#### 3.1.1.5 Contamination

Contamination of the focal plane by an unknown substance was recognized
in October 1998 during the characterization and calibration of the ALI
at Lincoln Laboratory. This contaminant may be completely eliminated by
raising the temperature of the focal plane above 260K. Prior to launch,
several bake outs occurred in an attempt to eliminate the source of the
contaminant. In January 1999, the entire instrument was baked out at
303K while under vacuum for one week and then later for an additional
two days. The focal plane was also baked out for three hours at 273K in
October 1999 and for one day at 273K in July 2000 during spacecraft
thermal vacuum testing at GSFC.

In the event that on-orbit bake outs would become necessary, an
additional heater was added to the focal plane radiator in February
1999. This heater, along with others on the instrument, raises the
temperature of the focal plane to 270 K on orbit.

##### 3.1.1.5.1 Detection

The monitoring of contaminant deposition on the ALI focal plane during
ground testing and on-orbit is performed using the internal reference
lamps mounted on the telescope metering truss. These lamps provide three
levels of stable, repeatable reference illumination of the focal plane
(Figure 3-22). However, because the internal reference lamp assembly has
a much higher f-number (40) compared to the telescope (7.5), the
assembly acts as a microscope for detecting contamination effects. This
magnification must be considered when assessing the impact of focal
plane contamination on image quality and radiometry. Generally, any
apparent spatial variations in the internal lamp data caused by focal
plane contamination should be reduced by a factor of 4 when applied to
imagery collected by the ALI.

![](media/image1.wmf){width="5.041666666666667in"
height="2.613888888888889in"}

Figure 3-22. Illumination of the ALI focal plane using the internal
reference lamp assembly.

The first step in detecting contaminants is to collect data using the
internal reference lamp assembly when the focal plane is considered
"clean." The dark current subtracted response of the focal plane for
each band using the clean data is considered the baseline. Data is then
collected once per day over a period of interest. All data are then
divided by the baseline data, and the mean and standard deviations of
the ratios are then computed for each band. The mean and standard
deviations are considered figures of merit for focal plane
contamination. If the reference lamps and focal plane are stable, and if
no contamination occurs, the mean of the ratios for each day should be
unity and the standard deviations should be equivalent to the noise of
the detectors.

##### 3.1.1.5.2 Location of Contamination

The location of ALI contamination has been identified as the top
surfaces of the spectral filters overlaying the focal plane detectors. A
Charge Coupled Device (CCD) camera was placed at the focus of a
collimator and images of the filter surfaces were obtained. The left
side of Figure 3-23 shows a portion of the focal plane filters during a
period when contamination had been detected. The image on the right is
of the same portion of the filter after the instrument had been baked
out. Clearly, a residue had formed on the surface of the filters during
contamination build-up. Additionally, all evidence of the residue has
been eliminated as a result of the bake out. This conclusion is
supported by the levels of post-bake out data returning to baseline
levels once the focal plane had been cooled to 220K.

![](media/image2.wmf){width="5.708333333333333in"
height="1.801388888888889in"}

Figure 3-23. Image of a portion of the top surface of the focal plane
filters when contaminated (left) and after a bake out (right).

##### 3.1.1.5.3 Characteristics

Focal plane contamination appears in three forms: pixel-to-pixel
variation, mean level shifts, and bowing. Pixel-to-pixel variation
refers to an apparent random shifting in individual detector responses
either above or below the original reference values. As deposition
continues, the pixel-to-pixel variations increase and the standard
deviations between observations increase.

Another characteristic of contamination is a mean level shift. This
refers to the gradual shift of the apparent mean level response of an
SCA as contaminants are accumulated on the filter surfaces. This shift
usually lowers the mean level of the pixel response curve. However, in
some instances, higher mean levels have been observed.

Bowing is also observed in cases of significant focal plane
contamination. As an SCA becomes contaminated, the mean apparent
response of the detectors may change as a function of detector position.
Detectors near the edges of SCAs have a larger change in apparent
response, relative to those near the middle of the SCA, resulting in a
bowing appearance for some bands.

Figure 3-24 depicts history of focal plane contamination for Band 4 for
two periods. The left column shows rapid contamination of the focal
plane over a six-day period. Clearly evident are the effects of
pixel-to-pixel variations, as well as mean level shifting and bowing.
The right column reveals a significantly reduced contaminant build-up
after the first instrument bake out at Lincoln Laboratory.

![](media/image3.wmf){width="5.459722222222222in"
height="5.438194444444444in"}

Figure 3-24. History of focal plane contamination for two periods during
instrument characterization at Lincoln Laboratory.

##### 3.1.1.5.4 Discussion

Much information pertaining to the contamination of the ALI focal plane
has been obtained during ground testing between October 1998 and
November 2001. The contaminant appears to condense on the surfaces of
the spectral filters lying above the detectors when the focal plane is
operated at 220K. However, once the focal plane is warmed above 260 K
the contaminant "boils off" and detector responses return to baseline
levels. This implies that mirror surfaces, maintained above 273 K at all
times, will not collect contaminants during ground testing or during
orbital operations.

Although the source of the contamination is not known, the leading
suspect is the black paint (Z306) coating the inside of the telescope to
reduce stray light. Bake out of the telescope surround structure was
limited to 70 hours and it is possible that residual outgassing of the
paint may be sticking onto the filter surfaces when the focal plane is
cold.