DoD Document Automation and Production
Services ([http://www.dodssp.daps.mil](http://www.dodssp.daps.mil/)),
Bldg. 4/D (DPM-DODSSP), 700 Robbins Ave., Philadelphia, PA 19111-5094.
For assistance, one can phone their help line at 215-697-2179 or Fax
--1462.

**DTRA DOCUMENTS**

DNA-H-93-52, Program Management Handbook on Nuclear Survivability.

DNA-H-95-61, Transient Radiation Effects on Electronics (TREE) Handbook.

DNA-H-93-140, Military Handbook for Hardness Assurance, Maintenance and
Surveillance (HAMS).

DTRA documents can be obtained from the Defense Technical Information
Center (DTIC). Phone 800-225-3842.

# NASA DOCUMENTS

Proton Testing Lessons Learned,
<http://radhome.gsfc.nasa.gov/radhome/papers/Proton_testing_guidelines_2002.pdf>

**ASTM STANDARDS**

The scope and referenced documents sections of each standard can be seen
at [http://www.astm.org](http://www.astm.org/). One can also purchase
the entire standard at that site.

The following are test and measurement standards. They are under the
oversight of ASTM Subcommittee F1.11, Nuclear and Space Radiation
Effects; Chairman, William Alfonte, 410-326-6044 or salishan@olg.com.

F448, Test Method for Measuring Steady-State Primary Photocurrent. 3

F526, Test Method for Measuring Dose for Use in Linear Acceleration
Pulsed Radiation Effects Tests.

F528, Test Method of Measurement of Common-Emitter D-C Current Gain of
Junction Transistors.

F615, Practice for Determining Safe Current Pulse Operating Regions for
Metallization on Semiconductor Components.

F616, Test Method for Measuring MOSFET Drain Leakage Current.

F617, Test Method for Measuring MOSFET Linear Threshold Voltage.

F676, Test Method for Measuring Unsaturated TTL Sink Current.

F744, Test Method for Measuring Dose Rate Threshold for Upset of Digital
Integrated Circuits.

F769, Test Method for Measuring Transistor and Diode Leakage Currents.

F773, Practice for Measuring Dose Rate Response of Linear Integrated
Circuit.

F980, Guide for the Measurement of Rapid Annealing of Neutron-Induced
Displacement Damage in Silicon Semiconductor Devices.

F996, Test Method for Separating an Ionizing Radiation-Induced MOSFET
Threshold Voltage Shift into Components Due to Oxide Trapped Holes and
Interface States Using the Subthreshold Current-Voltage Characteristics.

F1190, Practice for the Neutron Irradiation of Unbiased Electronic
Components.

F1192, Guide for the Measurement of Single Event Phenomena (SEP) Induced
by Heavy Ion Irradiation of Semiconductor Devices.

F1262, Guide for Transient Radiation Upset Threshold Testing of Digital
Integrated Circuits.

F1263, Test Method for Analysis of Overtest Data in Radiation Testing of
Electronic Parts.

F1467, Guide for Use of an X-Ray Tester (\~10 keV Photons) in Ionizing
Radiation Effects Testing of Semiconductor Devices and Microcircuits.

F1892, Guide for Ionizing Radiation (Total Dose) Effects Testing of
Semiconductor Devices.

F1893, Guide for the Measurement of Ionizing Dose-Rate Burnout of
Semiconductor Devices.

 

The following are radiation dosimetry standards. They are under the
oversight of ASTM Subcommittee E10.07, Radiation Dosimetry for Radiation
Effects on Materials and Devices; Chairman, Dr. Dave Vehar, 505-845-3414
or dwvehar@sandia.gov.

E265, Test Method for Measuring Reaction Rates and Fast-Neutron Fluences
by Radioactivation of Sulfur-32.

E496, Test Method for Measuring Neutron Fluence Rate and Average Energy
from ^3^H(d,n)^4^He Neutron Generators by Radioactivation Techniques.

E665, Practice for Determining Absorbed Dose Versus Depth in Materials
Exposed to the X-Ray Output of Flash X-Ray Machines.

E666, Practice for Calculating Absorbed Dose from Gamma or X Radiation.

E668, Practice for Application of Thermoluminescence Dosimetry Systems
for Determining Absorbed Dose in Radiation-Hardness Testing of
Electronics.

E720, Guide for Selection of a Set of Neutron-Activation Foils for
Determining Neutron Spectra Used in Radiation-Hardness Testing of
Electronics.

E721, Method for Determining Neutron Energy Spectra with
Neutron-Activation Foils for Radiation Hardness Testing of Electronics.

E722, Practice for Characterizing Neutron Energy Fluence Spectra in
Terms of an Equivalent Monoenergetic Neutron Fluence for
Radiation-Hardness Testing of Electronics.

E1026, Methods for Using the Fricke Dosimeter to Measure Absorbed Dose
in Water.

E1249, Practice for Minimizing Dosimetry Errors in Radiation Hardness
Testing of Silicon Electronic Devices Using Co-60 Sources.

E1250, Test Method for Application of Ionization Chambers to Assess the
Low Energy Gamma Component of Cobalt-60 Irradiators Used in
Radiation-Hardness Testing of Silicon Electronic Devices.

E1854, Practice for Assuring Test Consistency in Neutron-Induced
Displacement Damage of Electronic Parts.

E1855, Method for Use of 2N2222 Silicon Bipolar Transistors as Neutron
Spectrum Sensors and Displacement Damage Monitors.

E1894, Guide for Selecting Dosimetry Systems for Application in Pulsed
X-Ray Sources.

The following are fiber optic test standards. They are under the
oversight of ASTM Subcommittee E13.09, Fiber Optics and Waveguide;
Chairman, Bob Lieberman, 310.530.7130 or rlieberman@intopsys.com..

E1614, Guide for Procedure for Measuring Ionizing Radiation-Induced
Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote
Fiber-Optic Spectroscopy and Broadband Systems.

E1654, Guide for Measuring Ionizing Radiation-Induced Spectral Changes
in Optical Fibers and Cables for Use in Remote Raman Fiber-Optic
Spectroscopy.

ASTM standards can also be purchased from ASTM, 100 Barr Harbor Dr.,
West Conshohocken, PA 19428-2959. Phone 610-832-9585. 

**EIA/JEDEC TEST METHODS AND GUIDES**

JESD57, Test Procedures for the Measurement of Single-Event Effects in
Semiconductor Devices from Heavy Ion Irradiation,
(<http://www.jedec.org/download/search/jesd57.pdf>)

JESD89, Measurement and Reporting of Alpha Particles and Terrestrial
Cosmic Ray-Induced Soft Errors in Semiconductor Devices,
(<http://www.jedec.org/download/search/JESD89.pdf>)

JEP133, Guideline for the Production and Acquisition of
Radiation-Hardness Assured Multichip Modules and Hybrid Microcircuits,
(<http://www.jedec.org/download/search/jep133b.pdf>)

TIA-455-64 (FOTP-64), Procedure for Measuring Radiation-Induced
Attenuation in Optical Fibers and Optical Cables,
([http://global.his.com](http://global.his.com/)).

Many EIA/JEDEC standards are free on their web site, either
[http://www.jedec.org](http://www.jedec.org/) or
[http://www.eia.org](http://www.eia.org/). If it can't be found there,
it can be purchased from Global Engineering Documents, 15 Inverness Way
East, Englewood CO 80112-5704. Phone 800-854-7179.

**ESA TEST METHODS AND GUIDES**

ESA/SCC Basic Specification No. 22900, Total Dose Steady-State
Irradiation Test Method.

ESA/SCC Basic Specification No. 25100, Single Event Effects Test Method
and Guidelines.

ESA PSS-01-609, The Radiation Design Handbook.

ESA documents can be ordered by e-mail at <esapub@esa.int> or can be
obtained from the ESA Publications Division, ESTEC, P.O.Box 299, 2200 AG
Noordwijk, The Netherlands.

Compiled by Harvey Eisen, chairman of the AF/NASA/DTRA Space Parts
Working Group, Hardness Assurance Committee and consultant to ITT
Advanced Engineering and Sciences Corp. Please send any
comments/corrections to him at harveyeisen@aol.com or FAX 301.493.4096.

[^1]: ^^Updated 6/01